Application of the continuous no-reset switching iterative learning control on a novel optical scanning system
Yen, Jia-Yush, Yeh, Yea-Chin, Peng, Yung-Hao, Lee, Jyh-Fa
Published in Mechatronics (Oxford) (01.02.2009)
Published in Mechatronics (Oxford) (01.02.2009)
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Journal Article
Design for control of a flexure jointed optical servo scanning platform
Yea-Chin Yeh, Jia-Yush Yen, Yung-Hao Peng, Jyh-Fa Lee
Published in IEEE International Conference on Mechatronics, 2005. ICM '05 (2005)
Published in IEEE International Conference on Mechatronics, 2005. ICM '05 (2005)
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Conference Proceeding
Measurement method of three-dimensional profiles and reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on single display
Lin, Chern-Sheng, Lee, Jyh-Fa, Yeh, Mau-Shiun, Lin, Chia-Hau, Ku, Shih-Liang
Year of Publication 06.01.2009
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Year of Publication 06.01.2009
Patent
Measurement method of three-dimensional profiles and reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on single display
KU SHIH-LIANG, YEH MAU-SHIUN, LIN CHIA-HAU, LIN CHERN-SHENG, LEE JYH-FA
Year of Publication 06.01.2009
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Year of Publication 06.01.2009
Patent
Measurement method of three-dimentional profiles and reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on single display
KU SHIH-LIANG, YEH MAU-SHIUN, LIN CHIA-HAU, LIN CHERN-SHENG, LEE JYH-FA
Year of Publication 13.03.2008
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Year of Publication 13.03.2008
Patent
Method with the three dimensional outline measuring and the system of reconstruction which has a sub-pixel positing of coloring optical gratings and single monitor with main and sub-frame switching
YEH, MAU-SHIUN, KU, SHIH-LIANG, LIN, CHIA-HAU, LEE, JYH-FA, LIN, CHERN-SHENG
Year of Publication 01.10.2007
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Year of Publication 01.10.2007
Patent
TWI315393B
CHANG, WEI CHENG, LIN, CHIA HAU, CHOU, YUNG FANG, LEE, JYH FA, YEH, MAU SHIUN, LIN, CHERN SHENG
Year of Publication 01.10.2009
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Year of Publication 01.10.2009
Patent
TWI308636B
KUO, JUNG, CHAO, CHEN FU, LEE, JYH FA, YEH, MAU SHIUN, LIN, CHERN SHENG
Year of Publication 11.04.2009
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Year of Publication 11.04.2009
Patent
TWI328110B
HUANG, KUO CHI, WU, KUO CHUN, LEE, JYH FA, YEH, MAU SHIUN, CHANG, SU CHI, LIN, CHERN SHENG
Year of Publication 01.08.2010
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Year of Publication 01.08.2010
Patent
Automatic measurement system and measurement method for spherical aberration
KUO, JUNG, YEH, MAU-SHIUN, LEE, JYH-FA, CHAO, CHEN-FU, LIN, CHERN-SHENG
Year of Publication 16.03.2008
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Year of Publication 16.03.2008
Patent
Method with the three dimensional outline measuring and the system of reconstruction which has a sub-pixel positing of coloring optical gratings and single monitor with main and sub-frame switching
YEH, MAU-SHIUN, KU, SHIH-LIANG, LIN, CHIA-HAU, LEE, JYH-FA, LIN, CHERN-SHENG
Year of Publication 16.03.2008
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Year of Publication 16.03.2008
Patent