Test method and scheme for low-power validation in modern SOC integrated circuits
Bhaskaran, Bonita, Sanghani, Amit, Narayanun, Kaushik, Abdollahian, Ayub, Laknaur, Amit
Published in 2016 IEEE 34th VLSI Test Symposium (VTS) (01.04.2016)
Published in 2016 IEEE 34th VLSI Test Symposium (VTS) (01.04.2016)
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Conference Proceeding
Journal Article
A methodology to perform online self-testing for field-programmable analog array circuits
Laknaur, A., Haibo Wang
Published in IEEE transactions on instrumentation and measurement (01.10.2005)
Published in IEEE transactions on instrumentation and measurement (01.10.2005)
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Journal Article
Built-In-Self-Testing Techniques for Programmable Capacitor Arrays
Laknaur, Amit, Durbha, Sai Raghuram, Wang, Haibo
Published in Journal of electronic testing (01.12.2006)
Published in Journal of electronic testing (01.12.2006)
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Journal Article
A Fully Programmable Analog Window Comparator
Xiao, Rui, Laknaur, Amit, Wang, Haibo
Published in 2007 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2007)
Published in 2007 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2007)
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Conference Proceeding
Design ofWindow Comparators for Integrator-Based Capacitor Array Testing Circuits
Laknaur, Amit, Wang, Haibo
Published in Proceedings of the 7th International Symposium on Quality Electronic Design (27.03.2006)
Published in Proceedings of the 7th International Symposium on Quality Electronic Design (27.03.2006)
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Conference Proceeding
Design of window comparators for integrator-based capacitor array testing circuits
Laknaur, A., Wang, H.
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (2006)
Published in 7th International Symposium on Quality Electronic Design (ISQED'06) (2006)
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Conference Proceeding
An Analog Checker with Programmable Adaptive Error Threshold
Laknaur, A., Rui Xiao, Haibo Wang
Published in 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 (01.05.2007)
Published in 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007 (01.05.2007)
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Conference Proceeding
Design of a Window Comparator with Adaptive Error Threshold for Online Testing Applications
Laknaur, A., Rui Xiao, Durbha, S., Haibo Wang
Published in 8th International Symposium on Quality Electronic Design (ISQED'07) (01.03.2007)
Published in 8th International Symposium on Quality Electronic Design (ISQED'07) (01.03.2007)
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Conference Proceeding
Built-in-self-testing techniques for programmable capacitor arrays
Laknaur, A., Wang, H.
Published in Sixth international symposium on quality electronic design (isqed'05) (2005)
Published in Sixth international symposium on quality electronic design (isqed'05) (2005)
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Conference Proceeding