Time-dependent clustering model versus combination-based approach for BEOL/MOL and FEOL non-uniform dielectric breakdown: Similarities and disparities
Wu, Ernest Y., Baozhen Li, Stathis, James H., LaRow, Charles
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
Trap Density Modulation for IO FinFET NBTI Improvement
Ranjan, Rakesh, LaRow, Charles B., Lee, Ki-Don, Kang, Minhyo, Perepa, Pavitra R., Rahman, M. Shahriar, Lee, Bong Ki, Moreau, David, Cariss-Daniels, Carolyn, Basford, Timothy, Callahan, Colby, Nguyen, Maihan, Choi, Gil Heyun, Sagong, Hyunchul, Rhee, HwaSung
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding
Plasma Induced Damage Test Methodology applied to a 3D Vertical NAND Memory Technology
Beckmeier, Daniel, LaRow, Charles, Kerber, Andreas
Published in 2023 IEEE International Integrated Reliability Workshop (IIRW) (08.10.2023)
Published in 2023 IEEE International Integrated Reliability Workshop (IIRW) (08.10.2023)
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Conference Proceeding
2D materials in electronics devices
Young, Chadwin, Ring, Matt, Lloyd, Jim, Jayanthinarasimham, Avyaya, LaRow, Charles, Shluger, Alexander, Villena, Marco A.
Published in 2017 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2017)
Published in 2017 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2017)
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Conference Proceeding
Systematic Study of Process Impact on FinFET Reliability
Ranjan, Rakesh, Lee, Ki-Don, Mahmud, Md Iqbal, Rahman, Mohammad Shahriar, Perepa, Pavitra Ramadevi, Larow, Charles Briscoe, Kwon, Caleb Dongkyun, Nguyen, Maihan, Kang, Minhyo, Jha, Ashish Kumar, Shariq, Ahmed, Ummer, Shamas Musthafa, Prater, Susannah Laure, Sagong, Hyunchul, Rhee, HwaSung
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
Product reliability and qualifications for high consequence/low volume integrated circuits: Discussion group, Oct. 10, 2017
Haase, Gaddi, Yang-Scharlotta, Jean, Siddiqui, Jeff, LaRow, Charles, Pozder, Scott, Paliwoda, Peter, Hogan, Matthew, May, James
Published in 2017 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2017)
Published in 2017 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2017)
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Conference Proceeding
Reliability and modeling: What to simulate and how?
Zhang, Rui, Verzellesi, Giovanni, Puzzilli, Giuseppina, Puschkarsky, Katja, LaRow, Charles, Shluger, Alexander, Tkachev, Yuri, Villena, Marco A., Yang, Kexin, Metaev, Elnatan, Pesic, Milan, Lloyd, Jim, Ring, Matt, Paliwoda, Peter, Tan, Sheldon, Young, Chadwin
Published in 2017 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2017)
Published in 2017 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2017)
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Conference Proceeding
Temperature dependence of TDDB voltage acceleration in high-κ/ SiO2 bilayers and SiO2 gate dielectrics
Wu, Ernest, Sune, J., LaRow, C., Dufresne, R.
Published in 2012 International Electron Devices Meeting (01.12.2012)
Published in 2012 International Electron Devices Meeting (01.12.2012)
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Conference Proceeding
Influence of charge trapping on failure detection and its distributions for nFET high-κ stacks
Wu, E. Y., Ioannou, D. P., LaRow, C. B.
Published in 2011 International Electron Devices Meeting (01.12.2011)
Published in 2011 International Electron Devices Meeting (01.12.2011)
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Conference Proceeding
TDDB Lifetime Reduction From Charging Damage in a 3D Vertical NAND Memory Technology
Beckmeier, Daniel, LaRow, Charles, Kerber, Andreas
Published in IEEE transactions on device and materials reliability (01.06.2024)
Published in IEEE transactions on device and materials reliability (01.06.2024)
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Magazine Article
Dual Stage Voltage Ramp Stress Test for Gate Dielectrics
BROCHU, JR. DAVID G, RAHIM NILUFA, LAROW CHARLES B, MERRILL TRAVIS S, DUFRESNE ROGER A, WU ERNEST Y
Year of Publication 26.07.2012
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Year of Publication 26.07.2012
Patent