Hole trap effect on time-dependent-dielectric breakdown (TDDB) of high-voltage peripheral nMOSFETs in flash memory application
Guangfan Jiao, Sungkweon Baek, Kab-jin Nam, Sung-Il Chang, Siyeon Cho, Kauerauf, Thomas, Chanho Lee, Seung-Uk Han, Jin-Soak Kim, Eun-Ae Chung, Yoo-Cheol Shin, Junhee Lim, Yu-Gyun Shin, Kihyun Hwang
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Get full text
Conference Proceeding
A new ruler on the storage market: 3D-NAND flash for high-density memory and its technology evolutions and challenges on the future
Jaeduk Lee, Jaehoon Jang, Junhee Lim, Yu Gyun Shin, Kyupil Lee, Eunseung Jung
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)
Get full text
Conference Proceeding
A novel method to analyze and design a NWL scheme DRAM
Seokhan Park, Bonggu Sung, Hyuckchai Jung, Junhee Lim, Sangwoon Lee, Jooyoung Lee, Wonsuk Yang, Kyungseok Oh, Taeyoung Chung, Kinam Kim
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)
Get full text
Conference Proceeding
SEMICONDUCTOR DEVICE AND THE MANUFACTURING METHOD
CHOI CHANGMIN, KIM HYUNMIN, PARK JUNTAEK, LEE DONGJIN, LIM JUNHEE, LEE RYOONGBIN
Year of Publication 19.08.2024
Get full text
Year of Publication 19.08.2024
Patent
Semiconductor device and electronic system including the same
KIM JEONGEUN, LEE CHANGHEON, SON NAKJIN, MIN JUSEONG, KIM HAKSEON, LEE DONGJIN, LIM JUNHEE
Year of Publication 28.12.2022
Get full text
Year of Publication 28.12.2022
Patent
Mechanical Stress Effects on Dielectric Leakage and Interconnection Integrity in 3D NAND Flash Memory
Lee, Sehoon, Lee, Jieun, Jang, Sungpil, Kim, Sujeong, Kim, Choelgyu, Sae-Jin Kim, Narae Jeong, Kang, Jisoo, Hong, Juhee, Kim, Dong-Kyu, Lim, Junhee, Park, Sejun, Hong, Seungwan, Hur, Sunghoi
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Get full text
Conference Proceeding
The improvement of HEIP immunity using STI engineering at DRAM
Han, Seunguk, Lee, Youngyoun, Kim, Yongdoo, Park, Jemin, Lim, Junhee, Yamada, Satoru, Hong, Hyeongsun, Lee, Kyupil, Jin, Gyoyoung, Jung, Eunseung
Published in Microelectronics and reliability (01.09.2017)
Published in Microelectronics and reliability (01.09.2017)
Get full text
Journal Article
In-Depth Analysis of NBTI at 2X nm Node DRAM
Seunguk Han, Sungsam Lee, Sungkweon Baek, Sungho Jang, Wonchang Jeong, Kijae Huh, Moonyoung Jeong, Junhee Lim, Yamada, Satoru, Hyeongsun Hong, Kyupil Lee, Gyoyoung Jin, Eunseung Jung
Published in 2016 IEEE 8th International Memory Workshop (IMW) (01.05.2016)
Published in 2016 IEEE 8th International Memory Workshop (IMW) (01.05.2016)
Get full text
Conference Proceeding
3 Three dimensional semiconductor device and method for fabricating the same
LEE KYUNGHWAN, KANG CHANGSEOK, KIM YONGSEOK, KANAMORI KOHJI, LIM JUNHEE
Year of Publication 14.10.2019
Get full text
Year of Publication 14.10.2019
Patent
THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE
KIM TAE-HUN, LEE KYUNGHWAN, SEO DONGKYUN, KIM YONG SUK, KIM BYOUNG-TAEK, LIM JUNHEE
Year of Publication 06.06.2019
Get full text
Year of Publication 06.06.2019
Patent
3 Three dimensional semiconductor device
KIM BYOUNG TAEK, LEE KYUNGHWAN, SEO DONGKYUN, KIM YONGSEOK, LIM JUNHEE, KIM TAE HUN
Year of Publication 17.05.2019
Get full text
Year of Publication 17.05.2019
Patent