The Intrinsic Thermoreflectance Property of 4H-SiC
Chen, Yusa, Huang, Yun, Wu, Wen-Gang, Liu, Yan, Zhai, Yuwei, Wu, Aihua, Liang, Faguo
Published in Journal of electronic materials (01.02.2022)
Published in Journal of electronic materials (01.02.2022)
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Journal Article
An Advanced Calibration Method for Probe Leakage Correction in On-Wafer Test Systems
Wang, Yibang, Fu, Xingchang, Wu, Aihua, Huo, Ye, Liu, Chen, Luan, Peng, Lei, Lihua, Liang, Faguo, Li, Chong
Published in IEEE transactions on microwave theory and techniques (01.02.2023)
Published in IEEE transactions on microwave theory and techniques (01.02.2023)
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Journal Article
Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy
Luan, Peng, Wang, Yibang, Zhao, Wei, Liu, Chen, Liang, Faguo, Wu, Aihua, Du, Jing
Published in IEEE transactions on instrumentation and measurement (01.11.2020)
Published in IEEE transactions on instrumentation and measurement (01.11.2020)
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Journal Article
Calibration on the Fly-A Novel Two-Port S-Parameter Measurement Method for On-Wafer Leaky Systems
Wu, Aihua, Liu, Chen, Liang, Faguo, Zou, Xuefeng, Wang, Yibang, Luan, Peng, Li, Chong, Ridler, Nick
Published in IEEE transactions on microwave theory and techniques (01.08.2020)
Published in IEEE transactions on microwave theory and techniques (01.08.2020)
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Journal Article
Research on the calibration technique of on-wafer load-pull system
Luan Peng, Liang Faguo, Han Zhiguo, Li Jingqiang, Qiao Yu'e
Published in 2013 IEEE 11th International Conference on Electronic Measurement & Instruments (01.08.2013)
Published in 2013 IEEE 11th International Conference on Electronic Measurement & Instruments (01.08.2013)
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Conference Proceeding
Development of gallium-arsenide-based GCPW calibration kits for on-wafer measurements in the W-band
Wang, Yibang, Fu, Xingchang, Wu, Aihua, Liu, Chen, Luan, Peng, Liang, Faguo, Zhao, Wei, Shang, Xiaobang
Published in International journal of microwave and wireless technologies (01.06.2020)
Published in International journal of microwave and wireless technologies (01.06.2020)
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Journal Article
Ways to Improve Temperature Measurement Accuracy of InfraScope Thermal Mapper
Zhai Yuwei, Liang Faguo, Zheng Shiqi, Wu Aihua, Qiao Yue
Published in 2013 Third International Conference on Instrumentation, Measurement, Computer, Communication and Control (01.09.2013)
Published in 2013 Third International Conference on Instrumentation, Measurement, Computer, Communication and Control (01.09.2013)
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Conference Proceeding
Research on Calibration Uncertainty Evaluation Method of Transfer Standards for Calibrating the On-Wafer Load-Pull System
Han Zhiguo, Liang Faguo, Luan Peng, Li Suoyin, Li Jingqiang
Published in 2013 Third International Conference on Instrumentation, Measurement, Computer, Communication and Control (01.09.2013)
Published in 2013 Third International Conference on Instrumentation, Measurement, Computer, Communication and Control (01.09.2013)
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Conference Proceeding
Evaluation on uncertainty of noise parameter against commercial measurement
Wu Aihua, Liang Faguo, Han Lihua, Liu Chen, Zhai Yuwei, Zheng Yanqiu
Published in 2013 IEEE 11th International Conference on Electronic Measurement & Instruments (01.08.2013)
Published in 2013 IEEE 11th International Conference on Electronic Measurement & Instruments (01.08.2013)
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Conference Proceeding
A "Calibration on the Fly" Method for Millimeter-wave On-wafer Measurement
Li, Chong, Liu, Chen, Wu, Aihua, Liang, Faguo, Wang, Yibang, Luan, Peng
Published in 2020 13th UK-Europe-China Workshop on Millimetre-Waves and Terahertz Technologies (UCMMT) (29.08.2020)
Published in 2020 13th UK-Europe-China Workshop on Millimetre-Waves and Terahertz Technologies (UCMMT) (29.08.2020)
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Conference Proceeding
Method for determining parameters in on-wafer calibration piece model
Wu, Aihua, Liang, Faguo, Wang, Yibang, Liu, Chen, Sun, Jing, Li, Yanli, Luan, Peng, Huo, Ye
Year of Publication 30.04.2024
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Year of Publication 30.04.2024
Patent
Two-port on-wafer calibration piece circuit model and method for determining parameters
Wu, Aihua, Liang, Faguo, Wang, Yibang, Liu, Chen, Sun, Jing, Li, Yanli, Luan, Peng, Huo, Ye
Year of Publication 22.08.2023
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Year of Publication 22.08.2023
Patent
Calibration method and terminal equipment of terahertz frequency band on-wafer S parameter
Wu, Aihua, Liang, Faguo, Wang, Yibang, Liu, Chen, Sun, Jing, Li, Yanli, Luan, Peng, Huo, Ye
Year of Publication 12.07.2022
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Year of Publication 12.07.2022
Patent
Two-Port On-Wafer Calibration Piece Circuit Model and Method for Determining Parameters
Wu, Aihua, Liang, Faguo, Wang, Yibang, Liu, Chen, Sun, Jing, Li, Yanli, Luan, Peng, Huo, Ye
Year of Publication 07.04.2022
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Year of Publication 07.04.2022
Patent
Method for Determining Parameters in On-Wafer Calibration Piece Model
Wu, Aihua, Liang, Faguo, Wang, Yibang, Liu, Chen, Sun, Jing, Li, Yanli, Luan, Peng, Huo, Ye
Year of Publication 31.03.2022
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Year of Publication 31.03.2022
Patent
Calibration method, system and device of on-wafer s parameter of vector network analyzer
Wu, Aihua, Liang, Faguo, Hu, Zhifu, Wang, Yibang, Liu, Chen, Cao, Jian, Zou, Xuefeng, Huo, Ye
Year of Publication 15.03.2022
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Year of Publication 15.03.2022
Patent
On-wafer S-parameter calibration method
Tian, Xiuwei, Wu, Aihua, Liang, Faguo, Liu, Yanan, Liu, Chen, Wang, Yibang, Li, Chong, Cao, Jian, Fu, Xingchang
Year of Publication 24.05.2022
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Year of Publication 24.05.2022
Patent
CALIBRATION METHOD AND TERMINAL EQUIPMENT OF TERAHERTZ FREQUENCY BAND ON-WAFER S PARAMETER
Wu, Aihua, Liang, Faguo, Wang, Yibang, Liu, Chen, Sun, Jing, Li, Yanli, Luan, Peng, Huo, Ye
Year of Publication 17.06.2021
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Year of Publication 17.06.2021
Patent