by Myers, Kristi K., Herich, John P., Chavez, John E., Berkey, Kathryn G., Loi, Alan J., Cleveland, Patrick H.
Published in SLAS technology (01.10.2021)

by MYERS, Kristi K, CHAVEZ, John E, CLEVELAND, Patrick H, KNUTH, Natalie A, ANGELO, Christopher A, HICKMAN, Christopher P.W, LOI, Alan J
Year of Publication 17.08.2023

by RENICK, Joel, I, HICKMAN, Christopher, P.W, MYERS, Kristi, K, ANGELO, Christopher, A, LOI, Alan, J, CHAVEZ, John, E, KNUTH, Natalie, A, CLEVELAND, Patrick, H
Year of Publication 12.07.2023

by Cleveland, Patrick H, Myers, Kristi K, Loi, Alan J, Knuth, Natalie A, Angelo, Christopher A, Renick, Joel I, Chavez, John E, Hickman, Christopher P. W
Year of Publication 11.04.2023

by RENICK, Joel, I, HICKMAN, Christopher, P.W, MYERS, Kristi, K, ANGELO, Christopher, A, LOI, Alan, J, CHAVEZ, John, E, KNUTH, Natalie, A, CLEVELAND, Patrick, H
Year of Publication 31.08.2022

by RENICK, Joel, I, HICKMAN, Christopher, P.W, MYERS, Kristi, K, ANGELO, Christopher, A, LOI, Alan, J, CHAVEZ, John, E, KNUTH, Natalie, A, CLEVELAND, Patrick, H
Year of Publication 06.10.2021

by RENICK, Joel I, MYERS, Kristi K, CHAVEZ, John E, CLEVELAND, Patrick H, KNUTH, Natalie A, ANGELO, Christopher A, HICKMAN, Christopher P.W, LOI, Alan J
Year of Publication 28.05.2020

by MYERS KRISTI K, HICKMAN CHRISTOPHER P W, LOI ALAN J, CHAVEZ JOHN E, ANGELO CHRISTOPHER A, CLEVELAND PATRICK H, RENICK JOEL I, KNUTH NATALIE A
Year of Publication 07.09.2021