Test measurements by Eötvös torsion balance and gravimeters
Csapó, Géza, Laky, Sándor, Égető, Csaba, Ultman, Zita, Tóth, Gyula, Völgyesi, Lajos
Published in Periodica polytechnica. Civil engineering. Bauingenieurwesen (01.01.2009)
Published in Periodica polytechnica. Civil engineering. Bauingenieurwesen (01.01.2009)
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Journal Article
Thermal transient analysis of semiconductor device degradation in power cycling reliability tests with variable control strategies
Sarkany, Zoltan, Vass-Varnai, Andras, Laky, Sandor, Rencz, Marta
Published in 2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) (01.03.2014)
Published in 2014 Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) (01.03.2014)
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Conference Proceeding
Issues of finding a proper golden-reference sample for TIM tester calibration
Vass-Varnai, Andras, Laky, S., Sarkany, Z., Barna, C., Rencz, M.
Published in 29th IEEE Semiconductor Thermal Measurement and Management Symposium (01.03.2013)
Published in 29th IEEE Semiconductor Thermal Measurement and Management Symposium (01.03.2013)
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Conference Proceeding