Mapping the Spatial Dependence of Charge-Collection Efficiency in Semiconductor Devices Using Pulsed-Laser Testing
Hales, Joel M., Khachatrian, Ani, Buchner, Stephen, Ildefonso, Adrian, Monahan, Daniele M., Lalumondiere, Stephen D., Mcmorrow, Dale
Published in IEEE transactions on nuclear science (01.05.2021)
Published in IEEE transactions on nuclear science (01.05.2021)
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Journal Article
A Comparison of Total-Ionizing-Dose Effects in Silicon and Silicon-Nitride Waveguides
Ringel, Brett L., Teng, Jeffrey W., Hosseinzadeh, Mozhgan, Sam, Delwyn G., Francis, Peter J., Parameswaran, Hari, Little, Arielle, Tzintzarov, George N., Monahan, Daniele M., LaLumondiere, Stephen D., Cressler, John D.
Published in IEEE transactions on nuclear science (01.08.2024)
Published in IEEE transactions on nuclear science (01.08.2024)
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Journal Article
Direct Measurement of Total-Ionizing-Dose-Induced Phase Shifts in Commercially Available, Integrated Silicon-Photonic Waveguides
Tzintzarov, George N., Teng, Jeffrey W., Nergui, Delgermaa, Ringel, Brett L., Lalumondiere, Stephen D., Monahan, Daniele M., Little, Arielle, Cressler, John D.
Published in IEEE transactions on nuclear science (01.08.2023)
Published in IEEE transactions on nuclear science (01.08.2023)
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Journal Article
New Approach for Pulsed-Laser Testing That Mimics Heavy-Ion Charge Deposition Profiles
Hales, Joel M., Cressler, John D., McMorrow, Dale, Khachatrian, Ani, Buchner, Stephen, Warner, Jeffrey, Ildefonso, Adrian, Tzintzarov, George N., Nergui, Delgermaa, Monahan, Daniele M., LaLumondiere, Stephen D.
Published in IEEE transactions on nuclear science (01.01.2020)
Published in IEEE transactions on nuclear science (01.01.2020)
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Journal Article
Using Bessel beams and two-photon absorption to predict radiation effects in microelectronics
Hales, Joel M, Khachatrian, Ani, Warner, Jeffrey, Buchner, Stephen, Ildefonso, Adrian, Tzintzarov, George N, Nergui, Delgermaa, Monahan, Daniele M, LaLumondiere, Stephen D, Cressler, John D, McMorrow, Dale
Published in Optics express (23.12.2019)
Published in Optics express (23.12.2019)
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Journal Article
Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting From Heavy-Ion-, Focused X-Ray-, and Pulsed Laser-Induced Charge Generation
Ryder, Kaitlyn L., Ryder, Landen D., Sternberg, Andrew L., Kozub, John A., Zhang, En Xia, LaLumondiere, Stephen D., Monahan, Daniele M., Bonsall, Jeremy P., Khachatrian, Ani, Buchner, Stephen P., McMorrow, Dale, Hales, Joel M., Zhao, Yuanfu, Wang, Liang, Wang, Chuanmin, Weller, Robert A., Schrimpf, Ronald D., Weiss, Sharon M., Reed, Robert A.
Published in IEEE transactions on nuclear science (01.05.2021)
Published in IEEE transactions on nuclear science (01.05.2021)
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Journal Article
Single-Event Transients in SiGe HBTs Induced by Pulsed X-Ray Microbeam
Nergui, Delgermaa, Ildefonso, Adrian, Tzintzarov, George N., Lourenco, Nelson E., Omprakash, Anup P., Goley, Patrick S., Fleetwood, Zachary E., LaLumondiere, Stephen D., Bonsall, Jeremy P., Monahan, Daniele M., Kettering, Hunter, Brewe, Dale L., Cressler, John D.
Published in IEEE transactions on nuclear science (01.01.2020)
Published in IEEE transactions on nuclear science (01.01.2020)
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Journal Article
Investigating Pulsed X-ray Induced SEE in Analog Microelectronic Devices
Cardoza, David, LaLumondiere, Stephen D., Wells, Nathan P., Tockstein, Michael A., Brewe, Dale L., Lotshaw, William T., Moss, Steven C.
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Journal Article
Application of a Focused, Pulsed X-ray Beam for Total Ionizing Dose Testing of Bipolar Linear Integrated Circuits
Lalumondiere, Stephen D., Dillingham, Erik C., Scofield, Adam C., Bonsall, Jeremy P., Karuza, Petras, Brewe, Dale L., Schrimpf, Ronald D., Sternberg, Andrew L., Wells, Nathan P., Cardoza, David M., Lotshaw, William T., Moss, Steven C.
Published in IEEE transactions on nuclear science (01.01.2018)
Published in IEEE transactions on nuclear science (01.01.2018)
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Journal Article
Comparison of Single Event Transients Generated by Short Pulsed X-Rays, Lasers and Heavy Ions
Cardoza, David, LaLumondiere, Stephen D., Tockstein, Michael A., Brewe, Dale L., Wells, Nathan P., Koga, Rokutaro, Gaab, Kevin M., Lotshaw, William T., Moss, Steven C.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article
Single Event Transients Induced by Picosecond Pulsed X-Ray Absorption in III-V Heterojunction Transistors
Cardoza, D. M., LaLumondiere, S. D., Tockstein, M. A., Witczak, S. C., Sin, Y., Foran, B. J., Lotshaw, W. T., Moss, S. C.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
A TID and SEE Radiation-Hardened, Wideband, Low-Noise Amplifier
Mossawir, B., Linscott, I.R., Inan, U.S., Roeder, J.L., Osborn, J.V., Witczak, S.C., King, E.E., LaLumondiere, S.D.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
Total-Ionizing-Dose Effects in Integrated Silicon Phase Shifters Using Localized X-Ray Pulses
Hosseinzadeh, Mozhgan, Teng, Jeffrey W., Ringel, Brett L., Francis, Peter J., Heimerl, Justin P., Tzintzarov, George N., Little, Arielle, Bonsall, Jeremy P., LaLumondiere, Stephen D., Monahan, Daniele M., Cressler, John D.
Published in IEEE transactions on nuclear science (2024)
Published in IEEE transactions on nuclear science (2024)
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Journal Article
Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory
Bosser, A. L., Gupta, V., Javanainen, A., Tsiligiannis, G., LaLumondiere, S. D., Brewe, D., Ferlet-Cavrois, V., Puchner, H., Kettunen, H., Gil, T., Wrobel, F., Saigne, F., Virtanen, A., Dilillo, L.
Published in IEEE transactions on nuclear science (01.08.2018)
Published in IEEE transactions on nuclear science (01.08.2018)
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Journal Article
Investigation of Single-Event Transients in AlGaN/GaN MIS-Gate HEMTs Using a Focused X-Ray Beam
Khachatrian, A., Roche, N. J.-H, Buchner, S. P., Koehler, A. D., Anderson, T. J., McMorrow, D., Lalumondiere, S. D., Bonsall, J. P., Dillingham, E. C., Brewe, D. L.
Published in IEEE transactions on nuclear science (01.01.2019)
Published in IEEE transactions on nuclear science (01.01.2019)
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Journal Article
Application of a Focused, Pulsed X-Ray Beam to the Investigation of Single-Event Transients in Al0.3Ga0.7N/GaN HEMTs
Khachatrian, A., Roche, N. J-H, Buchner, S. P., Koehler, A. D., Anderson, T. J., Hobart, K. D., McMorrow, D., LaLumondiere, S. D., Wells, N. P., Bonsall, J., Dillingham, E. C., Karuza, P., Brewe, D. L., Lotshaw, W. T., Moss, S. C., Ferlet-Cavrois, V., Muschitiello, M.
Published in IEEE transactions on nuclear science (01.01.2017)
Published in IEEE transactions on nuclear science (01.01.2017)
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Journal Article
Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation
Pease, R.L., Sternberg, A.L., Boulghassoul, Y., Massengill, L.W., Buchner, S., McMorrow, D., Walsh, D.S., Hash, G.L., LaLumondiere, S.D., Moss, S.C.
Published in IEEE transactions on nuclear science (01.12.2002)
Published in IEEE transactions on nuclear science (01.12.2002)
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Journal Article