by Khaddam-Aljameh, Riduan, Stanisavljevic, Milos, Fornt Mas, Jordi, Karunaratne, Geethan, Brandli, Matthias, Liu, Feng, Singh, Abhairaj, Muller, Silvia M., Egger, Urs, Petropoulos, Anastasios, Antonakopoulos, Theodore, Brew, Kevin, Choi, Samuel, Ok, Injo, Lie, Fee Li, Saulnier, Nicole, Chan, Victor, Ahsan, Ishtiaq, Narayanan, Vijay, Nandakumar, S. R., Le Gallo, Manuel, Francese, Pier Andrea, Sebastian, Abu, Eleftheriou, Evangelos
Published in IEEE journal of solid-state circuits (01.04.2022)

by Deng, Zhengtao, Lie, Fee Li, Shen, Shengyi, Ghosh, Indraneel, Mansuripur, Masud, Muscat, Anthony J
Published in Langmuir (06.01.2009)

by Heng Wu, Soon-Cheon Seo, Chengyu Niu, Wei Wang, Tsutsui, Gen, Gluschenkov, Oleg, Zuoguang Liu, Petrescu, Alexandru, Carr, Adra, Choi, Sam, Tsai, Stan, Chanro Park, Seshadri, Indira, Desilva, Anuja, Arceo, Abraham, Yang, George, Sankarapandian, Muthumanickam, Prindle, Chris, Akarvardar, Kerem, Durfee, Curtis, Jie Yang, Adusumilli, Praneet, Miao, Bruce, Strane, Jay, Kleemeier, Walter, Raymond, Mark, Choi, Kisik, Fee-li Lie, Yamashita, Tenko, Knorr, Andreas, Gupta, Dinesh, Dechao Guo, Divakaruni, Rama, Huiming Bu, Khare, Mukesh
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)

by Imangholi, B., Fee Li Lie, Parks, H.G., Muscat, A.J.
Published in IEEE transactions on electron devices (01.04.2010)

by Tsutsui, Gen, Huimei Zhou, Greene, Andrew, Robison, Robert, Jie Yang, Juntao Li, Prindle, Christopher, Sporre, John R., Miller, Eric R., Liu, Derrick, Sporer, Ryan, Mulfinger, Bob, McArdle, Tim, Jin Cho, Karve, Gauri, Fee Li Lie, Kanakasabapathy, Siva, Carter, Rick, Gupta, Dinesh, Knorr, Andreas, Dechao Guo, Huiming Bu
Published in 2017 Symposium on VLSI Technology (01.06.2017)

by Chen, Qianwen, Belyansky, Michael, Sulehria, Yasir, Horibe, Akihiro, Qin, Liqiao, Pujari, Ruturaj, Perfecto, Eric, Lie, Fee Li, Butt, Shahid, Polomoff, Nick, Miyazawa, Risa, Kohara, Sayuri, Farooq, Mukta, Hisada, Takashi, Oakley, Jennifer, Skordas, Spyridon, Fan, Susan, Sakuma, Katsuyuki, Knickerbocker, John, Mcherron, Dale, Tamura, Takeshi, Ishii, Takayuki, Jaipan, Panupong, Nishimura, Satoshi, Son, Ilseok, Maeda, Yohei, Koga, Takashi, Klein, Joseph, Tashiro, Kei, Arkalgud, Sitaram, Kondo, Yoshihiro
Published in 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC) (01.05.2023)

by Gluschenkov, Oleg, Wu, Heng, Brew, Kevin, Niu, Chengyu, Yu, Lan, Sulehria, Yasir, Choi, Samuel, Durfee, Curtis, Demarest, James, Carr, Adra, Chen, Shaoyin, Willis, Jim, Thanigaivelan, Thirumal, Lie, Fee-li, Kleemeier, Walter, Guo, Dechao
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)

by Khaddam-Aljameh, Riduan, Stanisavljevic, Milos, Fornt Mas, Jordi, Karunaratne, Geethan, Brandli, Matthias, Liu, Feng, Singh, Abhairaj, Muller, Silvia M., Egger, Urs, Petropoulos, Anastasios, Antonakopoulos, Theodore, Brew, Kevin, Choi, Samuel, Ok, Injo, Lie, Fee Li, Saulnier, Nicole, Chan, Victor, Ahsan, Ishtiaq, Narayanan, Vijay, Nandakumar, S. R., Le Gallo, Manuel, Francese, Pier Andrea, Sebastian, Abu, Eleftheriou, Evangelos
Published in IEEE journal of solid-state circuits (01.04.2022)

by Lie, Fee Li, Muscat, Anthony J
Published in Journal of physical chemistry. C (21.04.2011)

by Lie, Fee Li, Muscat, Anthony J.
Published in Journal of physical chemistry. C (21.04.2011)

by Lie, Fee Li, Rachmady, Willy, Muscat, Anthony J.
Published in Journal of physical chemistry. C (13.10.2011)

by Tsutsui, Gen, Ruqiang Bao, Kwan-yong Lim, Robison, Robert R., Vega, Reinaldo A., Jie Yang, Zuoguang Liu, Miaomiao Wang, Gluschenkov, Oleg, Chun Wing Yeung, Watanabe, Koji, Bentley, Steven, Niimi, Hiroaki, Liu, Derrick, Huimei Zhou, Siddiqui, Shariq, Hoon Kim, Galatage, Rohit, Venigalla, Rajasekhar, Raymond, Mark, Adusumilli, Praneet, Mochizuki, Shogo, Devarajan, Thamarai S., Miao, Bruce, Bei Liu, Greene, Andrew, Shearer, Jeffrey, Montanini, Pietro, Strane, Jay W., Prindle, Christopher, Miller, Eric R., Fronheiser, Jody, Niu, Chengyu C., Kisup Chung, Kelly, James J., Jagannathan, Hemanth, Kanakasabapathy, Sivananda, Karve, Gauri, Fee Li Lie, Oldiges, Philip, Narayanan, Vijay, Hook, Terence B., Knorr, Andreas, Gupta, Dinesh, Guo, Dechao, Divakaruni, Rama, Huiming Bu, Khare, Mukesh
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)

by Tseng, Wei-Tsu, Boye, Carol, Silvestre, Claire, Chen, James H.-C., Lie, Fee li, Canaperi, Donald
Published in 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (10.05.2021)

by Lie, Fee Li, Rachmady, Willy, Muscat, Anthony J
Published in Journal of physical chemistry. C (13.10.2011)

by Chen, James H.-C., Lie, Fee li, DeVries, Scott, Boye, Carol, Mehta, Sanjay, Devarajan, Thamarai S., Silvestre, Mary-Claire, Tseng, Wei-Tsu, Aminpur, Massud A
Published in 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.08.2020)

by Granados, B., Lie, F., Muscat, A.
Published in Microscopy and microanalysis (01.07.2012)

by Mochizuki, Shogo, Lie, Fee Li, Wang, Junli
Year of Publication 23.07.2024

by LIE, Fee Li, WANG, Junli, MOCHIZUKI, Shogo
Year of Publication 09.02.2023

by LIE, FEE LI, Farooq, Mukta Ghate
Year of Publication 03.10.2024

by Lie, Fee Li, Rizzolo, Michael, Chung, Kisup
Year of Publication 05.01.2023