Optical arrangement, for quantitative measurement of optical axis position of optoelectronic sensor system, with which diffraction image is created and compared with reference image to enable adjustments to be made
DRIESCHER, HANS, LEHMANN, HANNS-RAINER, SCHUSTER, REINHARD, HERBERT, JAHN, SCHEELE, MARTIN
Year of Publication 05.01.2006
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Year of Publication 05.01.2006
Patent
Device for geometric calibration of optoelectronic measurement image cameras has an arrangement for producing a defined test structure in the form of a slit diaphragm
DRIESCHER, HANS, LEHMANN, HANNS-RAINER, SCHUSTER, REINHARD, HERBERT, JAN, SCHEELE, MARTIN
Year of Publication 10.11.2005
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Year of Publication 10.11.2005
Patent
Verfahren und Vorrichtung zum geometrischen Kalibrieren von optoelektronischen Messbildkameras
DRIESCHER, HANS, LEHMANN, HANNS-RAINER, SCHUSTER, REINHARD, HERBERT, JAN, SCHEELE, MARTIN
Year of Publication 08.03.2007
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Year of Publication 08.03.2007
Patent