Effects of social network services (SNS) subjective norms on SNS addiction
Kim, Joon-ho, Kim, Goon-ju, Choi, Hyun-ju, Seok, Bong-ihn, Lee, Nam-hyun
Published in Journal of psychology in Africa (02.11.2019)
Published in Journal of psychology in Africa (02.11.2019)
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Journal Article
Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM
Lee, Nam-Hyun, Kim, Jongkyun, Son, Donghee, Kim, Kangjun, Seok, Jung Eun
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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Conference Proceeding
Method of estimating mechanical stress on Si body of MOSFET using drain-body junction current
Seo, Ji-Hoon, Kim, Gang-Jun, Son, Donghee, Lee, Nam-Hyun, Kang, Bongkoo
Published in Japanese Journal of Applied Physics (01.01.2017)
Published in Japanese Journal of Applied Physics (01.01.2017)
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Journal Article
Factors of regular sponsorship of African children: A cross-ethnic study
Kim, Jae-kyeong, Kwon, June-hyuk, Lee, Nam-hyun, Choi, Hyun-ju, Jung, Seung-hye, Lee, Hyuck-jin, Kim, Joon-ho
Published in Journal of psychology in Africa (02.11.2018)
Published in Journal of psychology in Africa (02.11.2018)
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Journal Article
Effect of dynamic stress on off leakage of small-dimension pMOSFETs at high temperature
Kim, Gang-Jun, Seo, Ji-Hoon, Son, Donghee, Lee, Nam-Hyun, Kang, YoungHa, Hwang, YuChul, Kang, Bongkoo
Published in Japanese Journal of Applied Physics (01.04.2014)
Published in Japanese Journal of Applied Physics (01.04.2014)
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Journal Article
Experimental Method to Extract Effective Channel Length of Nanoscale n-MOSFETs
LEE, Nam-Hyun, CHOI, Hwan-Wook, KANG, Heesung, KANG, Bongkoo
Published in IEEE electron device letters (01.11.2009)
Published in IEEE electron device letters (01.11.2009)
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Journal Article
Effect of DC/AC stress on the reliability of cell capacitor in DRAM
Kim, Gang-Jun, Lee, Nam-Hyun, Kim, Jongkyun, Seok, Jung Eun, Lee, Yunsung
Published in Microelectronics and reliability (01.09.2018)
Published in Microelectronics and reliability (01.09.2018)
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Journal Article
Effects of film thickness and Sn concentration on electrical properties of solution-processed zinc tin oxide thin film transistors
Kim, CheolGyu, Lee, Nam-Hyun, Kwon, Young-Kyu, Kang, Bongkoo
Published in Thin solid films (01.10.2013)
Published in Thin solid films (01.10.2013)
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Journal Article
Conference Proceeding
Channel width dependence of AC stress on bulk nMOSFETs
Son, Donghee, Kim, Gang-Jun, Seo, Ji-Hoon, Lee, Nam-Hyun, Kang, YongHa, Kang, Bongkoo
Published in Microelectronics and reliability (01.09.2016)
Published in Microelectronics and reliability (01.09.2016)
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Journal Article
Degradation of pMOSFETs due to hot electron induced punchthrough
Son, Donghee, Kim, Gang-Jun, Seo, Ji-Hoon, Lee, Nam-Hyun, Kang, YongHa, Kang, Bongkoo
Published in Microelectronics and reliability (01.04.2016)
Published in Microelectronics and reliability (01.04.2016)
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Journal Article
Vision-based motion planning for an autonomous motorcycle on ill-structured roads
Song, Dezhen, Lee, Hyun Nam, Yi, Jingang, Levandowski, Anthony
Published in Autonomous robots (01.10.2007)
Published in Autonomous robots (01.10.2007)
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Journal Article
The Effects of Dynamic Functional Electrical Stimulation With Treadmill Gait Training on Functional Ability, Balance Confidence and Gait in Chronic Stroke Patients
Cho, Young-Ki, Ahn, Jun-Su, Park, Yong-Wan, Do, Jung-Wha, Lee, Nam-Hyun, Kwon, Oh-Yun
Published in Han'guk Chŏnmun Mulli Ch'iryo Hakhoe chi = Journal of the Korean Academy of University Trained Physical Therapists (30.11.2014)
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Published in Han'guk Chŏnmun Mulli Ch'iryo Hakhoe chi = Journal of the Korean Academy of University Trained Physical Therapists (30.11.2014)
Journal Article