Time-dependent characteristics and physical mechanisms of AlGaN/GaN metal-insulator-semiconductor high electron mobility transistors under different bias conditions
Li, Shanjie, He, Zhiyuan, Gao, Rui, Chen, Yiqiang, Liu, Yang, Zhu, Zhe
Published in Journal of physics. D, Applied physics (27.11.2019)
Published in Journal of physics. D, Applied physics (27.11.2019)
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Journal Article
GaN-based power high-electron-mobility transistors on Si substrates: from materials to devices
Wu, Nengtao, Xing, Zhiheng, Li, Shanjie, Luo, Ling, Zeng, Fanyi, Li, Guoqiang
Published in Semiconductor science and technology (01.06.2023)
Published in Semiconductor science and technology (01.06.2023)
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Journal Article
Enhanced Performance of Low-Leakage-Current Normally off p-GaN Gate HEMTs Using NH3 Plasma Pretreatment
Wu, Nengtao, Luo, Ling, Xing, Zhiheng, Li, Shanjie, Zeng, Fanyi, Cao, Ben, Wu, Changtong, Li, Guoqiang
Published in IEEE transactions on electron devices (01.09.2023)
Published in IEEE transactions on electron devices (01.09.2023)
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Journal Article
Fabrication and formation mechanisms of ohmic conducts with low annealing temperature for GaN/AlN superlattice barrier HEMTs
Li, Shanjie, Wu, Changtong, Zeng, Fanyi, Wu, Nengtao, Luo, Ling, Cao, Ben, Wang, Wenliang, Li, Guoqiang
Published in Journal of physics. D, Applied physics (13.01.2025)
Published in Journal of physics. D, Applied physics (13.01.2025)
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Journal Article
Breakdown voltage enhancement and specific on-resistance reduction in depletion-mode GaN HEMTs by co-modulating electric field
Luo, Ling, Wu, Nengtao, Xing, Zhiheng, Li, Shanjie, Zeng, Fanyi, Cao, Ben, Wu, Changtong, Li, Guoqiang
Published in Journal of physics. D, Applied physics (18.10.2024)
Published in Journal of physics. D, Applied physics (18.10.2024)
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Journal Article
Time-Dependent Threshold Voltage Instability Mechanisms of p-GaN Gate AlGaN/GaN HEMTs Under High Reverse Bias Conditions
Li, Shanjie, He, Zhiyuan, Gao, Rui, Chen, Yiqiang, Chen, Yuan, Liu, Chang, Huang, Yun, Li, Guoqiang
Published in IEEE transactions on electron devices (01.01.2021)
Published in IEEE transactions on electron devices (01.01.2021)
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Journal Article
Enhanced Performance of Low-Leakage-Current Normally off p-GaN Gate HEMTs Using NH 3 Plasma Pretreatment
Wu, Nengtao, Luo, Ling, Xing, Zhiheng, Li, Shanjie, Zeng, Fanyi, Cao, Ben, Wu, Changtong, Li, Guoqiang
Published in IEEE transactions on electron devices (01.09.2023)
Published in IEEE transactions on electron devices (01.09.2023)
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Journal Article
High On/Off Current Ratio and High Vth/Ron Stability GaN MIS-HEMTs With GaN/AlN Superlattices Barrier
Li, Shanjie, Zeng, Fanyi, Xing, Zhiheng, Wu, Nengtao, Cao, Ben, Luo, Ling, Wu, Changtong, Wang, Wenliang, Li, Guoqiang
Published in IEEE transactions on electron devices (01.05.2024)
Published in IEEE transactions on electron devices (01.05.2024)
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Journal Article
High On/Off Current Ratio and High V th / R on Stability GaN MIS-HEMTs With GaN/AlN Superlattices Barrier
Li, Shanjie, Zeng, Fanyi, Xing, Zhiheng, Wu, Nengtao, Cao, Ben, Luo, Ling, Wu, Changtong, Wang, Wenliang, Li, Guoqiang
Published in IEEE transactions on electron devices (01.05.2024)
Published in IEEE transactions on electron devices (01.05.2024)
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Journal Article
PREPARATION METHOD OF DOUBLE-T-SHAPED GATE BASED ON DOUBLE-LAYER PASSIVATION ACCURATE ETCHING
XING, Zhiheng, LI, Guoqiang, WU, Nengtao, WANG, Wenliang, LI, Shanjie
Year of Publication 23.11.2023
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Year of Publication 23.11.2023
Patent
ENHANCED GAN HEMT RADIO-FREQUENCY DEVICE AND MANUFACTURING METHOD THEREOF
XING, Zhiheng, LUO, Ling, LI, Guoqiang, WU, Nengtao, ZENG, Fanyi, LI, Shanjie
Year of Publication 30.05.2024
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Year of Publication 30.05.2024
Patent