Function-based ATPG for Path Delay Faults using the Launch-Off-Capture Scan Architecture
Flanigan, E., Adapa, R., Hailong Cui, Laisne, M., Tragoudas, S., Petrov, T.
Published in 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) (01.01.2007)
Published in 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) (01.01.2007)
Get full text
Conference Proceeding
Industrial Application of IJTAG Standards to the Test of Big-A/little-d devices
Staudt, Hans Martin von, Benhebibi, Mohamed Anas, Rearick, Jeff, Laisne, Michael
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Published in 2020 IEEE International Test Conference (ITC) (01.11.2020)
Get full text
Conference Proceeding
IEEE P1687.1: Extending the Network Boundaries for Test
Laisne, Michael, Crouch, Alfred, Portolan, Michele, Keim, Martin, Von Staudt, Hans Martin, Van Treuren, Bradford G., Rearick, Jeff, Zuo, Songlin
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
Published in 2022 IEEE International Test Conference (ITC) (01.09.2022)
Get full text
Conference Proceeding
Single-pin test control for Big A, little D devices
Laisne, Michael, von Staudt, Hans Martin, Bhalerao, Sourabh, Eason, Mark
Published in 2017 IEEE International Test Conference (ITC) (01.10.2017)
Published in 2017 IEEE International Test Conference (ITC) (01.10.2017)
Get full text
Conference Proceeding
Function-Based Test Generation for (Non-Robust) Path Delay Faults Using the Launch-off-Capture Scan Architecture
Adapa, R., Flanigan, E., Tragoudas, S., Laisne, M., Hailong Cui, Petrov, T.
Published in 8th International Symposium on Quality Electronic Design (ISQED'07) (01.03.2007)
Published in 8th International Symposium on Quality Electronic Design (ISQED'07) (01.03.2007)
Get full text
Conference Proceeding
Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study
Drmanac, Dragoljub, Laisne, M., Wang, Li C.
Published in 2011 IEEE International Test Conference (01.09.2011)
Published in 2011 IEEE International Test Conference (01.09.2011)
Get full text
Conference Proceeding