Alveolar bone healing accompanied by severe swelling in cleft children treated with bone morphogenetic protein-2 delivered by hydrogel
Neovius, E, Lemberger, M, Docherty Skogh, AC, Hilborn, J, Engstrand, T
Published in Journal of plastic, reconstructive & aesthetic surgery (01.01.2013)
Published in Journal of plastic, reconstructive & aesthetic surgery (01.01.2013)
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Journal Article
Reliability and Predictive Validity of Dental Arch Relationships Using the 5-Year-Olds' Index and the GOSLON Yardstick to Determine Facial Growth
Pegelow, Marie, Rizell, Sara, Karsten, Agneta, Mark, Hans, Lilja, Jan, Chalien, Midia Najar, Lemberger, Mathias, Peterson, Petra, Fitzsimons, Kate, Deacon, Scott, Medina, Jibby, Calvert, Mary, Mars, Michael
Published in The Cleft palate-craniofacial journal (01.05.2021)
Published in The Cleft palate-craniofacial journal (01.05.2021)
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Journal Article
Validation of reported dentoalveolar relationships in the Swedish Quality Registry for Cleft Lip and Palate
Pegelow, Marie, Klintö, Kristina, Stålhand, Gudrun, Lemberger, Mathias, Vesterbacka, Malin, Rizell, Sara, Chalien, Midia Najar, Björnström, Lena, Becker, Magnus, Lindberg, Marianne, Marcusson, Agneta, Karsten, Agneta
Published in European journal of orthodontics (2020)
Published in European journal of orthodontics (2020)
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Journal Article
Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry
Petrik, P., Gumprecht, T., Nutsch, A., Roeder, G., Lemberger, M., Juhasz, G., Polgar, O., Major, C., Kozma, P., Janosov, M., Fodor, B., Agocs, E., Fried, M.
Published in Thin solid films (01.08.2013)
Published in Thin solid films (01.08.2013)
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Journal Article
Conference Proceeding
Impact of interface variations on J-V and C-V polarity asymmetry of MIM capacitors with amorphous and crystalline Zr(1-x)AlxO2 films
WEINREICH, W, REICHE, R, SCHRODER, U, BAUER, A. J, RYSSEL, H, LEMBERGER, M, JEGERT, G, MÜLLER, J, WILDE, L, TEICHERT, S, HEITMANN, J, ERBEN, E, OBERBECK, L
Published in Microelectronic engineering (01.07.2009)
Published in Microelectronic engineering (01.07.2009)
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Conference Proceeding
Characterization of ZnO structures by optical and X-ray methods
Petrik, P., Pollakowski, B., Zakel, S., Gumprecht, T., Beckhoff, B., Lemberger, M., Labadi, Z., Baji, Z., Jank, M., Nutsch, A.
Published in Applied surface science (15.09.2013)
Published in Applied surface science (15.09.2013)
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Journal Article
Conference Proceeding
Tracking Hyaluronan: Molecularly Imprinted Polymer Coated Carbon Dots for Cancer Cell Targeting and Imaging
Demir, Bilal, Lemberger, Michael M, Panagiotopoulou, Maria, Medina Rangel, Paulina X, Timur, Suna, Hirsch, Thomas, Tse Sum Bui, Bernadette, Wegener, Joachim, Haupt, Karsten
Published in ACS applied materials & interfaces (31.01.2018)
Published in ACS applied materials & interfaces (31.01.2018)
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Journal Article
Chemical vapor deposition of tantalum nitride films for metal gate application using TBTDET and novel single-source MOCVD precursors
Lemberger, M., Baunemann, A., Bauer, A.J.
Published in Microelectronics and reliability (01.04.2007)
Published in Microelectronics and reliability (01.04.2007)
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Journal Article
Conference Proceeding
HfSiO/SiO2-and SiO2/HfSiO/SiO2-gate stacks for non-volatile memories
ERLBACHER, T, JANK, M. P. M, LEMBERGER, M, BAUER, A. J, RYSSEL, H
Published in Thin solid films (01.09.2008)
Published in Thin solid films (01.09.2008)
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Journal Article
MOCVD of tantalum nitride thin films from TBTEMT single source precursor as metal electrodes in CMOS applications
Lemberger, M., Thiemann, S., Baunemann, A., Parala, H., Fischer, R.A., Hinz, J., Bauer, A.J., Ryssel, H.
Published in Surface & coatings technology (25.09.2007)
Published in Surface & coatings technology (25.09.2007)
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Journal Article
Conference Proceeding
Polarity asymmetry of stress and charge trapping behavior of thin Hf- and Zr-silicate layers
Paskaleva, A., Lemberger, M., Bauer, A.J.
Published in Microelectronics and reliability (01.12.2007)
Published in Microelectronics and reliability (01.12.2007)
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Journal Article
MOCVD of TaN Using the All-Nitrogen-Coordinated Precursors [Ta(NEtMe)3(N-tBu)], [Ta(NEtMe)(N-tBu){C(N-iPr)2(NEtMe)}2], and [Ta(NMeEt)2(N-tBu){Me2N-N(SiMe3)}]
Baunemann, A., Lemberger, M., Bauer, A. J., Parala, H., Fischer, R. A.
Published in Chemical vapor deposition (01.03.2007)
Published in Chemical vapor deposition (01.03.2007)
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Journal Article
Zirconium silicate films obtained from novel MOCVD precursors
Lemberger, M, Paskaleva, A, Zürcher, S, Bauer, A.J, Frey, L, Ryssel, H
Published in Journal of non-crystalline solids (15.07.2003)
Published in Journal of non-crystalline solids (15.07.2003)
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Journal Article
Conference Proceeding
Electrical characterization and reliability aspects of zirconium silicate films obtained from novel MOCVD precursors
Lemberger, M, Paskaleva, A, Zürcher, S, Bauer, A.J, Frey, L, Ryssel, H
Published in Microelectronic engineering (01.04.2004)
Published in Microelectronic engineering (01.04.2004)
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Journal Article
Conference Proceeding
Validation and comparison of 2D grading scales and 3D volumetric measurements for outcome assessment of bone-grafted alveolar clefts in children
Lemberger, Mathias, Benchimol, Daniel, Pegelow, Marie, Jacobs, Reinhilde, Karsten, Agneta
Published in European journal of orthodontics (01.04.2024)
Published in European journal of orthodontics (01.04.2024)
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Journal Article
Low-Dose Cone-Beam Computed Tomography for Assessment of Alveolar Clefts: A Randomized Controlled Trial in Image Quality
Lemberger, Mathias, Regnstrand, Tobias, Karsten, Agneta, Benchimol, Daniel, Shi, Xie-Qi
Published in Plastic and reconstructive surgery (1963) (01.04.2024)
Published in Plastic and reconstructive surgery (1963) (01.04.2024)
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Journal Article
MOCVD of Hafnium Silicate Films Obtained from a Single-Source Precusor on Silicon and Germanium for Gate-Dielectric Applications
Lemberger, M., Schön, F., Dirnecker, T., Jank, M. P. M., Frey, L., Ryssel, H., Paskaleva, A., Zürcher, S., Bauer, A. J.
Published in Chemical vapor deposition (01.03.2007)
Published in Chemical vapor deposition (01.03.2007)
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Journal Article