Film-thickness-dependent conduction in ordered Si quantum dot arrays
Surana, K, Lepage, H, Lebrun, J M, Doisneau, B, Bellet, D, Vandroux, L, Le Carval, G, Baudrit, M, Thony, P, Mur, P
Published in Nanotechnology (16.03.2012)
Published in Nanotechnology (16.03.2012)
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Journal Article
Static and Dynamic TCAD Analysis of IMOS Performance: From the Single Device to the Circuit
Mayer, F., Le Royer, C., Le Carval, G., Clavelier, L., Deleonibus, S.
Published in IEEE transactions on electron devices (01.08.2006)
Published in IEEE transactions on electron devices (01.08.2006)
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Journal Article
High- \kappa and Metal-Gate pMOSFETs on GeOI Obtained by Ge Enrichment: Analysis of ON and OFF Performances
Le Royer, C., Vincent, B., Clavelier, L., Damlencourt, J.-F., Tabone, C., Batude, P., Blachier, D., Truche, R., Campidelli, Y., Nguyen, Q.T., Cristoloveanu, S., Soliveres, S., Le Carval, G., Boulanger, F., Billon, T., Bensahel, D., Deleonibus, S.
Published in IEEE electron device letters (01.06.2008)
Published in IEEE electron device letters (01.06.2008)
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Journal Article
A physics-based compact model for Fully-Depleted Tunnel Field Effect Transistor
Martinie, S., Rozeau, O., Le Royer, C., Lacord, J., Jaud, M.-A, Poiroux, T., Le Carval, G., Barbe, J.-C
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)
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Conference Proceeding
Journal Article
An in-depth analysis of the 'Elymat' technique for characterizing metallic microcontamination in silicon: Experimental validation for iron contamination in p-type wafers
Walz, D, Carval, G Le, Joly, J -P, Kamarinos, G
Published in Semiconductor science and technology (01.07.1995)
Published in Semiconductor science and technology (01.07.1995)
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Journal Article
Towards silicon nanocrystals based solar cells: Morphological properties and conduction phenomena
Surana, K, Lepage, H, Bellet, D, Le Carval, G, Baudrit, M, Thony, P, Mur, P
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
Published in 2010 35th IEEE Photovoltaic Specialists Conference (01.06.2010)
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Conference Proceeding
Experimental determination of the channel backscattering coefficient on 10–70nm-metal-gate Double-Gate transistors
Barral, Vincent, Poiroux, T., Vinet, M., Widiez, J., Previtali, B., Grosgeorges, P., Le Carval, G., Barraud, S., Autran, J.L., Munteanu, D., Deleonibus, S.
Published in Solid-state electronics (01.04.2007)
Published in Solid-state electronics (01.04.2007)
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Journal Article
Pearson versus gaussian effective potentials for quantum-corrected Monte-Carlo simulation
Jaud, M.-A., Barraud, S., Dollfus, P., Jaouen, H., Le Carval, G.
Published in Journal of computational electronics (01.09.2007)
Published in Journal of computational electronics (01.09.2007)
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Journal Article
105 nm Gate length pMOSFETs with high-K and metal gate fabricated in a Si process line on 200 mm GeOI wafers
LE RAYER, C, CLAVELIER, L, LE CARVAL, G, TRUCHE, R, POUYDEBASQUE, A, VINET, M, DELEONIBUS, S, TABONE, C, ROMANJEK, K, DEGUET, C, SANCHEZ, L, HARTMANN, J.-M, ROURE, M.-C, GRAMPEIX, H, SOLIVERES, S
Published in Solid-state electronics (01.09.2008)
Published in Solid-state electronics (01.09.2008)
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Conference Proceeding
A new memory concept: the nano-multiple-tunnel-junction memory with embedded Si nano-crystals
Deleruyelle, D, Le Royer, C, DeSalvo, B, Le Carval, G, Gely, M, Baron, T, Autran, J.L, Deleonibus, S
Published in Microelectronic engineering (01.04.2004)
Published in Microelectronic engineering (01.04.2004)
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Conference Proceeding
Experimental and TCAD Investigation of the Two Components of the Impact Ionization MOSFET (IMOS) Switching
Mayer, F., Le Royer, C., Le Carval, G., Clavelier, L., Deleonibus, S.
Published in IEEE electron device letters (01.07.2007)
Published in IEEE electron device letters (01.07.2007)
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Journal Article
Experimental and theoretical understanding of Forming, SET and RESET operations in Conductive Bridge RAM (CBRAM) for memory stack optimization
Guy, J., Molas, G., Blaise, P., Carabasse, C., Bernard, M., Roule, A., Le Carval, G., Sousa, V., Grampeix, H., Delaye, V., Toffoli, A., Cluzel, J., Brianceau, P., Pollet, O., Balan, V., Barraud, S., Cueto, O., Ghibaudo, G., Clermidy, F., De Salvo, B., Perniola, L.
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
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Conference Proceeding