FadeNet: Deep Learning-Based mm-Wave Large-Scale Channel Fading Prediction and its Applications
Ratnam, Vishnu V., Chen, Hao, Pawar, Sameer, Zhang, Bingwen, Zhang, Charlie Jianzhong, Kim, Young-Jin, Lee, Soonyoung, Cho, Minsung, Yoon, Sung-Rok
Published in IEEE access (01.01.2021)
Published in IEEE access (01.01.2021)
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Journal Article
Study of Neutron Soft Error Rate (SER) Sensitivity: Investigation of Upset Mechanisms by Comparative Simulation of FinFET and Planar MOSFET SRAMs
Jinhyun Noh, Correas, Vincent, Soonyoung Lee, Jongsung Jeon, Nofal, Issam, Cerba, Jacques, Belhaddad, Hafnaoui, Alexandrescu, Dan, YoungKeun Lee, Kwon, Steve
Published in IEEE transactions on nuclear science (01.08.2015)
Published in IEEE transactions on nuclear science (01.08.2015)
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Journal Article
Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices
Soonyoung Lee, Ilgon Kim, Sungmock Ha, Cheong-sik Yu, Jinhyun Noh, Sangwoo Pae, Jongwoo Park
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
Memory Reliability Analysis for Multiple Block Effect of Soft Errors
Soonyoung Lee, Sang Hoon Jeon, Sanghyeon Baeg, Dongho Lee
Published in IEEE transactions on nuclear science (01.04.2013)
Published in IEEE transactions on nuclear science (01.04.2013)
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Journal Article
Investigation of logic circuit soft error rate (SER) in 14nm FinFET technology
Uemura, Taiki, Soonyoung Lee, Jongwoo Park, Sangwoo Pae, Haebum Lee
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
Published in 2016 IEEE International Reliability Physics Symposium (IRPS) (01.04.2016)
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Conference Proceeding
Memory Reliability Model for Accumulated and Clustered Soft Errors
Soonyoung Lee, Sanghyeon Baeg, Reviriego, P.
Published in IEEE transactions on nuclear science (01.10.2011)
Published in IEEE transactions on nuclear science (01.10.2011)
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Journal Article
Investigation of logic soft error and scaling effect in 10 nm FinFET technology
Uemura, Taiki, Soonyoung Lee, GunRae Kim, Sangwoo Pae
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
Soft error rate analysis for incident angle and N-well structure dependencies using small-sized alpha source in 10nm FinFET technology
Soonyoung Lee, Uemura, Taiki, Monga, Udit, Jae Hee Choi, GunRae Kim, Sangwoo Pae
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
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Conference Proceeding
Charge-collection modeling for SER simulation in FinFETs
Monga, Udit, Jaehee Choi, Jeon, Jongwook, Kwon, Uihui, Keun-Ho Lee, Seungjin Choo, Uemura, Taiki, Soonyoung Lee, Pae, Sangwoo
Published in 2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2016)
Published in 2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2016)
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Conference Proceeding
Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams
GeunYong Bak, Soonyoung Lee, Hosung Lee, KyungBae Park, Sanghyeon Baeg, ShiJie Wen, Wong, Richard, Slayman, Charlie
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
Memory reliability model for accumulated and clustered soft errors
Soonyoung Lee, Sanghyeon Baeg, Reviriego, Pedro
Published in 2010 IEEE International Integrated Reliability Workshop Final Report (01.10.2010)
Published in 2010 IEEE International Integrated Reliability Workshop Final Report (01.10.2010)
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Conference Proceeding
Soft Error Issues with Scaling Technologies
Sanghyeon Baeg, Jongsun Bae, Soonyoung Lee, Chul Seung Lim, Sang Hoon Jeon, Hyeonwoo Nam
Published in 2012 IEEE 21st Asian Test Symposium (01.11.2012)
Published in 2012 IEEE 21st Asian Test Symposium (01.11.2012)
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Conference Proceeding
Reliability characterization of 10nm FinFET technology with multi-VT gate stack for low power and high performance
Minjung Jin, Changze Liu, Jinju Kim, Jungin Kim, Hyewon Shim, Kangjung Kim, Gunrae Kim, Soonyoung Lee, Uemura, Taiki, Man Chang, Taehyun An, Junekyun Park, Sangwoo Pae
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)
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Conference Proceeding
L-Verse: Bidirectional Generation Between Image and Text
Kim, Taehoon, Song, Gwangmo, Lee, Sihaeng, Kim, Sangyun, Seo, Yewon, Lee, Soonyoung, Kim, Seung Hwan, Lee, Honglak, Bae, Kyunghoon
Published in 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (01.06.2022)
Published in 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (01.06.2022)
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Conference Proceeding
Enhanced Reliability of 7-nm Process Technology Featuring EUV
Choi, Kihyun, Shim, Hyewon, Park, Junekyun, Cho, Youngwoo, Rhee, Hwasung, Pae, Sangwoo, Sagong, Hyun Chul, Kang, Wonchang, Kim, Hyunjin, Hai, Jiang, Lee, Miji, Kim, Bomi, Lee, Mi-Ji, Lee, Soonyoung
Published in IEEE transactions on electron devices (01.12.2019)
Published in IEEE transactions on electron devices (01.12.2019)
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Journal Article