A Study of High-Voltage p-Type MOSFET Degradation Under AC Stress
Lee, Dongjun, Lee, Chiwoo, Lee, Changsub, Hur, Sunghoi, Song, Duheon, Choi, Junghyuk, Choi, Byoungdeog
Published in IEEE transactions on electron devices (01.09.2015)
Published in IEEE transactions on electron devices (01.09.2015)
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Journal Article
Abstract 5963: VGLL1-derived peptides demonstrated anticancer effect by inhibiting VGLL1-TEAD4 interaction
Ock, Sangmi, Lee, Changsub, Jung, Wongi, Whang, Ina, Kim, Kyung-Soo, Han, Jongmin, Yim, Sujin, Kim, Bo-Kyung, Lee, Hong-Sub, Chang, Kwan-Young, Won, Misun
Published in Cancer research (Chicago, Ill.) (22.03.2024)
Published in Cancer research (Chicago, Ill.) (22.03.2024)
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Journal Article
A new approach for trap analysis of vertical NAND flash cell using RTN characteristics
Daewoong Kang, Changsub Lee, Sunghoi Hur, Duheon Song, Jeong-Hyuk Choi
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
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Conference Proceeding
3 Three dimension semiconductor memory device
LEE CHANGSUB, LEE JUNG HOON, JANG WOOJAE, PARK SEJUN, KANG JIN KYU, LEE JAEDUK
Year of Publication 21.10.2020
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Year of Publication 21.10.2020
Patent
Program Disturb Phenomenon by DIBL in MLC NAND Flash Device
Dongyean Oh, Seungchul Lee, Changsub Lee, Jaihyuk Song, Woonkyung Lee, Jeonghyuk Choi
Published in 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design (01.05.2008)
Published in 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design (01.05.2008)
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Conference Proceeding
A New Self-Boosting Phenomenon by Soure/Drain Depletion Cut-off in NAND Flash Memory
Dongyean Oh, Changsub Lee, Seungchul Lee, Tae-Kyung Kim, Jaihyuk Song, Jeonghyuk Choi
Published in 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop (01.08.2007)
Published in 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop (01.08.2007)
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Conference Proceeding
New Cell Structure with Edge-thick Tunnel Oxide for Highly Reliable NAND Flash Memory Devices
Tae-Kyung Kim, Jaihyuk Song, Changsub Lee, Dongyean Oh, Taeseok Jang, Jongkwang Lim, Dongjun Lee, Seungjun Lee, Minhwan Lim, Hyunyoung Shim, Bongtae Park, Man-Ki Lee, Hunkook Lee
Published in 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop (2006)
Published in 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop (2006)
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Conference Proceeding
Improvement of Hot Hole-Induced Degradation in HV Pmosfets
Lee, Dongjun, Lee, Changsub, Song, Duheon, Choi, Byoung-deog
Published in Meeting abstracts (Electrochemical Society) (01.09.2016)
Published in Meeting abstracts (Electrochemical Society) (01.09.2016)
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Journal Article
Three-dimensional semiconductor memory device
Lee, Jung Hoon, Kang, Jin-Kyu, Jang, Woojae, Park, Sejun, Lee, Jaeduk, Lee, Changsub
Year of Publication 22.02.2022
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Year of Publication 22.02.2022
Patent
THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE
PARK, SEJUN, LEE, CHANGSUB, KANG, JIN-KYU, LEE, JAEDUK, LEE, JUNG HOON, JANG, WOOJAE
Year of Publication 15.10.2020
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Year of Publication 15.10.2020
Patent
Semiconductor device
Kang Daewoong, Lee Changsub, Kim Dae Sin, Lim Seunghyun, Son Homin, Hur Sunghoi, Seol Kwang Soo, Kim Nambin
Year of Publication 28.11.2017
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Year of Publication 28.11.2017
Patent