IR spectroscopic investigation of SiO2 film structure
LISOVSKII, I. P, LITOVCHENKO, V. G, LOZINSKII, V. G, STEBLOVSKII, G. I
Published in Thin solid films (15.06.1992)
Published in Thin solid films (15.06.1992)
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Journal Article
Effect of UV annealing of radiation damage in SiO2 films
LISOVSKII, I. P, LITOVCHENKO, V. G, LOZINSKII, V. B
Published in Applied surface science (01.02.1995)
Published in Applied surface science (01.02.1995)
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Conference Proceeding
Journal Article
Structure of the modified surface layer formed by ion bombardment of SiO2 films
LISOVSKII, I. P, LITOVCHENKO, V. G, LOZINSKII, V. B, MELNIK, V. P, FROLOV, S. I
Published in Thin solid films (15.07.1994)
Published in Thin solid films (15.07.1994)
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Journal Article
Internal field emission of microelectronic MIS structures
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Journal Article
Conference Proceeding
IR study of short-range and local order in SiO2 and SiOx films
LISOVSKII, I. P, LITOVCHENKO, V. G, LOZINSKII, V. B, FROLOV, S. I, FLIETNER, H, FUSSEL, W, SCHMIDT, E. G
Published in Journal of non-crystalline solids (01.07.1995)
Published in Journal of non-crystalline solids (01.07.1995)
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Conference Proceeding
Journal Article
Field mechanism of defect generation at Si-SiO2 interface under hot electron injection
LISOVSKII, I. P, ROMANOVA, G. P, SCHMIDT, E. G
Published in Journal of non-crystalline solids (01.07.1995)
Published in Journal of non-crystalline solids (01.07.1995)
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Conference Proceeding
Journal Article
Development of the structure of thin SiO2 films during thermal growth on Si substrate
Lisovskii, I.P., Litovchenko, V.G., Khatko, V.V.
Published in Microelectronic engineering (01.08.1993)
Published in Microelectronic engineering (01.08.1993)
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Journal Article
Application of UV light for studying surface reactions in layer structures
Litovchenko, V.G., Lisovskii, I.P., Litvinov, R.O.
Published in Applications of surface science (01.01.1980)
Published in Applications of surface science (01.01.1980)
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Journal Article
A semi-automatic system for activation analysis using the WWR nuclear reactor
Lisovskii, I. P., Smakhtin, L. A., Filippova, N. V., Volgin, V. I.
Published in Journal of Radioanalytical Chemistry (01.08.1971)
Published in Journal of Radioanalytical Chemistry (01.08.1971)
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Journal Article
Structure of the modified surface layer formed by ion bombardment of SiO sub 2 films
Lisovskii, I P, Litovchenko, V G, Lozinskii, V B, Melnik, V P, Frolov, S I
Published in Thin solid films (01.01.1994)
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Published in Thin solid films (01.01.1994)
Journal Article
Ir spectroscopic investigation of SiO sub 2 film structure
Lisovskii, I P, Litovchenko, V G, Lozinskii, V G, Steblovskii, G I
Published in Thin solid films (01.01.1992)
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Published in Thin solid films (01.01.1992)
Journal Article
Dependence of the oxygen content of boron nitride on heat-treatment temperature and its effect on the structure and strength characteristics of this compound
Vikulin, V. V., Rusanova, L. N., Kuznetsova, V. F., Buravov, A. D., Lisovskii, I. P., Smakhtin, L. A.
Published in Soviet Powder Metallurgy and Metal Ceramics (01.09.1978)
Published in Soviet Powder Metallurgy and Metal Ceramics (01.09.1978)
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Journal Article
VVR reactor semiautomatic activation analysis system
Lisovskii, I. P., Smakhtin, L. A., Filippova, N. V., Volgin, V. I.
Published in Soviet Atomic Energy (01.12.1970)
Published in Soviet Atomic Energy (01.12.1970)
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Journal Article