33.1 A 16nm 32Mb Embedded STT-MRAM with a 6ns Read-Access Time, a 1M-Cycle Write Endurance, 20-Year Retention at 150°C and MTJ-OTP Solutions for Magnetic Immunity
Lee, Po-Hao, Lee, Chia-Fu, Shih, Yi-Chun, Lin, Hon-Jarn, Chang, Yen-An, Lu, Cheng-Han, Chen, Yu-Lin, Lo, Chieh-Pu, Chen, Chung-Chieh, Kuo, Cheng-Hsiung, Chou, Tan-Li, Wang, Chia-Yu, Wu, J. J., Wang, Roger, Chuang, Harry, Wang, Yih, Chih, Yu-Der, Chang, Tsung-Yung Jonathan
Published in 2023 IEEE International Solid- State Circuits Conference (ISSCC) (19.02.2023)
Published in 2023 IEEE International Solid- State Circuits Conference (ISSCC) (19.02.2023)
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Conference Proceeding
Logic Process Compatible 40-nm 16-Mb, Embedded Perpendicular-MRAM With Hybrid-Resistance Reference, Sub- \mu A Sensing Resolution, and 17.5-nS Read Access Time
Shih, Yi-Chun, Lee, Chia-Fu, Chang, Yen-An, Lee, Po-Hao, Lin, Hon-Jarn, Chen, Yu-Lin, Lin, Ku-Feng, Yeh, Ta-Ching, Yu, Hung-Chang, Chuang, Harry H. L., Chih, Yu-Der, Chang, Jonathan
Published in IEEE journal of solid-state circuits (01.04.2019)
Published in IEEE journal of solid-state circuits (01.04.2019)
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Journal Article
Plasma Damage-Enhanced Negative Bias Temperature Instability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors
CHEN, Chih-Yang, LEE, Jam-Wem, CHEN, Wei-Cheng, LIN, Hsiao-Yi, YEH, Kuan-Lin, LEE, Po-Hao, WANG, Shen-De, LEI, Tan-Fu
Published in IEEE electron device letters (01.11.2006)
Published in IEEE electron device letters (01.11.2006)
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Journal Article
A Reliability Model for Low-Temperature Polycrystalline Silicon Thin-Film Transistors
CHEN, Chih-Yang, LEE, Jam-Wem, LEE, Po-Hao, CHEN, Wei-Cheng, LIN, Hsiao-Yi, YEH, Kuan-Lin, MA, Ming-Wen, WANG, Shen-De, LEI, Tan-Fu
Published in IEEE electron device letters (01.05.2007)
Published in IEEE electron device letters (01.05.2007)
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Journal Article
Dietary Flavonoids Luteolin and Quercetin Suppressed Cancer Stem Cell Properties and Metastatic Potential of Isolated Prostate Cancer Cells
Tsai, Pei-Hsun, Cheng, Chia-Hsiung, Lin, Chun-Yu, Huang, Ying-Tang, Lee, Lung-Ta, Kandaswami, Chithan C, Lin, Yo-Chuen, Lee, Kevin Po-Hao, Hung, Chin-Chun, Hwang, Jiuan-Jiuan, Ke, Ferng-Chun, Chang, Geen-Dong, Lee, Ming-Ting
Published in Anticancer research (01.12.2016)
Published in Anticancer research (01.12.2016)
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Journal Article
Logic Process Compatible 40NM 16MB, Embedded Perpendicular-MRAM with Hybrid-Resistance Reference, Sub-μA Sensing Resolution, and 17.5NS Read Access Time
Yi-Chun Shih, Chia-Fu Lee, Yen-An Chang, Po-Hao Lee, Hon-Jarn Lin, Yu-Lin Chen, Ku-Feng Lin, Ta-Ching Yeh, Hung-Chang Yu, Chuang, Harry, Yu-Der Chih, Chang, Jonathan
Published in 2018 IEEE Symposium on VLSI Circuits (01.06.2018)
Published in 2018 IEEE Symposium on VLSI Circuits (01.06.2018)
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Conference Proceeding
22nm STT-MRAM for Reflow and Automotive Uses with High Yield, Reliability, and Magnetic Immunity and with Performance and Shielding Options
Gallagher, W.J., Lee, George, Shih, Yi-Chun, Lee, Chia-Fu, Lee, Po-Hao, Wang, Roger, Shen, Kuei- Hung, Wu, J. J., Wang, Wayne, Chuang, Harry, Chien, Eric, Chiang, Tien-Wei, Huang, Jian-Cheng, Shih, Meng-Chun, Wang, C.Y., Weng, Chih-Hui, Chen, Sean, Bair, Christine
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)
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Conference Proceeding
A Reflow-capable, Embedded 8Mb STT-MRAM Macro with 9nS Read Access Time in 16nm FinFET Logic CMOS Process
Shih, Yi-Chun, Lee, Chia-Fu, Chang, Yen-An, Lee, Po-Hao, Lin, Hon-Jarn, Chen, Yu-Lin, Lo, Chieh-Pu, Lin, Ku-Feng, Chiang, Tien-Wei, Lee, Yuan-Jen, Shen, Kuei-Hung, Wang, Roger, Wang, Wayne, Chuang, Harry, Wang, Eric, Chih, Yu-Der, Chang, Jonathan
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
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Conference Proceeding
Logic Process Compatible 40-nm 16-Mb, Embedded Perpendicular-MRAM With Hybrid-Resistance Reference, Sub-[Formula Omitted] A Sensing Resolution, and 17.5-nS Read Access Time
Yi-Chun, Shih, Chia-Fu, Lee, Yen-An, Chang, Po-Hao, Lee, Lin, Hon-Jarn, Yu-Lin, Chen, Ku-Feng, Lin, Ta-Ching Yeh, Hung-Chang, Yu, Chuang, Harry H L, Yu-Der Chih, Chang, Jonathan
Published in IEEE journal of solid-state circuits (01.01.2019)
Published in IEEE journal of solid-state circuits (01.01.2019)
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Journal Article
13.3 A 22nm 32Mb Embedded STT-MRAM with 10ns Read Speed, 1M Cycle Write Endurance, 10 Years Retention at 150°C and High Immunity to Magnetic Field Interference
Chih, Yu-Der, Shih, Yi-Chun, Lee, Chia-Fu, Chang, Yen-An, Lee, Po-Hao, Lin, Hon-Jarn, Chen, Yu-Lin, Lo, Chieh-Pu, Shih, Meng-Chun, Shen, Kuei-Hung, Chuang, Harry, Chang, Tsung-Yung Jonathan
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
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Conference Proceeding
16.4 An 89TOPS/W and 16.3TOPS/mm2 All-Digital SRAM-Based Full-Precision Compute-In Memory Macro in 22nm for Machine-Learning Edge Applications
Chih, Yu-Der, Lee, Po-Hao, Fujiwara, Hidehiro, Shih, Yi-Chun, Lee, Chia-Fu, Naous, Rawan, Chen, Yu-Lin, Lo, Chieh-Pu, Lu, Cheng-Han, Mori, Haruki, Zhao, Wei-Chang, Sun, Dar, Sinangil, Mahmut E., Chen, Yen-Huei, Chou, Tan-Li, Akarvardar, Kerem, Liao, Hung-Jen, Wang, Yih, Chang, Meng-Fan, Chang, Tsung-Yung Jonathan
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
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Conference Proceeding