by Latry, Olivier, Moultif, Niemat, Joubert, Eric, Ndiaye, Mohamed
Published in e-Prime (2022)

by Joubert, Eric, Latry, Olivier, Roux, Jean-Philippe
Published in Sensors & transducers (01.01.2015)

by Ducournau, Guillaume, Latry, Olivier, Kétata, Mohamed
Published in ETRI journal (01.10.2006)

by Moultif, Niemat, Latry, Olivier, Joubert, Eric, Ndiaye, Mohamed, Moreau, Christian, Goupy, Jean-Francois, Carton, Patrick
Published in IEEE transactions on power electronics (01.07.2021)

by Duguay, Sebastien, Echeverri, Andres, Castro, Celia, Latry, Olivier
Published in IEEE transactions on nanotechnology (01.01.2019)

by Temcamani, Farid, Fonder, Jean-Baptiste, Latry, Olivier, Duperrier, Cedric
Published in IEEE transactions on microwave theory and techniques (01.03.2016)

by Moultif, Niemat, Divay, Alexis, Joubert, Eric, Latry, Olivier
Published in Engineering failure analysis (01.11.2017)

by Lüders, Ulrike, Michez, Alain, Niskanen, Kimmo, Latry, Olivier, Germanicus, Rosine Coq, Moultif, Niemat, Jouha, Wadia, Boch, Jerôme, Touboul, Antoine D.
Published in Materials science forum (31.05.2022)

by Ducournau, Guillaume, Latry, Olivier, Ketata, Mohamed
Published in ETRI journal (01.12.2006)

by Ducournau, Guillaume, Latry, Olivier, Ketata, Mohamed
Published in ETRI journal (01.10.2006)

by Latry, Olivier, Dherbecourt, Pascal, Denis, Patrick, Cuvilly, Fabien, Kadi, Moncef
Published in Engineering failure analysis (01.01.2018)

by Bouchour, Al Mehdi, Oualkadi, Ahmed El, Latry, Olivier, Dherbécourt, Pascal, Echeverri, Andrés
Published in Computers & electrical engineering (01.06.2020)

by Divay, A, Masmoudi, Mohamed Lamine, Latry, Olivier, Duperrier, C, Temcamani, Farid
Published in Microelectronics and reliability (01.09.2015)

by Zhao, Lu, Normand, Antoine, Houard, Jonathan, Blum, Ivan, Delaroche, Fabien, Latry, Olivier, Ravelo, Blaise, Vurpillot, Francois
Published in Microscopy and microanalysis (01.04.2017)

by Coq Germanicus, Rosine, Lallemand, Florent, Chateigner, Daniel, Jouha, Wadia, Moultif, Niemat, Latry, Olivier, Fouchet, Arnaud, Murray, Hugues, Bunel, Catherine, Lüders, Ulrike
Published in Nano express (01.03.2021)

by Moultif, Niemat, Joubert, Eric, Masmoudi, Mohamed, Latry, Olivier
Published in 2017 Annual Reliability and Maintainability Symposium (RAMS) (2017)

by Moultif, N., Joubert, E., Latry, O.
Published in Advanced electromagnetics (01.01.2016)

by Ducournau, Guillaume, Latry, Olivier, Joubert, Eric, Ketata, Mohamed
Published in IEEE transactions on communications (01.10.2008)

by Moultif, Niemat, Joubert, Eric, Latry, Olivier
Published in 2018 19th IEEE Mediterranean Electrotechnical Conference (MELECON) (01.05.2018)

by Ducoumau, Guillaume, Latry, Olivier, Ketata, Mohamed
Published in ETRI journal (01.12.2006)