Dielectric breakdown in HfO2 dielectrics: Using multiscale modeling to identify the critical physical processes involved in oxide degradation
Strand, Jack, La Torraca, Paolo, Padovani, Andrea, Larcher, Luca, Shluger, Alexander L.
Published in Journal of applied physics (21.06.2022)
Published in Journal of applied physics (21.06.2022)
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Journal Article
Physical Mechanisms behind the Field-Cycling Behavior of HfO2-Based Ferroelectric Capacitors
Pešić, Milan, Fengler, Franz Paul Gustav, Larcher, Luca, Padovani, Andrea, Schenk, Tony, Grimley, Everett D., Sang, Xiahan, LeBeau, James M., Slesazeck, Stefan, Schroeder, Uwe, Mikolajick, Thomas
Published in Advanced functional materials (05.07.2016)
Published in Advanced functional materials (05.07.2016)
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Journal Article
Charge Transport and Degradation in HfO2 and HfOx Dielectrics
Padovani, Andrea, Larcher, Luca, Bersuker, Gennadi, Pavan, Paolo
Published in IEEE electron device letters (01.05.2013)
Published in IEEE electron device letters (01.05.2013)
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Journal Article
Recommended Methods to Study Resistive Switching Devices
Lanza, Mario, Wong, H.‐S. Philip, Pop, Eric, Ielmini, Daniele, Strukov, Dimitri, Regan, Brian C., Larcher, Luca, Villena, Marco A., Yang, J. Joshua, Goux, Ludovic, Belmonte, Attilio, Yang, Yuchao, Puglisi, Francesco M., Kang, Jinfeng, Magyari‐Köpe, Blanka, Yalon, Eilam, Kenyon, Anthony, Buckwell, Mark, Mehonic, Adnan, Shluger, Alexander, Li, Haitong, Hou, Tuo‐Hung, Hudec, Boris, Akinwande, Deji, Ge, Ruijing, Ambrogio, Stefano, Roldan, Juan B., Miranda, Enrique, Suñe, Jordi, Pey, Kin Leong, Wu, Xing, Raghavan, Nagarajan, Wu, Ernest, Lu, Wei D., Navarro, Gabriele, Zhang, Weidong, Wu, Huaqiang, Li, Runwei, Holleitner, Alexander, Wurstbauer, Ursula, Lemme, Max C., Liu, Ming, Long, Shibing, Liu, Qi, Lv, Hangbing, Padovani, Andrea, Pavan, Paolo, Valov, Ilia, Jing, Xu, Han, Tingting, Zhu, Kaichen, Chen, Shaochuan, Hui, Fei, Shi, Yuanyuan
Published in Advanced electronic materials (01.01.2019)
Published in Advanced electronic materials (01.01.2019)
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Journal Article
A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis
Larcher, Luca, Puglisi, Francesco Maria, Pavan, Paolo, Padovani, Andrea, Vandelli, Luca, Bersuker, Gennadi
Published in IEEE transactions on electron devices (01.08.2014)
Published in IEEE transactions on electron devices (01.08.2014)
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Journal Article
Multiscale Modeling for Application-Oriented Optimization of Resistive Random-Access Memory
La Torraca, Paolo, Puglisi, Francesco Maria, Padovani, Andrea, Larcher, Luca
Published in Materials (23.10.2019)
Published in Materials (23.10.2019)
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Journal Article
"Velcro-type" crackles predict specific radiologic features of fibrotic interstitial lung disease
Sgalla, Giacomo, Walsh, Simon L F, Sverzellati, Nicola, Fletcher, Sophie, Cerri, Stefania, Dimitrov, Borislav, Nikolic, Dragana, Barney, Anna, Pancaldi, Fabrizio, Larcher, Luca, Luppi, Fabrizio, Jones, Mark G, Davies, Donna, Richeldi, Luca
Published in BMC pulmonary medicine (18.06.2018)
Published in BMC pulmonary medicine (18.06.2018)
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Journal Article
Understanding Current Instabilities in Conductive Atomic Force Microscopy
Jiang, Lanlan, Weber, Jonas, Puglisi, Francesco Maria, Pavan, Paolo, Larcher, Luca, Frammelsberger, Werner, Benstetter, Guenther, Lanza, Mario
Published in Materials (01.02.2019)
Published in Materials (01.02.2019)
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Journal Article
A Charge-Trapping Model for the Fast Component of Positive Bias Temperature Instability (PBTI) in High- \kappa Gate-Stacks
Vandelli, Luca, Larcher, Luca, Veksler, Dmitry, Padovani, Andrea, Bersuker, Gennadi, Matthews, Kenneth
Published in IEEE transactions on electron devices (01.07.2014)
Published in IEEE transactions on electron devices (01.07.2014)
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Journal Article
Built-In Bias Generation in Anti-Ferroelectric Stacks: Methods and Device Applications
Pesic, Milan, Larcher, Luca, Mikolajick, Thomas, Li, Taide, Di Lecce, Valerio, Hoffmann, Michael, Materano, Monica, Richter, Claudia, Max, Benjamin, Slesazeck, Stefan, Schroeder, Uwe
Published in IEEE journal of the Electron Devices Society (01.01.2018)
Published in IEEE journal of the Electron Devices Society (01.01.2018)
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Journal Article
Device‐to‐Materials Pathway for Electron Traps Detection in Amorphous GeSe‐Based Selectors
Slassi, Amine, Medondjio, Linda‐Sheila, Padovani, Andrea, Tavanti, Francesco, He, Xu, Clima, Sergiu, Garbin, Daniele, Kaczer, Ben, Larcher, Luca, Ordejón, Pablo, Calzolari, Arrigo
Published in Advanced electronic materials (01.04.2023)
Published in Advanced electronic materials (01.04.2023)
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Journal Article
Investigation of I-V Linearity in TaOx-Based RRAM Devices for Neuromorphic Applications
Sung, Changhyuck, Padovani, Andrea, Beltrando, Bastien, Lee, Donguk, Kwak, Myunghoon, Lim, Seokjae, Larcher, Luca, Della Marca, Vincenzo, Hwang, Hyunsang
Published in IEEE journal of the Electron Devices Society (2019)
Published in IEEE journal of the Electron Devices Society (2019)
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Journal Article
Charge trapping in alumina and its impact on the operation of metal-alumina-nitride-oxide-silicon memories: Experiments and simulations
Padovani, Andrea, Larcher, Luca, Della Marca, Vincenzo, Pavan, Paolo, Park, Hokyung, Bersuker, Gennadi
Published in Journal of applied physics (01.07.2011)
Published in Journal of applied physics (01.07.2011)
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Journal Article
A Comprehensive Understanding of the Erase of TANOS Memories Through Charge Separation Experiments and Simulations
Padovani, A., Arreghini, A., Vandelli, L., Larcher, L., Van den bosch, G., Pavan, P., Van Houdt, J.
Published in IEEE transactions on electron devices (01.09.2011)
Published in IEEE transactions on electron devices (01.09.2011)
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Journal Article
On the Frequency Response of Nanostructured Thermoacoustic Loudspeakers
Torraca, Paolo La, Bobinger, Marco, Servadio, Maurizio, Pavan, Paolo, Becherer, Markus, Lugli, Paolo, Larcher, Luca
Published in Nanomaterials (Basel, Switzerland) (14.10.2018)
Published in Nanomaterials (Basel, Switzerland) (14.10.2018)
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Journal Article
Extraction of interface and border traps in beyond-Si devices by accounting for generation and recombination in the semiconductor
Sereni, Gabriele, Larcher, Luca
Published in 2015 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2015)
Published in 2015 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2015)
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