Editorial Special Issue on Dielectrics for 2-D Electronics
Lanza, Mario, Pey, Kin-Leong, Grasser, Tibor
Published in IEEE transactions on electron devices (01.04.2023)
Published in IEEE transactions on electron devices (01.04.2023)
Get full text
Journal Article
Analysis and Simulation of Interface Quality and Defect Induced Variability in MgO Spin-Transfer Torque Magnetic RAMs
Sikder, Bejoy, Lim, Jia Hao, Kumar, Mondol Anik, Padovani, Andrea, Haverty, Michael, Kamal, Uday, Raghavan, Nagarajan, Larcher, Luca, Pey, Kin-Leong, Baten, Md Zunaid
Published in IEEE electron device letters (01.01.2021)
Published in IEEE electron device letters (01.01.2021)
Get full text
Journal Article
Recommended Methods to Study Resistive Switching Devices
Lanza, Mario, Wong, H.‐S. Philip, Pop, Eric, Ielmini, Daniele, Strukov, Dimitri, Regan, Brian C., Larcher, Luca, Villena, Marco A., Yang, J. Joshua, Goux, Ludovic, Belmonte, Attilio, Yang, Yuchao, Puglisi, Francesco M., Kang, Jinfeng, Magyari‐Köpe, Blanka, Yalon, Eilam, Kenyon, Anthony, Buckwell, Mark, Mehonic, Adnan, Shluger, Alexander, Li, Haitong, Hou, Tuo‐Hung, Hudec, Boris, Akinwande, Deji, Ge, Ruijing, Ambrogio, Stefano, Roldan, Juan B., Miranda, Enrique, Suñe, Jordi, Pey, Kin Leong, Wu, Xing, Raghavan, Nagarajan, Wu, Ernest, Lu, Wei D., Navarro, Gabriele, Zhang, Weidong, Wu, Huaqiang, Li, Runwei, Holleitner, Alexander, Wurstbauer, Ursula, Lemme, Max C., Liu, Ming, Long, Shibing, Liu, Qi, Lv, Hangbing, Padovani, Andrea, Pavan, Paolo, Valov, Ilia, Jing, Xu, Han, Tingting, Zhu, Kaichen, Chen, Shaochuan, Hui, Fei, Shi, Yuanyuan
Published in Advanced electronic materials (01.01.2019)
Published in Advanced electronic materials (01.01.2019)
Get full text
Journal Article
Experimental and Theoretical Investigation of Intracell Magnetic Coupling-Induced Variability of Spin-Transfer Torque Magnetic RAMs
Dutta, Ramit, Hamid, Shafin Bin, Lim, Jia Hao, Tan, Joel, Sikder, Bejoy, Raghavan, Nagarajan, Pey, Kin Leong, Baten, Md Zunaid
Published in IEEE transactions on electron devices (01.10.2023)
Published in IEEE transactions on electron devices (01.10.2023)
Get full text
Journal Article
Demonstration of Schottky Barrier NMOS Transistors With Erbium Silicided Source/Drain and Silicon Nanowire Channel
Eu Jin Tan, Kin-Leong Pey, Singh, N., Guo-Qiang Lo, Dong Zhi Chi, Yoke King Chin, Keat Mun Hoe, Guangda Cui, Pooi See Lee
Published in IEEE electron device letters (01.10.2008)
Published in IEEE electron device letters (01.10.2008)
Get full text
Journal Article
Dielectric breakdown of 2D muscovite mica
Maruvada, Anirudh, Shubhakar, Kalya, Raghavan, Nagarajan, Pey, Kin Leong, O’Shea, Sean J.
Published in Scientific reports (18.08.2022)
Published in Scientific reports (18.08.2022)
Get full text
Journal Article
Impact of Voltage Polarity on Time-Dependent Dielectric Breakdown of 1-nm MgO-Based STT-MRAM With Self-Heating Correction
Tan, Joel, Lim, Jia Hao, Sikder, Bejoy, Baten, Md. Zunaid, Kwon, Jae Hyun, Yamane, Kazutaka, Naik, Vinayak Bharat, Raghavan, Nagarajan, Pey, Kin Leong
Published in IEEE transactions on electron devices (01.01.2023)
Published in IEEE transactions on electron devices (01.01.2023)
Get full text
Journal Article
Identifying the First Layer to Fail in Dual-Layer SiOx/HfSiON Gate Dielectric Stacks
PADOVANI, Andrea, RAGHAVAN, Nagarajan, LARCHER, Luca, KIN LEONG PEY
Published in IEEE electron device letters (01.10.2013)
Published in IEEE electron device letters (01.10.2013)
Get full text
Journal Article
Vacancy Generation by Laser Preirradiation for Junction Leakage Suppression
Xueming Tan, D., Kuang Kian Ong, Kin-Leong Pey, Xincai Wang, Guo-Qiang Lo, Chee Mang Ng, Lap Chan, Hong Yu Zheng
Published in IEEE electron device letters (01.12.2009)
Published in IEEE electron device letters (01.12.2009)
Get full text
Journal Article
Germanium coated vertically-aligned multiwall carbon nanotubes as lithium-ion battery anodes
Susantyoko, Rahmat Agung, Wang, Xinghui, Sun, Leimeng, Pey, Kin Leong, Fitzgerald, Eugene, Zhang, Qing
Published in Carbon (New York) (01.10.2014)
Published in Carbon (New York) (01.10.2014)
Get full text
Journal Article
Reliability Analysis of Random Telegraph Noisebased True Random Number Generators
Zanotti, Tommaso, Ranjan, Alok, O'Shea, Sean J., Raghavan, Nagarajan, Thamankar, Ramesh, Pey, Kin Leong, Maria Puglisi, Francesco
Published in 2023 IEEE International Integrated Reliability Workshop (IIRW) (08.10.2023)
Published in 2023 IEEE International Integrated Reliability Workshop (IIRW) (08.10.2023)
Get full text
Conference Proceeding
Dielectric Breakdown in Single-Crystal Hexagonal Boron Nitride
Ranjan, Alok, Raghavan, Nagarajan, Holwill, Matthew, Watanabe, Kenji, Taniguchi, Takashi, Novoselov, Kostya S, Pey, Kin Leong, O’Shea, Sean J
Published in ACS applied electronic materials (24.08.2021)
Published in ACS applied electronic materials (24.08.2021)
Get full text
Journal Article
Assessment of read disturb immunity in conducting bridge memory devices – A thermodynamic perspective
Raghavan, Nagarajan, Bosman, Michel, Pey, Kin Leong
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
Get full text
Journal Article
Conference Proceeding
Feasibility of SILC Recovery in Sub-10-Å EOT Advanced Metal Gate-High- \kappa Stacks
Raghavan, Nagarajan, Xing Wu, Bosman, Michel, Kin Leong Pey
Published in IEEE electron device letters (01.08.2013)
Published in IEEE electron device letters (01.08.2013)
Get full text
Journal Article
Evidence for compliance controlled oxygen vacancy and metal filament based resistive switching mechanisms in RRAM
Raghavan, Nagarajan, Pey, Kin Leong, Liu, Wenhu, Wu, Xing, Li, Xiang, Bosman, Michel
Published in Microelectronic engineering (01.07.2011)
Published in Microelectronic engineering (01.07.2011)
Get full text
Journal Article
Conference Proceeding
Stable cyclic performance of nickel oxide–carbon composite anode for lithium-ion batteries
Susantyoko, Rahmat Agung, Wang, Xinghui, Fan, Yu, Xiao, Qizhen, Fitzgerald, Eugene, Pey, Kin Leong, Zhang, Qing
Published in Thin solid films (02.05.2014)
Published in Thin solid films (02.05.2014)
Get full text
Journal Article