Toward the Understanding on Threshold Voltage Drift Mechanisms in GaN MOSc-HEMTs Through the Influence of Device Architecture
Leurquin, C., Vandendaele, W., Jaud, M.-A., Lavieville, R., Mohamad, B., Masante, C., Despesse, G., Nowak, E.
Published in IEEE transactions on electron devices (01.05.2024)
Published in IEEE transactions on electron devices (01.05.2024)
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Journal Article
A CMOS silicon spin qubit
Maurand, R, Jehl, X, Kotekar-Patil, D, Corna, A, Bohuslavskyi, H, Laviéville, R, Hutin, L, Barraud, S, Vinet, M, Sanquer, M, De Franceschi, S
Published in Nature communications (24.11.2016)
Published in Nature communications (24.11.2016)
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Journal Article
Gate-reflectometry dispersive readout and coherent control of a spin qubit in silicon
Crippa, A, Ezzouch, R, Aprá, A, Amisse, A, Laviéville, R, Hutin, L, Bertrand, B, Vinet, M, Urdampilleta, M, Meunier, T, Sanquer, M, Jehl, X, Maurand, R, De Franceschi, S
Published in Nature communications (03.07.2019)
Published in Nature communications (03.07.2019)
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Journal Article
350K operating silicon nanowire single electron/hole transistors scaled down to 3.4nm diameter and 10nm gate length
Lavieville, R., Barraud, S., Corna, A., Jehl, X., Sanquer, M., Vinet, M.
Published in EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (01.01.2015)
Published in EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (01.01.2015)
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Conference Proceeding
Design and Operation of CMOS-Compatible Electron Pumps Fabricated With Optical Lithography
Clapera, P., Klochan, J., Lavieville, R., Barraud, S., Hutin, L., Sanquer, M., Vinet, M., Cinins, A., Barinovs, G., Kashcheyevs, V., Jehl, X.
Published in IEEE electron device letters (01.04.2017)
Published in IEEE electron device letters (01.04.2017)
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Journal Article
Strained Silicon Directly on Insulator N- and P-FET nanowire transistors
Barraud, S., Lavieville, R., Tabone, C., Allain, F., Cassé, M., Samson, M-P, Maffini-Alvarro, V., Vinet, M.
Published in 2014 15th International Conference on Ultimate Integration on Silicon (ULIS) (01.04.2014)
Published in 2014 15th International Conference on Ultimate Integration on Silicon (ULIS) (01.04.2014)
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Conference Proceeding
A CMOS silicon spin qubit
Maurand, R., Jehl, X., Kotekar-Patil, D., Corna, A., Bohuslavskyi, H., Lavieville, R., Hutin, L., Barraud, S., Vinet, M., Sanquer, M., de Franceschi, S.
Published in Nature communications (01.12.2016)
Published in Nature communications (01.12.2016)
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Journal Article
SOI platform for spin qubits
De Franceschi, S., Maurand, R., Corna, A., Kotekar-Patil, D., Jehl, X., Sanquer, M., Lavieville, R., Hutin, L., Barraud, S., Vinet, M., Niquet, Y.-M
Published in 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) (01.01.2016)
Published in 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) (01.01.2016)
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Conference Proceeding
Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs
Lavieville, R., Karatsori, T., Theodorou, C., Barraud, S., Dimitriadis, C. A., Ghibaudo, G.
Published in 2016 46th European Solid-State Device Research Conference (ESSDERC) (01.09.2016)
Published in 2016 46th European Solid-State Device Research Conference (ESSDERC) (01.09.2016)
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Conference Proceeding
FDSOI to nanowires and single electron transistors
Vinet, M., Barraud, S., Jehl, X., Lavieville, R., Deshpande, V., Wacquez, R., Sanquer, M., Coquand, R., Cueto, O., Roche, B., Voisin, B., Pierre, M., Grenouillet, L., Previtali, B., Perreau, P., Poiroux, T., Faynot, O.
Published in 2014 Silicon Nanoelectronics Workshop (SNW) (01.06.2014)
Published in 2014 Silicon Nanoelectronics Workshop (SNW) (01.06.2014)
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Conference Proceeding
Statistical characterization and modeling of drain current local and global variability in 14 nm bulk FinFETs
Karatsori, T., Theodorou, C., Lavieville, R., Chiarella, T., Mitard, J., Horiguchi, N., Dimitriadis, C. A., Ghibaudo, G.
Published in 2017 International Conference of Microelectronic Test Structures (ICMTS) (01.03.2017)
Published in 2017 International Conference of Microelectronic Test Structures (ICMTS) (01.03.2017)
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Conference Proceeding
Spin-orbit dynamics of single acceptor atoms in silicon
van der Heijden, J, Kobayashi, T, House, M G, Salfi, J, Barraud, S, Lavieville, R, Simmons, M Y, Rogge, S
Published in arXiv.org (10.03.2017)
Published in arXiv.org (10.03.2017)
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Journal Article
Design and operation of CMOS-compatible electron pumps fabricated with optical lithography
Clapera, P, Klochan, J, Lavieville, R, Barraud, S, Hutin, L, Sanquer, M, Vinet, M, Cinins, A, Barinovs, G, Kashcheyevs, V, Jehl, X
Published in arXiv.org (30.12.2016)
Published in arXiv.org (30.12.2016)
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Journal Article
Control of single spin in CMOS devices and its application for quantum bits
Maurand, R, Kotekar-Patil, D, Corna, A, Bohuslavskyi, H, Crippa, A, Laviéville, R, Hutin, L, Barraud, S, Vinet, M, De Franceschi, S, Jehl, X, Sanquer, M
Published in arXiv.org (19.12.2019)
Published in arXiv.org (19.12.2019)
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Paper
Journal Article
A CMOS silicon spin qubit
Maurand, R, Jehl, X, D Kotekar Patil, Corna, A, Bohuslavskyi, H, Laviéville, R, Hutin, L, Barraud, S, Vinet, M, Sanquer, M, De Franceschi, S
Published in arXiv.org (24.05.2016)
Published in arXiv.org (24.05.2016)
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Journal Article