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Year of Publication 23.11.2023
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Year of Publication 16.08.2023
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SYSTEM FOR AUTOMATIC DIAGNOSTICS AND MONITORING OF SEMICONDUCTOR DEFECT DIE SCREENING PERFORMANCE THROUGH CORRELATION OF DEFECT AND ELECTRICAL TEST DATA
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Year of Publication 19.06.2024
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SYSTEM FOR AUTOMATIC DIAGNOSTICS AND MONITORING OF SEMICONDUCTOR DEFECT DIE SCREENING PERFORMANCE THROUGH CORRELATION OF DEFECT AND ELECTRICAL TEST DATA
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Year of Publication 03.08.2023
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Year of Publication 03.08.2023
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IMAGING REFLECTOMETRY FOR INLINE SCREENING
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Year of Publication 06.12.2023
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Year of Publication 06.12.2023
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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
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Year of Publication 27.09.2023
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Year of Publication 27.09.2023
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IMAGING REFLECTOMETRY FOR INLINE SCREENING
Groos, Thomas, Rathert, Robert J, Donzella, Oreste, Lach, Justin, Price, David W, Robinson, John Charles, Lenox, Chet V, Pandev, Stilian, Von Den Hoff, Mike, Saville, Barry, Li, Shifang
Year of Publication 29.09.2022
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Year of Publication 29.09.2022
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SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
LENOX, Chet, VON DEN HOFF, Mike, LIM, Teng, DONZELLA, Oreste, ROBINSON, John, RATHERT, Robert, GROOS, Thomas, NARASIMHAN, Narayani, PRICE, David, LACH, Justin, SHERMAN, Kara, SAVILLE, Barry
Year of Publication 23.06.2022
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Year of Publication 23.06.2022
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IMAGING REFLECTOMETRY FOR INLINE SCREENING
VON DEN HOFF, Mike, PRICE, David W, DONZELLA, Oreste, GROOS, Thomas, ROBINSON, John Charles, LENOX, Chet V, LACH, Justin, PANDEV, Stilian, SAVILLE, Barry, LI, Shifang, RATHERT, Robert J
Year of Publication 29.09.2022
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Year of Publication 29.09.2022
Patent
SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
Robinson, John, Groos, Thomas, Lim, Teng Song, Rathert, Robert J, Donzella, Oreste, Lach, Justin, Price, David W, Sherman, Kara L, Lenox, Chet V, Narasimhan, Narayani, Von Den Hoff, Mike, Saville, Barry
Year of Publication 23.06.2022
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Year of Publication 23.06.2022
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System for automatic diagnostics and monitoring of semiconductor defect die screening performance through correlation of defect and electrical test data
LENOX, CHET V, RATHERT, ROBERT J, PRICE, DAVID W, DONZELLA, ORESTE, ROBINSON, JOHN, LACH, JUSTIN
Year of Publication 01.08.2023
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Year of Publication 01.08.2023
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Imaging reflectometry for inline screening
SAVILLE, BARRY, LENOX, CHET V, RATHERT, ROBERT J, VON DEN HOFF, MIKE, LI, SHIFANG, PRICE, DAVID W, PANDEV, STILIAN, DONZELLA, ORESTE, LACH, JUSTIN, GROOS, THOMAS, ROBINSON, JOHN CHARLES
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Year of Publication 16.01.2023
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System and method for automatically identifying defect-based test coverage gaps in semiconductor devices
LENOX, CHET V, NARASIMHAN, NARAYANI, SAVILLE, BARRY, RATHERT, ROBERT J, VON DEN HOFF, MIKE, SHERMAN, KARA L, PRICE, DAVID W, LIM, TENG SONG, DONZELLA, ORESTE, ROBINSON, JOHN, GROOS, THOMAS, LACH, JUSTIN
Year of Publication 01.11.2022
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Year of Publication 01.11.2022
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