Reliability for manufacturing on 45nm logic technology with high-k + metal gate transistors and Pb-free packaging
Kasim, R., Connor, C., Hicks, J., Jopling, J., Litteken, C.
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Apparatus and method for detection of edge damages
MARIEB TOM, LITTEKEN CHRIS, HICKS JEFF, MAIZ JOSE, LUCERO ALAN, HE JUN, HICKS JEFFREY MORISSON
Year of Publication 28.08.2008
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Year of Publication 28.08.2008
Patent