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Year of Publication 01.05.2008
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Year of Publication 01.05.2008
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Semiconductor structure and method of manufacture
KIM SEONG-DONG, LIU XUEFENG, COOLBAUGH DOUGLAS D, LANZEROTTI LOUIS D, RASSEL ROBERT M, JOSEPH ALVIN J
Year of Publication 12.02.2008
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Year of Publication 12.02.2008
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Semiconductor structure and method of manufacture
Coolbaugh, Douglas D, Joseph, Alvin J, Kim, Seong-dong, Lanzerotti, Louis D, Liu, Xuefeng, Rassel, Robert M
Year of Publication 12.02.2008
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Year of Publication 12.02.2008
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Varied impurity profile region formation for varying breakdown voltage of devices
SHERIDAN DAVID C, ST. ONGE STEPHEN A, ORNER BRADLEY A, COOLBAUGH DOUGLAS D, LANZEROTTI LOUIS D, RASCOE JAY S
Year of Publication 23.06.2009
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Year of Publication 23.06.2009
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SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURE
KIM SEONG-DONG, LIU XUEFENG, COOLBAUGH DOUGLAS D, LANZEROTTI LOUIS D, RASSEL ROBERT M, JOSEPH ALVIN J
Year of Publication 03.05.2007
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Year of Publication 03.05.2007
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Incorporation of carbon in silicon/silicon germanium epitaxial layer to enhance yield for Si-Ge bipolar technology
Chu, Jack Oon, Coolbaugh, Douglas Duane, Dunn, James Stuart, Greenberg, David R, Harame, David L, Jagannathan, Basanth, Johnson, Robb Allen, Lanzerotti, Louis D, Schonenberg, Kathryn Turner, Wuthrich, Ryan Wayne
Year of Publication 11.05.2010
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Year of Publication 11.05.2010
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Incorporation of carbon in silicon/silicon germanium epitaxial layer to enhance yield for Si-Ge bipolar technology
CHU JACK OON, HARAME DAVID L, DUNN JAMES STUART, LANZEROTTI LOUIS D, SCHONENBERG KATHRYN TURNER, JOHNSON ROBB ALLEN, COOLBAUGH DOUGLAS DUANE, WUTHRICH RYAN WAYNE, GREENBERG DAVID R, JAGANNATHAN BASANTH
Year of Publication 11.05.2010
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Year of Publication 11.05.2010
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Strained Fin FETs structure and method
Clark, William F, Fried, David M, Lanzerotti, Louis D, Nowak, Edward J
Year of Publication 01.02.2005
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Year of Publication 01.02.2005
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STRAINED FIN FETS STRUCTURE AND METHOD
FRIED, DAVID, M, NOWAK, EDWARD, J, CLARK, WILLIAM, F, LANZEROTTI, LOUIS, D
Year of Publication 22.12.2004
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Year of Publication 22.12.2004
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Strained fin FETs structure and method
Clark, William F, Fried, David M, Lanzerotti, Louis D, Nowak, Edward J
Year of Publication 27.07.2004
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Year of Publication 27.07.2004
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VARIED IMPURITY PROFILE REGION FORMATION FOR VARYING BREAKDOWN VOLTAGE OF DEVICES
SHERIDAN DAVID C, ST. ONGE STEPHEN A, ORNER BRADLEY A, COOLBAUGH DOUGLAS D, LANZEROTTI LOUIS D, RASCOE JAY S
Year of Publication 29.11.2007
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Year of Publication 29.11.2007
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Strained fin FETs structure and method
LANZEROTTI, LOUIS D, CLARK, WILLIAM F, NOWAK, EDWARD J, FRIED, DAVID M
Year of Publication 21.03.2004
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Year of Publication 21.03.2004
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