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"LITTAU BENJAMIN"
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A modified algebraic reconstruction technique taking refraction into account with an application in terahertz tomography
by
Tepe, Jens
,
Schuster, Thomas
,
Littau
,
Benjamin
Published in
Inverse problems in science and engineering
(03.10.2017)
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METHOD AND DEVICE FOR MEASURING A LAYER THICKNESS OF AN OBJECT
by
LITTAU
,
BENJAMIN
,
SCHOBER, GIOVANNI
,
KREMLING, STEFAN
Year of Publication
25.04.2023
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Method and device for measuring a layer thickness of an object
by
Littau
,
Benjamin
,
Kremling, Stefan
,
Schober, Giovanni
Year of Publication
09.08.2022
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Method and device for measuring a layer thickness of an object
by
Benjamin Littau
,
Giovanni Schober
,
Stefan Kremling
Year of Publication
27.04.2022
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METHOD AND DEVICE FOR MEASURING A LAYER THICKNESS OF AN OBJECT
by
SCHOBER, Giovanni
,
KREMLING, Stefan
,
LITTAU
,
Benjamin
Year of Publication
27.05.2021
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Method and device for measuring a layer thickness of an object
by
Benjamin Littau
,
Giovanni Schober
,
Stefan Kremling
Year of Publication
04.03.2020
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A modified algebraic reconstruction technique taking refraction into account with an application in terahertz tomography
by
Tepe, Jens
,
Schuster, Thomas
,
Littau
,
Benjamin
Year of Publication
18.01.2016
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METHOD AND DEVICE FOR MEASURING A LAYER THICKNESS OF AN OBJECT
by
LITTAU
,
BENJAMIN
,
SCHOBER, GIOVANNI
,
KREMLING, STEFAN
Year of Publication
08.11.2018
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A modified algebraic reconstruction technique taking refraction into account with an application in terahertz tomography
by
Tepe, Jens
,
Schuster, Thomas
,
Littau
,
Benjamin
Published in
arXiv.org
(18.01.2016)
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METHOD AND DEVICE FOR MEASURING A LAYER THICKNESS OF AN OBJECT
by
SCHOBER GIOVANNI
,
KREMLING STEFAN
,
LITTAU BENJAMIN
Year of Publication
24.03.2020
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Verfahren und Vorrichtung zur Messung einer Schichtdicke eines Objekts
by
Littau
,
Benjamin
,
Kremling, Stefan
,
Schober, Giovanni
Year of Publication
22.08.2019
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Verfahren und Vorrichtung zur Messung einer Schichtdicke eines Objekts
by
Littau
,
Benjamin
,
Kremling, Stefan
,
Schober, Giovanni
Year of Publication
08.11.2018
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METHOD AND DEVICE FOR MEASURING A LAYER THICKNESS OF AN OBJECT
by
SCHOBER, Giovanni
,
KREMLING, Stefan
,
LITTAU
,
Benjamin
Year of Publication
08.11.2018
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Patent
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