Deformation and Oxidation of Copper Metallization on Ceramic Substrate During Thermal Cycling From −40 °C to 250 °C
Fengqun Lang, Yamaguchi, Hiroshi, Nakagawa, Hiroshi, Sato, Hiroshi
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.08.2015)
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01.08.2015)
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Journal Article
The effect of strain rate and temperature on the tensile properties of Sn–3.5Ag solder
Lang, Fengqun, Tanaka, Hiroyuki, Munegata, Osamu, Taguchi, Toshihiko, Narita, Toshio
Published in Materials characterization (01.03.2005)
Published in Materials characterization (01.03.2005)
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Journal Article
Impact of joint materials on the reliability of double-side packaged SiC power devices during high temperature aging
Lang, Fengqun, Nakagawa, Hiroshi, Aoyagi, Masahiro, Ohashi, Hiromichi, Yamaguchi, Hiroshi
Published in Journal of materials science. Materials in electronics (01.09.2010)
Published in Journal of materials science. Materials in electronics (01.09.2010)
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Journal Article
Oxidation behavior of nickel-base single-crystal superalloy with rhenium-base diffusion barrier coating system at 1,423 K in Air
NARITA, Toshio, FENGQUN LANG, KEMAS ZAINI THOSIN, YOSHIOKA, Takayuki, IZUMI, Takeshi, YAKUWA, Hiroshi, HAYASHI, Shigenari
Published in Oxidation of metals (01.12.2007)
Published in Oxidation of metals (01.12.2007)
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Journal Article
Thermal resistance evaluation of die-attachment made of nano-composite Cu/Sn TLPS paste in SiC power module
Kato, Fumiki, Lang, Fengqun, Nakagawa, Hiroshi, Yamaguchi, Hiroshi, Kimura, Ryuuji, Okada, Keiji, Shindo, Hiroaki, Ooi, Tatsuya, Tamaki, Rei, Sekine, Shigenobu, Sato, Hiroshi
Published in 2017 International Conference on Electronics Packaging (ICEP) (01.04.2017)
Published in 2017 International Conference on Electronics Packaging (ICEP) (01.04.2017)
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Conference Proceeding
A Novel Three-Dimensional Packaging Method for Al-Metalized SiC Power Devices
Fengqun Lang, Hayashi, Y., Nakagawa, H., Aoyagi, M., Ohashi, H.
Published in IEEE transactions on advanced packaging (01.11.2009)
Published in IEEE transactions on advanced packaging (01.11.2009)
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Journal Article
High temperature resistant joint technology for SiC power devices using transient liquid phase sintering process
Fengqun Lang, Yamaguchi, H., Nakagawa, H., Sato, H.
Published in 2012 13th International Conference on Electronic Packaging Technology & High Density Packaging (01.08.2012)
Published in 2012 13th International Conference on Electronic Packaging Technology & High Density Packaging (01.08.2012)
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Conference Proceeding
250 °C-Operated sandwich-structured all-SiC power module
Kato, Fumiki, Simanjorang, Rejeki, Lang, Fengqun, Nakagawa, Hiroshi, Yamaguchi, Hiroshi, Sato, Hiroshi
Published in Japanese Journal of Applied Physics (01.04.2015)
Published in Japanese Journal of Applied Physics (01.04.2015)
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Journal Article
Development of SiC power module for high-speed switching operation
Sato, Hiroshi, Kato, Fumiki, Nakagawa, Hiroshi, Yamaguchi, Hiroshi, Rejeki, Simanjorang, Lang, Fengqun
Published in 2013 IEEE Electrical Design of Advanced Packaging Systems Symposium (EDAPS) (01.12.2013)
Published in 2013 IEEE Electrical Design of Advanced Packaging Systems Symposium (EDAPS) (01.12.2013)
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Conference Proceeding
Effect of solder diffusion barriers on the joint reliability of SiC power devices operated above 300°C
Fengqun Lang, Oohashi, H, Yamaguchi, H
Published in 3rd Electronics System Integration Technology Conference ESTC (01.09.2010)
Published in 3rd Electronics System Integration Technology Conference ESTC (01.09.2010)
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Conference Proceeding
A novel chip joint method for high temperature operated SiC power modules
Fengqun Lang, Hayashi, Y., Nakagawa, H., Aoyagi, M., Ohashi, H.
Published in 2006 8th Electronics Packaging Technology Conference (01.12.2006)
Published in 2006 8th Electronics Packaging Technology Conference (01.12.2006)
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Conference Proceeding
Joint Reliability of Double-Side Packaged SiC Power Devices to a DBC Substrate with High Temperature Solders
Fengqun Lang, Hayashi, Y., Nakagawa, H., Aoyagi, M., Ohashi, H.
Published in 2008 10th Electronics Packaging Technology Conference (01.12.2008)
Published in 2008 10th Electronics Packaging Technology Conference (01.12.2008)
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Conference Proceeding