The Treatment Efficiency and Microbiota Analysis of Sapindus mukorossi Seed Oil on the Ligature-Induced Periodontitis Rat Model
Lin, Shih-Kai, Wu, Yi-Fan, Chang, Wei-Jen, Feng, Sheng-Wei, Huang, Haw-Ming
Published in International journal of molecular sciences (02.08.2022)
Published in International journal of molecular sciences (02.08.2022)
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Journal Article
Investigation Between Recover Behavior and Defect With Variation of Light Source in AlGaN/GaN HEMTs After Hot-Carrier Stress
Sun, Li-Chuan, Lin, Shih-Kai, Yeh, Yu-Hsuan, Tu, Yu-Fa, Tan, Yung-Fang, Zhou, Kuan-Ju, Tsai, Tsung-Ming, Chang, Ting-Chang
Published in IEEE electron device letters (01.04.2023)
Published in IEEE electron device letters (01.04.2023)
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Journal Article
Stably Saturated Output Current Characteristics and Hot-Carrier Reliability of a-InGaZnO Thin-Film Transistors With Source-Connected Field Plate
Tu, Yu-Fa, Huang, Jen-Wei, Chang, Ting-Chang, Hung, Yang-Hao, Tai, Mao-Chou, Chen, Jian-Jie, Lin, Shih-Kai, Zhou, Kuan-Ju, Chien, Ya-Ting, Huang, Hui-Chun, Lien, Chen-Hsin
Published in IEEE transactions on electron devices (01.09.2023)
Published in IEEE transactions on electron devices (01.09.2023)
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Journal Article
Increasing Controllable Oxygen Ions to Improve Device Performance Using Supercritical Fluid Technique in ZnO-Based Resistive Random Access Memory
Chou, Sheng-Yao, Yang, Chih-Cheng, Chang, Ting-Chang, Tsai, Tsung-Ming, Lin, Shih-Kai, Kuo, Chan-Wei, Wu, Chung-Wei, Wang, Yu-Bo, Sze, Simon M.
Published in IEEE transactions on electron devices (01.01.2022)
Published in IEEE transactions on electron devices (01.01.2022)
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Journal Article
A Functional Novel Logic for Max/Min Computing in One-Transistor-One-Resistor Devices With Resistive Random Access Memory (RRAM)
Huang, Wei-Chen, Chen, Po-Hsun, Chang, Ting-Chang, Zheng, Hao-Xuan, Yeh, Yu-Hsuan, Wu, Chung-Wei, Tan, Yung-Fang, Lin, Shih-Kai, Wu, Pei-Yu, Sze, Simon. M.
Published in IEEE transactions on electron devices (01.04.2022)
Published in IEEE transactions on electron devices (01.04.2022)
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Journal Article
Gate Dielectric Leakage Reduction in Hard-Mask Defined and Dry-Etch Patterned Organic TFTs Devices
Chen, Jian-Jie, Chang, Ting-Chang, Hung, Yang-Hao, Zheng, Yu-Zhe, Kuo, Chuan-Wei, Lin, Shih-Kai, Wu, Pei-Yu, Tsai, Chia-Hung, Ogier, Simon
Published in IEEE electron device letters (01.01.2022)
Published in IEEE electron device letters (01.01.2022)
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Journal Article
Performance Improvement by Enhancing Passivation Layer of p-Type GaN High-Electron Mobility Transistors With Supercritical Oxygen Treatment
Chou, Sheng-Yao, Wu, Pei-Yu, Chen, Ming-Chen, Chang, Ting-Chang, Tsai, Xin-Ying, Lin, Shih-Kai, Kuo, Ting-Tzu, Huang, Wei-Chen, Tu, Hong-Yi, Wu, Chung-Wei, Tsai, Tsung-Ming, Huang, Jen-Wei
Published in IEEE electron device letters (01.02.2023)
Published in IEEE electron device letters (01.02.2023)
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Journal Article
A solid-state semiconductor battery with silica-coated TiO2 core–shell energy storage nanoparticles for rechargeable device application
Wang, Min-Chuan, Wu, Bo-Hsien, Liu, Shang-En, Li, Yu-Chen, Lin, Shih-Kai, Tsai, Tsung-Ming, Chang, Ting-Chang
Published in AIP advances (01.09.2023)
Published in AIP advances (01.09.2023)
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Journal Article
Improvement of Hafnium Oxide Resistive Memory Performance Through Low-Temperature Supercritical Oxidation Treatments
Wu, Pei-Yu, Chang, Ting-Chang, Chen, Min-Chen, Yang, Chih-Cheng, Zheng, Hao-Xuan, Chen, Po-Hsun, Chen, Wen-Chung, Zhang, Yong-Ci, Lin, Shih-Kai, Chen, Jian-Jie, Huang, Hui-Chun, Tsai, Tsung-Ming, Sze, Simon M.
Published in IEEE transactions on electron devices (01.02.2021)
Published in IEEE transactions on electron devices (01.02.2021)
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Journal Article
Meridian study on the response current affected by electrical pulse and acupuncture
Hung, Yu-Chiang, Chen, Wen-Chung, Chang, Ting-Chang, Zheng, Hao-Xuan, Liu, Yan-Wen, Tan, Yung-Fang, Lin, Shih-Kai, Lu, Ying-Hsin, Hu, Wen-Long, Tsai, Tsung-Ming
Published in Nanoscale research letters (10.07.2020)
Published in Nanoscale research letters (10.07.2020)
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Journal Article
Analyzing Electric Field Effect by Applying an Ultra-Short Time Pulse Condition in Hafnium Oxide-Based RRAM
Wu, Cheng-Hsien, Lin, Shih-Kai, Pan, Chih-Hung, Chen, Po-Hsun, Lin, Wen-Yan, Chang, Ting-Chang, Tsai, Tsung-Ming, Xu, You-Lin, Shih, Chih-Cheng, Lin, Yu-Shuo, Chen, Wen-Chung, Wang, Ming-Hui, Zhang, Sheng-Dong, Sze, Simon M.
Published in IEEE electron device letters (01.08.2018)
Published in IEEE electron device letters (01.08.2018)
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Journal Article
Stabilizing resistive random access memory by constructing an oxygen reservoir with analyzed state distribution
Lin, Chih-Yang, Zhou, Kuan-Ju, Chang, Ting-Chang, Sun, Li-Chuan, Tan, Yung-Fang, Wu, Chung-Wei, Yeh, Yu-Hsuan, Chen, Wen-Chung, Lin, Chun-Chu, Huang, Wei-Chen, Wu, Cheng-Hsien, Lin, Shih-Kai, Lin, Tzu-Heng, Huang, Jen-Wei, Sze, Simon M
Published in Nanoscale (08.12.2020)
Published in Nanoscale (08.12.2020)
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Journal Article
The Effect of Humidity on Reducing Forming Voltage in Conductive-Bridge Random Access Memory With an Alloy Electrode
Lin, Shih-Kai, Chen, Min-Chen, Chang, Ting-Chang, Lien, Chen-Hsin, Chang, Jing-Shuen, Wu, Cheng-Hsien, Tseng, Yi-Ting, Xu, You-Lin, Huang, Kai-Lin, Sun, Li-Chuan, Zhang, Yong-Ci, Chiu, Yu-Ju, Sze, Simon M.
Published in IEEE electron device letters (01.10.2019)
Published in IEEE electron device letters (01.10.2019)
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