Investigation of edge computing hardware architectures processing tiny machine learning under neutron-induced radiation effects
Laurini, Luiz Henrique, dos Santos Martins, João Baptista, Bastos, Rodrigo Possamai
Published in Microelectronics and reliability (01.11.2023)
Published in Microelectronics and reliability (01.11.2023)
Get full text
Journal Article
SMART: Selective MAC zero-optimization for neural network reliability under radiation
Rajappa, Anuj Justus, Reiter, Philippe, Sartori, Tarso Kraemer Sarzi, Laurini, Luiz Henrique, Fourati, Hassen, Mercelis, Siegfried, Famaey, Jeroen, Bastos, Rodrigo Possamai
Published in Microelectronics and reliability (01.11.2023)
Published in Microelectronics and reliability (01.11.2023)
Get full text
Journal Article
Impact of Scaling Up the Sensor Sampling Frequency on the Reliability of Edge Processing Systems in Tolerating Soft Errors Caused by Neutrons
de Carvalho, Matheus Minelli, Laurini, L. H., Atukpor, E., Naviner, L., Bastos, Rodrigo Possamai
Published in IEEE sensors letters (01.09.2024)
Published in IEEE sensors letters (01.09.2024)
Get full text
Journal Article