Investigation of Retention Noise for 3-D TLC NAND Flash Memory
Wang, Kunliang, Du, Gang, Lun, Zhiyuan, Liu, Xiaoyan
Published in IEEE journal of the Electron Devices Society (2019)
Published in IEEE journal of the Electron Devices Society (2019)
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Journal Article
Investigation of retention behavior for 3D charge trapping NAND flash memory by 2D self-consistent simulation
Zhiyuan Lun, Shuhuan Liu, Yuan He, Yi Hou, Kai Zhao, Gang Du, Xiaoyan Liu, Yi Wang
Published in 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2014)
Published in 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2014)
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Conference Proceeding
3D KMC reliability simulation of nano-scaled HKMG nMOSFETs with multiple traps coupling
Li, Yun, Lun, Zhiyuan, Huang, Peng, Wang, Yijiao, Jiang, Hai, Du, Gang, Liu, Xiaoyan
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)
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Conference Proceeding
Journal Article
Investigation of scattering mechanism in nano-scale double gate In0.53Ga0.47As nMOSFETs by a deterministic BTE solver
Shaoyan Di, Zhiyuan Lun, Pengying Chang, Lei Shen, Kai Zhao, Tiao Lu, Gang Du, Xiaoyan Liu
Published in 2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2016)
Published in 2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2016)
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Conference Proceeding
Simulation on endurance characteristic of charge trapping memory
Zhiyuan Lun, Taihuan Wang, Lang Zeng, Kai Zhao, Xiaoyan Liu, Yi Wang, Jinfeng Kang, Gang Du
Published in 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2013)
Published in 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2013)
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Conference Proceeding
Modeling of program Vth distribution for 3-D TLC NAND flash memory
Wang, Kunliang, Du, Gang, Lun, Zhiyuan, Chen, Wangyong, Liu, Xiaoyan
Published in Science China. Information sciences (01.04.2019)
Published in Science China. Information sciences (01.04.2019)
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Journal Article
Impact of self-heating effect on the retention of 3-D NAND flash memory
Kunliang Wang, Zhiyuan Lun, Wangyong Chen, Xiaoyan Liu, Gang Du
Published in 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2017)
Published in 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2017)
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Conference Proceeding
Simulation method for forming and switching processes of NbO2-based selector
Junjie Hu, Yudi Zhao, Longxiang Yin, Zhiyuan Lun, Peng Huang, Jinfeng Kang, Xiaoyan Liu
Published in 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2016)
Published in 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2016)
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Conference Proceeding
Simulation of nano-scale double gate In0.53Ga0.47As nMOSFETs by a deterministic BTE solver
Shaoyan Di, Kai Zhao, Zhiyuan Lun Tiao Lu, Gang Du, Xiaoyan Liu
Published in 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2016)
Published in 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2016)
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Conference Proceeding
A two-dimensional simulation method for investigating charge transport behavior in 3-D charge trapping memory
Lun, Zhiyuan, Du, Gang, Zhao, Kai, Liu, Xiaoyan, Wang, Yi
Published in Science China. Information sciences (01.12.2016)
Published in Science China. Information sciences (01.12.2016)
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Journal Article
Evaulation the degradation in nMOSFETs with HfO2 gate dielectric and interfacial layer by 3D Kinetic Monte-Carlo method
Yun Li, Zhiyuan Lun, Yijiao Wang, Peng Huang, Hai Jiang, Xing Zhang, Gang Du, Xiaoyan Liu
Published in 2016 IEEE Silicon Nanoelectronics Workshop (SNW) (01.06.2016)
Published in 2016 IEEE Silicon Nanoelectronics Workshop (SNW) (01.06.2016)
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Conference Proceeding
Two-dimensional self-consistent simulation on program/retention operation of charge trapping memory
Zhiyuan Lun, Shuhuan Liu, Kai Zhao, Gang Du, Yi Wang, Xiaoyan Liu
Published in 2014 International Workshop on Computational Electronics (IWCE) (01.06.2014)
Published in 2014 International Workshop on Computational Electronics (IWCE) (01.06.2014)
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Conference Proceeding
Investigation of the surface orientation influence on 10-nm double gate GaSb nMOSFETs
Di, Shaoyan, Shen, Lei, Lun, Zhiyuan, Chang, Pengying, Zhao, Kai, Lu, Tiao, Du, Gang, Liu, Xiaoyan
Published in Chinese physics B (01.04.2017)
Published in Chinese physics B (01.04.2017)
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Journal Article
Investigation of the surface orientation influence on 10-nm double gate GaSb nMOSFETs Project supported by the National Natural Science Foundation of China (Grant Nos. 61674008, 61421005, and 61404005)
Di, Shaoyan, Shen, Lei, Lun, Zhiyuan, Chang, Pengying, Zhao, Kai, Lu, Tiao, Du, Gang, Liu, Xiaoyan
Published in Chinese physics B (01.04.2017)
Published in Chinese physics B (01.04.2017)
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Journal Article
Investigation of self-heating effect in SOI-LDMOS by device simulation
Zhiyuan Lun, Gang Du, Jieyu Qin, Yijiao Wang, Juncheng Wang, Xiaoyan Liu
Published in 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (01.10.2012)
Published in 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (01.10.2012)
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Conference Proceeding
Reliability investigation of high-k/metal gate in nMOSFETs by three-dimensional kinetic Monte-Carlo simulation with multiple trap interactions
Li, Yun, Jiang, Hai, Lun, Zhiyuan, Wang, Yijiao, Huang, Peng, Hao, Hao, Du, Gang, Zhang, Xing, Liu, Xiaoyan
Published in Japanese Journal of Applied Physics (01.04.2016)
Published in Japanese Journal of Applied Physics (01.04.2016)
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Journal Article
Performance investigation on the reconfigurable Si nanowire schottky barrier transistors
Juncheng Wang, Gang Du, Zhiyuan Lun, Kangliang Wei, Lang Zeng, Xiaoyan Liu
Published in 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (01.10.2012)
Published in 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (01.10.2012)
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Conference Proceeding