Reducing Unitary and Spectator Errors in Cross Resonance with Optimized Rotary Echoes
Sundaresan, Neereja, Lauer, Isaac, Pritchett, Emily, Magesan, Easwar, Jurcevic, Petar, Gambetta, Jay M.
Published in PRX quantum (01.12.2020)
Published in PRX quantum (01.12.2020)
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Journal Article
Two-Level-System Dynamics in a Superconducting Qubit Due to Background Ionizing Radiation
Thorbeck, Ted, Eddins, Andrew, Lauer, Isaac, McClure, Douglas T., Carroll, Malcolm
Published in PRX quantum (01.06.2023)
Published in PRX quantum (01.06.2023)
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Journal Article
Low-Power Circuit Analysis and Design Based on Heterojunction Tunneling Transistors (HETTs)
Yoonmyung Lee, Daeyeon Kim, Jin Cai, Lauer, Isaac, Chang, Leland, Koester, Steven J., Blaauw, David, Sylvester, Dennis
Published in IEEE transactions on very large scale integration (VLSI) systems (01.09.2013)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.09.2013)
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Journal Article
High-performance superconducting quantum processors via laser annealing of transmon qubits
Zhang, Eric J, Srinivasan, Srikanth, Sundaresan, Neereja, Bogorin, Daniela F, Martin, Yves, Hertzberg, Jared B, Timmerwilke, John, Pritchett, Emily J, Yau, Jeng-Bang, Wang, Cindy, Landers, William, Lewandowski, Eric P, Narasgond, Adinath, Rosenblatt, Sami, Keefe, George A, Lauer, Isaac, Rothwell, Mary Beth, McClure, Douglas T, Dial, Oliver E, Orcutt, Jason S, Brink, Markus, Chow, Jerry M
Published in Science advances (13.05.2022)
Published in Science advances (13.05.2022)
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Journal Article
Meeting the Challenge of Multiple Threshold Voltages in Highly Scaled Undoped FinFETs
Muralidhar, R., Jin Cai, Frank, D. J., Oldiges, P., Lu, D., Lauer, I.
Published in IEEE transactions on electron devices (01.03.2013)
Published in IEEE transactions on electron devices (01.03.2013)
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Journal Article
Demonstration of quantum volume 64 on a superconducting quantum computing system
Jurcevic, Petar, Javadi-Abhari, Ali, Bishop, Lev S, Lauer, Isaac, Bogorin, Daniela F, Brink, Markus, Capelluto, Lauren, Günlük, Oktay, Itoko, Toshinari, Kanazawa, Naoki, Kandala, Abhinav, Keefe, George A, Krsulich, Kevin, Landers, William, Lewandowski, Eric P, McClure, Douglas T, Nannicini, Giacomo, Narasgond, Adinath, Nayfeh, Hasan M, Pritchett, Emily, Rothwell, Mary Beth, Srinivasan, Srikanth, Sundaresan, Neereja, Wang, Cindy, Wei, Ken X, Wood, Christopher J, Yau, Jeng-Bang, Zhang, Eric J, Dial, Oliver E, Chow, Jerry M, Gambetta, Jay M
Published in Quantum science and technology (01.04.2021)
Published in Quantum science and technology (01.04.2021)
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Journal Article
Performance trade-offs in FinFET and gate-all-around device architectures for 7nm-node and beyond
Seong-Dong Kim, Guillorn, Michael, Lauer, Isaac, Oldiges, Phil, Hook, Terence, Myung-Hee Na
Published in 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (01.10.2015)
Published in 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (01.10.2015)
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Conference Proceeding
Native Two-Qubit Gates in Fixed-Coupling, Fixed-Frequency Transmons Beyond Cross-Resonance Interaction
Wei, Ken Xuan, Lauer, Isaac, Pritchett, Emily, Shanks, William, McKay, David C., Javadi-Abhari, Ali
Published in PRX quantum (20.05.2024)
Published in PRX quantum (20.05.2024)
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Journal Article
Operational amplifier based test structure for transistor threshold voltage variation
Ji, B.L., Pearson, D.J., Lauer, I., Stellari, F., Frank, D.J., Chang, L., Ketchen, M.B.
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)
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Conference Proceeding
Toward Ultimate Scaling of MOSFET
Muralidhar, Ramachandran, Lauer, Isaac, Jin Cai, Frank, David J., Oldiges, Phil
Published in IEEE transactions on electron devices (01.01.2016)
Published in IEEE transactions on electron devices (01.01.2016)
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Journal Article
Si nanowire CMOS fabricated with minimal deviation from RMG FinFET technology showing record performance
Lauer, Isaac, Loubet, N., Kim, S. D., Ott, J. A., Mignot, S., Venigalla, R., Yamashita, T., Standaert, T., Faltermeier, J., Basker, V., Doris, B., Guillorn, M. A.
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)
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Conference Proceeding
Journal Article