Column Parity Row Selection (CPRS) BIST Diagnosis Technique: Modeling and Analysis
Li, James Chien-mo, Lin, Hung-mao, Wang, Fang-min
Published in IEEE transactions on computers (01.03.2007)
Published in IEEE transactions on computers (01.03.2007)
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Journal Article
Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis
Hsieh, Bing-Han, Liu, Yun-Sheng, Li, James Chien-Mo, Nigh, Chris, Chern, Mason, Bhargava, Gaurav
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
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Conference Proceeding
Diagnosis of Quantum Circuits in the NISQ Era
Li, Yu-Min, Hsieh, Cheng-Yun, Li, Yen-Wei, Li, James Chien-Mo
Published in 2023 IEEE 41st VLSI Test Symposium (VTS) (24.04.2023)
Published in 2023 IEEE 41st VLSI Test Symposium (VTS) (24.04.2023)
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Conference Proceeding
DR-Scan: Dual-Rail Asynchronous Scan DfT and ATPG
Hsieh, Shih-An, Wang, Ying-Hsu, Shen, Ting-Yu, Huang, Kuan-Yen, Pai, Chia-Cheng, Chen, Tsai-Chieh, Li, James Chien-Mo
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2019)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2019)
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Journal Article
High-Speed, Low-Storage Power and Thermal Predictions for ATPG Test Patterns
Liang, Zhe-Jia, Wu, Yu-Tsung, Yang, Yun-Feng, Li, James Chien-Mo, Chang, Norman, Kumar, Akhilesh, Li, Ying-Shiun
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
Published in 2023 IEEE International Test Conference (ITC) (07.10.2023)
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Conference Proceeding
PSN-aware circuit test timing prediction using machine learning
Liu, Yu-Cheng, Han, Cheng-Yu, Lin, Shih-Yao, Li, James Chien-Mo
Published in Chronic diseases and translational medicine (01.03.2017)
Published in Chronic diseases and translational medicine (01.03.2017)
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Journal Article
A Multicircuit Simulator Based on Inverse Jacobian Matrix Reuse
Hung-I Lee, Chen-Yo Han, Li, James Chien-Mo
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.07.2016)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.07.2016)
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Journal Article
Test Clock Domain Optimization to Avoid Scan Shift Failure Due to Flip-Flop Simultaneous Triggering
Yu-Chiuan Huang, Min-Hong Tsai, Wei-Sheng Ding, Li, J. C.-M, Ming-Tung Chang, Min-Hsiu Tsai, Chih-Mou Tseng, Hung-Chun Li
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.04.2013)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.04.2013)
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Journal Article
Fault Simulation and Test Pattern Generation for Cross-gate Defects in FinFET Circuits
Kuan-Ying Chiang, Yu-Hao Ho, Yo-Wei Chen, Cheng-Sheng Pan, Li, James Chien-Mo
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
Published in 2015 IEEE 24th Asian Test Symposium (ATS) (01.11.2015)
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Conference Proceeding
Journal Article
Improving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization
Wu, Mu-Ting, Kuo, Cheng-Sian, Li, James Chien-Mo, Nigh, Chris, Bhargava, Gaurav
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
Published in 2021 IEEE International Test Conference (ITC) (01.10.2021)
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Conference Proceeding
ML-Assisted VminBinning with Multiple Guard Bands for Low Power Consumption
Lin, Wei-Chen, Chen, Chun, Hsieh, Chao-Ho, Li, James Chien-Mo, Fang, Eric Jia-Wei, Hsueh, Sung S.-Y.
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
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Conference Proceeding
Simultaneous Optimization of Analog Circuits With Reliability and Variability for Applications on Flexible Electronics
Yen-Lung Chen, Wan-Rong Wu, Liu, Chien-Nan Jimmy, Li, James Chien-Mo
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2014)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2014)
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Journal Article
qATG: Automatic Test Generation for Quantum Circuits
Wu, Chen-Hung, Hsieh, Cheng-Yun, Li, Jiun-Yun, Li, James Chien-Mo
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
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Conference Proceeding
Realistic Fault Models and Fault Simulation for Quantum Dot Quantum Circuits
Hsieh, Cheng-Yun, Wu, Chen-Hung, Huang, Chia-Hsien, Goan, His-Sheng, Mo Li, James Chien
Published in 2020 57th ACM/IEEE Design Automation Conference (DAC) (01.07.2020)
Published in 2020 57th ACM/IEEE Design Automation Conference (DAC) (01.07.2020)
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Conference Proceeding