A neural network approach to smooth calibrated data corrupted from switching errors
Landa, A. Z., Pulido-Gaytan, M. A., Reynoso-Hernandez, J. A., Roblin, P., Loo-Yau, J. R.
Published in 80th ARFTG Microwave Measurement Conference (01.11.2012)
Published in 80th ARFTG Microwave Measurement Conference (01.11.2012)
Get full text
Conference Proceeding