반도체 신뢰성 불량의 Z-PAT 결함 유도 통계적 이상치 검출을 위한 시스템 및 방법
RATHERT ROBERT J, ROBINSON JOHN CHARLES, LENOX CHET V, PRICE DAVID W, DONZELLA ORESTE
Year of Publication 13.02.2024
Get full text
Year of Publication 13.02.2024
Patent
반도체 결함 유도 번인 및 시스템 레벨 테스트들을 위한 시스템들 및 방법들
RATHERT ROBERT J, LENOX CHET V, ROBINSON JOHN, PRICE DAVID W, DONZELLA ORESTE
Year of Publication 13.02.2024
Get full text
Year of Publication 13.02.2024
Patent
인라인 결함 부분 평균 테스트를 사용하는 반도체 적응형 테스트를 위한 시스템 및 방법
RATHERT ROBERT J, SHERMAN KARA, LENOX CHET, ROBINSON JOHN, PRICE DAVID W, DONZELLA ORESTE
Year of Publication 11.01.2024
Get full text
Year of Publication 11.01.2024
Patent
반도체 디바이스들에서 잠재적 신뢰성 결함들을 식별하기 위한 시스템 및 방법
RATHERT ROBERT J, SHERMAN KARA L, LENOX CHET V, PRICE DAVID W, DONZELLA ORESTE, CAPPEL ROBERT
Year of Publication 05.10.2022
Get full text
Year of Publication 05.10.2022
Patent
인라인 선별을 위한 촬상 반사계측
ROBINSON JOHN CHARLES, VON DEN HOFF MIKE, RATHERT ROBERT J, PANDEV STILIAN, LI SHIFANG, LENOX CHET V, PRICE DAVID W, LACH JUSTIN, SAVILLE BARRY, DONZELLA ORESTE, GROOS THOMAS
Year of Publication 23.11.2023
Get full text
Year of Publication 23.11.2023
Patent
Design systematic weak point discovery optimization
Singh, Sonal, Venkatachalam, Panneer Selvam, Lee, Julie, Daino, Michael, Saville, Barry, Lenox, Chet
Published in 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.04.2018)
Published in 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.04.2018)
Get full text
Conference Proceeding
반도체 디바이스에서 결함 기반 테스트 커버리지 갭을 자동으로 식별하기 위한 시스템 및 방법
RATHERT ROBERT J, VON DEN HOFF MIKE, SHERMAN KARA, LENOX CHET, NARASIMHAN NARAYANI, ROBINSON JOHN, PRICE DAVID W, LACH JUSTIN, LIM TENG SONG, DONZELLA ORESTE, SAVILLE BARRY, GROOS THOMAS
Year of Publication 16.08.2023
Get full text
Year of Publication 16.08.2023
Patent
Defect reduction for 20nm high-k metal gate technology
Charbois, Vincent, Lebreton, Julie, Savoye, Mylene, Labonne, Eric, Labourier, Antoine, Dumont, Benjamin, Lenox, Chet, von Den Hoff, Mike
Published in 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2015)
Published in 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2015)
Get full text
Conference Proceeding
Yield Challenges and Innovative Inspection & Metrology Solutions for Sub-10nm Manufacturing
Chen, Hardy, Lenox, Chet, Saville, Barry
Published in 2019 Electron Devices Technology and Manufacturing Conference (EDTM) (01.03.2019)
Published in 2019 Electron Devices Technology and Manufacturing Conference (EDTM) (01.03.2019)
Get full text
Conference Proceeding
SYSTEMS AND METHODS FOR SEMICONDUCTOR DEFECT-GUIDED BURN-IN AND SYSTEM LEVEL TESTS
LENOX, Chet, DONZELLA, Oreste, ROBINSON, John, RATHERT, Robert, PRICE, David
Year of Publication 15.12.2022
Get full text
Year of Publication 15.12.2022
Patent
SYSTEM FOR AUTOMATIC DIAGNOSTICS AND MONITORING OF SEMICONDUCTOR DEFECT DIE SCREENING PERFORMANCE THROUGH CORRELATION OF DEFECT AND ELECTRICAL TEST DATA
PRICE, David W, DONZELLA, Oreste, ROBINSON, John, LENOX, Chet V, LACH, Justin, RATHERT, Robert J
Year of Publication 19.06.2024
Get full text
Year of Publication 19.06.2024
Patent
SYSTEMS AND METHODS FOR SEMICONDUCTOR DEFECT-GUIDED BURN-IN AND SYSTEM LEVEL TESTS
PRICE, David, W, DONZELLA, Oreste, ROBINSON, John, LENOX, Chet, V, RATHERT, Robert, J
Year of Publication 21.02.2024
Get full text
Year of Publication 21.02.2024
Patent
SYSTEMS AND METHODS FOR SEMICONDUCTOR ADAPTIVE TESTING USING INLINE DEFECT PART AVERAGE TESTING
LENOX, Chet, PRICE, David W, DONZELLA, Oreste, ROBINSON, John, SHERMAN, Kara, RATHERT, Robert J
Year of Publication 06.12.2023
Get full text
Year of Publication 06.12.2023
Patent