On the Scaling of Flash Cell Spacer for Gate Disturb and Charge Retention Optimization
Yung-Huei Lee, McMahon, W., Lu, Y.-L.R., Tewg, J.-Y.J., Ma, S.T.
Published in IEEE transactions on electron devices (01.09.2009)
Published in IEEE transactions on electron devices (01.09.2009)
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Journal Article
Reliability Tradeoffs and Scaling Issues of Read Drain Bias in nor Flash Memory
Yung-Huei Lee, McMahon, W., Lu, Y.-L.R., Freidin, Z.
Published in IEEE transactions on electron devices (01.09.2009)
Published in IEEE transactions on electron devices (01.09.2009)
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Journal Article
Origin of Initial Rapid Cell Current Reduction in Non-Volatile One-Time Programming Memory
Chun-Yu Wu, Meng-Chun Shih, Chih-Yang Chang, Wang, Wayne, Jen-Hao Lee, Yung-Huei Lee, Ting-Chen Hsu, Chun-Yao Ko
Published in IEEE electron device letters (01.02.2016)
Published in IEEE electron device letters (01.02.2016)
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Journal Article
RTS Noise Characterization in Flash Cells
Sing-Rong Li, McMahon, W., Lu, Y.-L.R., Yung-Huei Lee
Published in IEEE electron device letters (01.01.2008)
Published in IEEE electron device letters (01.01.2008)
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Journal Article
Time-zero-variability and BTI impact on advanced FinFET device and circuit reliability
Mukhopadhyay, Subhadeep, Lee, Yung-Huei, Lee, Jen-Hao
Published in Microelectronics and reliability (01.02.2018)
Published in Microelectronics and reliability (01.02.2018)
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Journal Article
Reliability aging and modeling of chip-package interaction on logic technologies featuring high-k metal gate planar and FinFET transistors
Jen-Hao Lee, Chen, Eliot S. H., Yung-Huei Lee, Chun-Hung Lin, Chun-Yu Wu, Ming-Han Hsieh, Huang, Kevin, Jhong-Sheng Wang, Yung-Sheng Tsai, Lu, Ryan, Jiaw-Ren Shih
Published in 2015 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2015)
Published in 2015 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2015)
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Conference Proceeding
Journal Article
Random Telegraph Noise Read Instability Characteristics in a Megabit RRAM Array
Wu, Chun-Yu, Kuo, Wen-Hsien, Wang, Wayne, Lee, Yung-Huei, Chu, Wen-Ting, Chang, Chih-Yang, Liao, Ta-Chuan
Published in IEEE electron device letters (01.11.2018)
Published in IEEE electron device letters (01.11.2018)
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Journal Article
Prediction of Logic Product Failure Due To Thin-Gate Oxide Breakdown
Yung-Huei Lee, Mielke, N., Agostinelli, M., Gupta, S., Lu, R., McMahon, W.
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.01.2006)
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.01.2006)
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Conference Proceeding
Industrially Applicable Read Disturb Model and Performance on Mega-Bit 28nm Embedded RRAM
Yang, Chang-Feng, Wu, Chun-Yu, Yang, Ming-Han, Wang, Wayne, Yang, Ming-Ta, Chien, Ta-Chun, Fan, Vincent, Tsai, Shih-Chi, Lee, Yung-Huei, Chu, Wen-Ting, Hung, Arthur
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)
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Conference Proceeding
A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates
Joshi, Kaustubh, Lee, Yung-Huei, Yao, Yu-Cheng, Chang, Shu-Wen, Bian, Siao-Syong, Liao, P. J., Shih, Jiaw-Ren, Chen, Min-Jan
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Robust Inductor Design for RF Circuits
Yin-Lung Ryan Lu, Yung-Huei Lee, McMahon, W.J., Tze-Ching Fung
Published in IEEE Custom Integrated Circuits Conference 2006 (01.09.2006)
Published in IEEE Custom Integrated Circuits Conference 2006 (01.09.2006)
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Conference Proceeding
Impact of external magnetic field on embedded perpendicular STT-MRAM technology qualified for solder reflow
Chia-Yu Wang, Meng-Chun Shih, Yung-Huei Lee, Wang, Wayne, Thomas, Luc, Yuan-Jen Lee, Huanlong Liu, Jian Zhu, Guenole Jan, Wang, Allen, Zhong, Tom, Po-Kang Wang, Lin, Derek, Chia-Hsiang Chen, Chih-Yang Chang, Chih-Hui Weng, Tien-Wei Chiang, Kuei-Hung Shen, Gallagher, William J., Chuang, Harry
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)
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Conference Proceeding
Reliability study of perpendicular STT-MRAM as emerging embedded memory qualified for reflow soldering at 260°C
Meng-Chun Shih, Chia-Yu Wang, Yung-Huei Lee, Wang, Wayne, Thomas, Luc, Huanlong Liu, Jian Zhu, Yuan-Jen Lee, Jan, Guenole, Yu-Jen Wang, Zhong, Tom, Torng, Terry, Po-Kang Wang, Lin, Derek, Tien-Wei Chiang, Kuei-Hung Shen, Chuang, Harry, Gallagher, William J.
Published in 2016 IEEE Symposium on VLSI Technology (01.06.2016)
Published in 2016 IEEE Symposium on VLSI Technology (01.06.2016)
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Conference Proceeding
Drain Read Disturb Assessment of NOR Flash Memory
Yung-Huei Lee, Mielke, N., McMahon, W., Lu, Y.-L.R., Qingru Meng, Linda Jiang
Published in 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (01.04.2008)
Published in 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (01.04.2008)
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Conference Proceeding
The Role of Shallow Trench Isolation on Channel Width Noise Scaling for Narrow Width CMOS and Flash Cells
Lu, Y.-L.R., Yu-Ching Liao, McMahon, W., Yung-Huei Lee, Kung, H., Fastow, R., Sean Ma
Published in 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (01.04.2008)
Published in 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (01.04.2008)
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Conference Proceeding
Effect of trench edge on pMOSFET reliability
Lee, Yung-Huei, Linton, Tom, Wu, Ken, Mielke, Neal
Published in Microelectronics and reliability (01.05.2001)
Published in Microelectronics and reliability (01.05.2001)
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Journal Article
SOFT ERROR RATE (SER) REDUCTION IN ADVANCED SILICON PROCESS
LEE JANG JUNG, GUI DONG, LEE YUNG HUEI, CHU WEI CHENG, TSAI CHOU JIE, WU CHIA FANG
Year of Publication 30.08.2012
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Year of Publication 30.08.2012
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