Analyzing Side-Channel Attack Vulnerabilities at RTL
Lai, Xinhui, Jenihhin, Maksim
Published in 2023 IEEE 24th Latin American Test Symposium (LATS) (21.03.2023)
Published in 2023 IEEE 24th Latin American Test Symposium (LATS) (21.03.2023)
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Conference Proceeding
On Antagonism Between Side-Channel Security and Soft-Error Reliability in BNN Inference Engines
Lai, Xinhui, Lange, Thomas, Balakrishnan, Aneesh, Alexandrescu, Dan, Jenihhin, Maksim
Published in 2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC) (04.10.2021)
Published in 2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC) (04.10.2021)
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Conference Proceeding
Towards Multidimensional Verification: Where Functional Meets Non-Functional
Jenihhin, Maksim, Lai, Xinhui, Ghasempouri, Tara, Raik, Jaan
Published in 2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC) (01.10.2018)
Published in 2018 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC) (01.10.2018)
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Conference Proceeding
PASCAL: Timing SCA Resistant Design and Verification Flow
Lai, Xinhui, Jenihhin, Maksim, Raik, Jaan, Paul, Kolin
Published in 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2019)
Published in 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) (01.07.2019)
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Conference Proceeding
Towards Multidimensional Verification: Where Functional Meets Non-Functional
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Paper
Journal Article
Early RTL Analysis for SCA Vulnerability in Fuzzy Extractors of Memory-Based PUF Enabled Devices
Lai, Xinhui, Jenihhin, Maksim, Selimis, Georgios, Goossens, Sven, Maes, Roel, Paul, Kolin
Published in 2020 IFIP/IEEE 28th International Conference on Very Large Scale Integration (VLSI-SOC) (05.10.2020)
Published in 2020 IFIP/IEEE 28th International Conference on Very Large Scale Integration (VLSI-SOC) (05.10.2020)
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Conference Proceeding
Early RTL Analysis for SCA Vulnerability in Fuzzy Extractors of Memory-Based PUF Enabled Devices
Lai, Xinhui, Jenihhin, Maksim, Selimis, Georgios, Goossens, Sven, Maes, Roel, Paul, Kolin
Year of Publication 19.08.2020
Year of Publication 19.08.2020
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Journal Article