Early Testable Addressable Logic (ETAL) Test Structure: Showcasing the use of an Alternate Logic Yield Learning Test Structure for Technology Development
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Published in 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2019)
Published in 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2019)
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Conference Proceeding
Terahertz Detection With Nanoscale Semiconductor Rectifiers
Rui Chen, Jungwoo Song, Teng-Yin Lin, Aizin, G. R., Kawano, Y., Aoki, N., Ochiai, Y., Whiteside, V. R., McCombe, B. D., Thomas, D., Einhorn, M., Reno, J. L., Strasser, G., Bird, J. P.
Published in IEEE sensors journal (01.01.2013)
Published in IEEE sensors journal (01.01.2013)
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Journal Article
Defect improvement by optimizing electroplating in BEOL sub-50nm pitch
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Published in 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2017)
Published in 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2017)
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Conference Proceeding
STRUCTURES FOR A VERTICAL VARACTOR DIODE AND RELATED METHODS
Jain, Vibhor, Lin, Teng-Yin, Kenney, Crystal R, Pekarik, John J, Chaurasia, Saloni, Saroop, Sudesh, Johnson, Jeffrey
Year of Publication 29.02.2024
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Year of Publication 29.02.2024
Patent
Dummy fill structures
Elkadi, Asmaa, Lin, Teng-Yin, Gordon, Edward J, Shampur, Anvitha, Lee, Tung-Hsing, Martin, Alexander, Mont, Frank W, Lee, Won Suk
Year of Publication 21.03.2023
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Year of Publication 21.03.2023
Patent
DUMMY FILL STRUCTURES
ELKADI, Asmaa, LEE, Won Suk, LIN, Teng-Yin, SHAMPUR, Anvitha, MARTIN, Alexander, GORDON, Edward J, LEE, Tung-Hsing, MONT, Frank W
Year of Publication 29.04.2021
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Year of Publication 29.04.2021
Patent
Strukturen für eine vertikale Varaktordiode und entsprechende Verfahren
Jain, Vibhor, Lin, Teng-Yin, Kenney, Crystal R, Pekarik, John J, Chaurasia, Saloni, Saroop, Sudesh, Johnson, Jeffrey
Year of Publication 29.02.2024
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Year of Publication 29.02.2024
Patent