32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches
Rodbell, K. P., Heidel, D. F., Pellish, J. A., Marshall, P. W., Tang, H. H. K., Murray, C. E., LaBel, K. A., Gordon, M. S., Stawiasz, K. G., Schwank, J. R., Berg, M. D., Kim, H. S., Friendlich, M. R., Phan, A. M., Seidleck, C. M.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Estimation of Heavy-Ion LET Thresholds in Advanced SOI IC Technologies From Two-Photon Absorption Laser Measurements
Schwank, J R, Shaneyfelt, M R, McMorrow, D, Ferlet-Cavrois, V, Dodd, P E, Heidel, D F, Marshall, P W, Pellish, J A, LaBel, K A, Rodbell, K P, Hakey, M, Flores, R S, Swanson, S E, Dalton, S M
Published in IEEE transactions on nuclear science (01.08.2010)
Published in IEEE transactions on nuclear science (01.08.2010)
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Journal Article
Single-Event Response of 22-nm Fully Depleted Silicon-on-Insulator Static Random Access Memory
Casey, Megan C., Stansberry, Scott D., Seidleck, Christina M., Maharrey, Jeffrey A., Gamboa, Dante, Pellish, Jonathan A., Label, Kenneth A.
Published in IEEE transactions on nuclear science (01.04.2021)
Published in IEEE transactions on nuclear science (01.04.2021)
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Journal Article
Nuclear data for space exploration
Smith, Michael S., Vogt, Ramona L., LaBel, Kenneth A.
Published in Frontiers in astronomy and space sciences (08.09.2023)
Published in Frontiers in astronomy and space sciences (08.09.2023)
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Journal Article
Single-Event Transient Case Study for System-Level Radiation Effects Analysis
Campola, Michael J., Austin, Rebekah A., Wilcox, Edward P., Kim, Hak S., Ladbury, Raymond L., Label, Kenneth A., Pellish, Jonathan A.
Published in IEEE transactions on nuclear science (01.05.2021)
Published in IEEE transactions on nuclear science (01.05.2021)
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Journal Article
Failure Analysis of Heavy Ion-Irradiated Schottky Diodes
Casey, Megan C., Lauenstein, Jean-Marie, Weachock, Ronald J., Wilcox, Edward P., Hua, Lang M., Campola, Michael J., Topper, Alyson D., Ladbury, Raymond L., LaBel, Kenneth A.
Published in IEEE transactions on nuclear science (01.01.2018)
Published in IEEE transactions on nuclear science (01.01.2018)
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Journal Article
Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies
Pellish, Jonathan A., Marshall, Paul W., Rodbell, Kenneth P., Gordon, Michael S., LaBel, Kenneth A., Schwank, James R., Dodds, Nathaniel A., Castaneda, Carlos M., Berg, Melanie D., Kim, Hak S., Phan, Anthony M., Seidleck, Christina M.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
The Susceptibility of 45 and 32 nm Bulk CMOS Latches to Low-Energy Protons
Seifert, N., Gill, B., Pellish, J. A., Marshall, P. W., LaBel, K. A.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
NASA Goddard Space Flight Center's Current Radiation Effects Test Results
O'Bryan, Martha V., Wilcox, Edward P., Carstens, Thomas A., Ryder, Kaitlyn L., Barth, Jonathan D., Osheroff, Jason M., Ryder, Landen D., Casey, Megan C., Joplin, Matthew B., Lauenstein, Jean-Marie, LaBel, Kenneth A., Campola, Michael J., Wyrwas, Edward J., Antonsanti, Aubin P., Berg, Melanie D., Cochran, Donna J., Majewicz, Peter J., Pellish, Jonathan A.
Published in 2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC) (01.07.2023)
Published in 2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC) (01.07.2023)
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Conference Proceeding
Evaluation and Application of U.S. Medical Proton Facilities for Single Event Effects Test
Wie, Brian S., LaBel, Kenneth A., Turflinger, Thomas L., Wert, Jerry L., Foster, Charles C., Reed, Robert A., Kostic, Andrew D., Moss, Steven C., Guertin, Steven M., George, Jeffrey S., Pankuch, Mark, Dong, Lei, Bloch, Charles, Laub, Steve
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Journal Article
Retention Characteristics of Commercial NAND Flash Memory After Radiation Exposure
Oldham, T. R., Dakai Chen, Friendlich, M. R., LaBel, K. A.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
NASA Goddard Space Flight Center's Compendium of Recent Total Ionizing Dose and Displacement Damage Dose Results
Topper, Alyson D., Wilcox, Edward P., Casey, Megan C., Campola, Michael J., Burton, Noah D., LaBel, Kenneth A., Cochran, Donna J., O'Bryan, Martha V.
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
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Conference Proceeding
Effects of Ion Atomic Number on Single-Event Gate Rupture (SEGR) Susceptibility of Power MOSFETs
Lauenstein, J.-M, Goldsman, N., Liu, S., Titus, J. L., Ladbury, R. L., Kim, H. S., Phan, A. M., LaBel, K. A., Zafrani, M., Sherman, P.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Hardness Assurance Testing for Proton Direct Ionization Effects
Schwank, J. R., Shaneyfelt, M. R., Ferlet-Cavrois, V., Dodd, P. E., Blackmore, E. W., Pellish, J. A., Rodbell, K. P., Heidel, D. F., Marshall, P. W., LaBel, K. A., Gouker, P. M., Tam, N., Wong, R., Shi-Jie Wen, Reed, R. A., Dalton, S. M., Swanson, S. E.
Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Journal Article
Application of RADSAFE to Model the Single Event Upset Response of a 0.25 $\mu$m CMOS SRAM
Warren, Kevin M., Weller, Robert A., Sierawski, Brian D., Reed, Robert A., Mendenhall, Marcus H., Schrimpf, Ronald D., Massengill, Lloyd W., Porter, Mark E., Wilkinson, Jeffrey D., LaBel, Kenneth A., Adams, James H.
Published in IEEE transactions on nuclear science (01.08.2007)
Published in IEEE transactions on nuclear science (01.08.2007)
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Journal Article
NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results
O'Bryan, Martha V., LaBel, Kenneth A., Wilcox, Edward P., Dakai Chen, Wyrwas, Edward J., Campola, Michael J., Casey, Megan C., Lauenstein, Jean-Marie, Topper, Alyson D., Szabo, Carl M., Pellish, Jonathan A., Berg, Melanie D., Lewellen, John W., Holloway, Michael A.
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
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Conference Proceeding