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Year of Publication 23.05.2023
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INSPECTION APPARATUS AND INSPECTION METHOD FOR INSPECTING LIGHT-EMITTING DIODES
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Year of Publication 29.07.2021
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Quality detecting device and method
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Year of Publication 02.01.2018
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Year of Publication 02.01.2018
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INSPECTION APPARATUS AND INSPECTION METHOD FOR INSPECTING LIGHT-EMITTING DIODES
LO, CHIEH-YI, LIN, YAN-RUNG, KUO, CHUNG-LUN, LIN, YEOU-SUNG, WEI, HSIANGUN, LIU, CHIH-HSIANG
Year of Publication 01.08.2022
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Year of Publication 01.08.2022
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Inspection apparatus and inspection method for inspecting light-emitting diodes
LO, CHIEH-YI, LIN, YAN-RUNG, KUO, CHUNG-LUN, LIN, YEOU-SUNG, WEI, HSIANGUN, LIU, CHIH-HSIANG
Year of Publication 01.07.2022
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Year of Publication 01.07.2022
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Detecting device for crystalline quality of LTPS backplane and method thereof
LIN, KENG-LI, YANG, FUNG, TSAI, WEI-HSIUNG, LIN, YEOU-SUNG, HUANG, MAO-SHENG, YEH, CHIA-LIANG
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Year of Publication 01.06.2018
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A DEVICE AND METHOD FOR DETECTING CRYSTAL QUALITY OF A LOW TEMPERATURE POLY-SILICON (LTPS) BACKPLANE
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Year of Publication 25.05.2018
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Year of Publication 25.05.2018
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A system for measuring anisotropy, a method for measuring anisotropy and a calibration method thereof
WEI HSIANGUN, CHUANG KAI-PING, HSIEH YIN, YANG FUNG, LIU CHIH-SHANG, LIN YEOU-SUNG
Year of Publication 23.11.2016
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Year of Publication 23.11.2016
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A system for measuring anisotropy, a method for measuring anisotropy and a calibration method thereof
YANG, FUNG, HSIEH, YIN, CHUANG, KAI-PING, LIN, YEOU-SUNG, WEI, HSIANGUN, LIU, CHIH-SHANG
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Year of Publication 01.07.2016
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Detecting device for crystalline quality of ltps backplane and method thereof
LIN, YEOU SUNG, HUANG, MAO SHENG, YEH, CHIA LIANG, TSAI, WEI HSIUNG, YANG, FU CHENG, LIN, KENG LI
Year of Publication 21.01.2018
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Year of Publication 21.01.2018
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