On detecting delay anomalies introduced by hardware Trojans
Ismari, D., Plusquellic, J., Lamech, C., Bhunia, S., Saqib, F.
Published in 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2016)
Published in 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2016)
Get full text
Conference Proceeding
Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect
Aarestad, Jim, Lamech, Charles, Plusquellic, Jim, Acharyya, Dhruva, Agarwal, Kanak
Published in 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC) (05.06.2011)
Published in 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC) (05.06.2011)
Get full text
Conference Proceeding
REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations
Lamech, C., Aarestad, J., Plusquellic, J., Rad, R., Agarwal, K.
Published in 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2011)
Published in 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2011)
Get full text
Conference Proceeding