Generation of New Low-Complexity March Algorithms for Optimum Faults Detection in SRAM
Jidin, Aiman Zakwan, Hussin, Razaidi, Fook, Lee Weng, Mispan, Mohd Syafiq, Zakaria, Nor Azura, Ying, Loh Wan, Zamin, Norshuhani
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.08.2023)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.08.2023)
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Journal Article
Automatic generation of user-defined test algorithm description file for memory BIST implementation
Jidin, Aiman Zakwan, Hussin, Razaidi, Fook, Lee Weng, Mispan, Mohd Syafiq, Ying, Loh Wan
Published in International journal of reconfigurable and embedded systems (01.07.2022)
Published in International journal of reconfigurable and embedded systems (01.07.2022)
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Journal Article
Case Studies on Transition Fault Test Generation for At-speed Scan Testing
Zakaria, Nor Azura, Bautista, Edward V, Jusoh, Suhaimi Bahisham, Weng Fook Lee, Xiaoqing Wen
Published in 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (01.10.2010)
Published in 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (01.10.2010)
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Conference Proceeding
Modified March MSS for Unlinked Dynamic Faults Detection
Ying, Loh Wan, Hussin, Razaidi, Ahmad, Norhawati, Fook, Lee Weng, Jidin, Aiman Zakwan
Published in 2022 IEEE 20th Student Conference on Research and Development (SCOReD) (08.11.2022)
Published in 2022 IEEE 20th Student Conference on Research and Development (SCOReD) (08.11.2022)
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Conference Proceeding
An Automation Program for March Algorithm Fault Detection Analysis
Jidin, Aiman Zakwan, Hussin, Razaidi, Fook, Lee Weng, Mispan, Mohd Syafiq
Published in 2021 IEEE Asia Pacific Conference on Circuit and Systems (APCCAS) (22.11.2021)
Published in 2021 IEEE Asia Pacific Conference on Circuit and Systems (APCCAS) (22.11.2021)
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Conference Proceeding
Reduced March SR Algorithm for Deep-Submicron SRAM Testing
Jidin, Aiman Zakwan, Hussin, Razaidi, Mispan, Mohd Syafiq, Fook, Lee Weng, Ying, Loh Wan
Published in 2022 IEEE International Conference on Semiconductor Electronics (ICSE) (15.08.2022)
Published in 2022 IEEE International Conference on Semiconductor Electronics (ICSE) (15.08.2022)
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Conference Proceeding
METHOD FOR DUAL BIT MEMORY ERASE VERIFICATION
WONG, KEITH, H, BAUTISTA, EDWARD, V, CHEN, PAU-LING, LEE, WENG, FOOK, HAMILTON, DARLENE
Year of Publication 22.09.2010
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Year of Publication 22.09.2010
Patent