Evolution of NAND Flash Memory: From 2D to 3D as a Storage Market Leader
Hyunsuk Kim, Su-Jin Ahn, Yu Gyun Shin, Kyupil Lee, Eunseung Jung
Published in 2017 IEEE International Memory Workshop (IMW) (01.05.2017)
Published in 2017 IEEE International Memory Workshop (IMW) (01.05.2017)
Get full text
Conference Proceeding
Reliable strain measurement in transistor arrays by robust scanning transmission electron microscopy
Kim, Suhyun, Kim, Joong Jung, Jung, Younheum, Lee, Kyungwoo, Byun, Gwangsun, Hwang, KyoungHwan, Lee, Sunyoung, Lee, Kyupil
Published in AIP advances (01.09.2013)
Published in AIP advances (01.09.2013)
Get full text
Journal Article
A new ruler on the storage market: 3D-NAND flash for high-density memory and its technology evolutions and challenges on the future
Jaeduk Lee, Jaehoon Jang, Junhee Lim, Yu Gyun Shin, Kyupil Lee, Eunseung Jung
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)
Published in 2016 IEEE International Electron Devices Meeting (IEDM) (01.12.2016)
Get full text
Conference Proceeding
O-band DFB laser heterogeneously integrated on a bulk-silicon platform
Shin, Dongjae, Cha, Jungho, Kim, Sunggu, Shin, Yongwhak, Cho, Kwansik, Ha, Kyoungho, Jeong, Gitae, Hong, Hyeongsun, Lee, Kyupil, Kang, Ho-Kyu
Published in Optics express (28.05.2018)
Published in Optics express (28.05.2018)
Get full text
Journal Article
2.45 e-RMS Low-Random-Noise, 598.5 mW Low-Power, and 1.2 kfps High-Speed 2-Mp Global Shutter CMOS Image Sensor With Pixel-Level ADC and Memory
Seo, Min-Woong, Chu, Myunglae, Jung, Hyun-Yong, Kim, Suksan, Song, Jiyoun, Bae, Daehee, Lee, Sanggwon, Lee, Junan, Kim, Sung-Yong, Lee, Jongyeon, Kim, Minkyung, Lee, Gwi-Deok, Shim, Heesung, Um, Changyong, Kim, Changhwa, Baek, In-Gyu, Kwon, Doowon, Kim, Hongki, Choi, Hyuksoon, Go, Jonghyun, Ahn, Jungchak, Lee, Jae-Kyu, Moon, Chang-Rok, Lee, Kyupil, Kim, Hyoung-Sub
Published in IEEE journal of solid-state circuits (01.04.2022)
Published in IEEE journal of solid-state circuits (01.04.2022)
Get full text
Journal Article
The improvement of HEIP immunity using STI engineering at DRAM
Han, Seunguk, Lee, Youngyoun, Kim, Yongdoo, Park, Jemin, Lim, Junhee, Yamada, Satoru, Hong, Hyeongsun, Lee, Kyupil, Jin, Gyoyoung, Jung, Eunseung
Published in Microelectronics and reliability (01.09.2017)
Published in Microelectronics and reliability (01.09.2017)
Get full text
Journal Article
In-Depth Analysis of NBTI at 2X nm Node DRAM
Seunguk Han, Sungsam Lee, Sungkweon Baek, Sungho Jang, Wonchang Jeong, Kijae Huh, Moonyoung Jeong, Junhee Lim, Yamada, Satoru, Hyeongsun Hong, Kyupil Lee, Gyoyoung Jin, Eunseung Jung
Published in 2016 IEEE 8th International Memory Workshop (IMW) (01.05.2016)
Published in 2016 IEEE 8th International Memory Workshop (IMW) (01.05.2016)
Get full text
Conference Proceeding
A 2.6 e-rms Low-Random-Noise, 116.2 mW Low-Power 2-Mp Global Shutter CMOS Image Sensor with Pixel-Level ADC and In-Pixel Memory
Seo, Min-Woong, Chu, Myunglae, Jung, Hyun-Yong, Kim, Suksan, Song, Jiyoun, Lee, Junan, Kim, Sung-Yong, Lee, Jongyeon, Byun, Sung-Jae, Bae, Daehee, Kim, Minkyung, Lee, Gwi-Deok, Shim, Heesung, Um, Changyong, Kim, Changhwa, Baek, In-Gyu, Kwon, Doowon, Kim, Hongki, Choi, Hyuksoon, Go, Jonghyun, Ahn, JungChak, Lee, Jaekyu, Moon, Changrok, Lee, Kyupil, Kim, Hyoung-Sub
Published in 2021 Symposium on VLSI Technology (13.06.2021)
Get full text
Published in 2021 Symposium on VLSI Technology (13.06.2021)
Conference Proceeding
TRPV5 gene polymorphisms in renal hypercalciuria
Renkema, Kirsten Y., Lee, Kyupil, Topala, Catalin N., Goossens, Monique, Houillier, Pascal, Bindels, René J., Hoenderop, Joost G.
Published in Nephrology, dialysis, transplantation (01.06.2009)
Published in Nephrology, dialysis, transplantation (01.06.2009)
Get full text
Journal Article
5.5 A 2.1e− Temporal Noise and −105dB Parasitic Light Sensitivity Backside-Illuminated 2.3µm-Pixel Voltage-Domain Global Shutter CMOS Image Sensor Using High-Capacity DRAM Capacitor Technology
Lee, Jae-Kyu, Kim, Seung Sik, Baek, In-Gyu, Shim, Heesung, Kim, Taehoon, Kim, Taehyoung, Kyoung, Jungchan, Im, Dongmo, Choi, Jinyong, Cho, KeunYeong, Kim, Daehoon, Lim, Haemin, Seo, Min-Woong, Kim, JuYoung, Kwon, Doowon, Song, Jiyoun, Kim, Jiyoon, Jang, Minho, Moon, Joosung, Kim, HyunChul, Chang, Chong Kwang, Kim, JinGyun, Koh, Kyoungmin, Lim, HanJin, Ahn, JungChak, Hong, Hyeongsun, Lee, Kyupil, Kang, Ho-Kyu
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
Get full text
Conference Proceeding
5.6 A 1/2.65in 44Mpixel CMOS Image Sensor with 0.7µm Pixels Fabricated in Advanced Full-Depth Deep-Trench Isolation Technology
Kim, HyunChul, Park, Jongeun, Joe, Insung, Kwon, Doowon, Kim, Joo Hyoung, Cho, Dongsuk, Lee, Taehun, Lee, Changkyu, Park, Haeyong, Hong, Soojin, Chang, Chongkwang, Kim, Jingyun, Lim, Hanjin, Oh, Youngsun, Kim, Yitae, Nah, Seungjoo, Jung, Sangill, Lee, Jaekyu, Ahn, JungChak, Hong, Hyeongsun, Lee, Kyupil, Kang, Ho-Kyu
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
Get full text
Conference Proceeding
Channel-Length-Dependence of Strain Field in Transistor Studied via Scanning Moiré Fringe Imaging
Kim, Suhyun, Lee, Sungho, Oshima, Yoshifumi, Kondo, Yukihito, Lee, Hyunjung, Lee, Kyungwoo, Byun, Gwangsun, Lee, Sunyoung, Lee, Kyupil
Published in ECS solid state letters (01.01.2014)
Published in ECS solid state letters (01.01.2014)
Get full text
Journal Article
A 2.6 e-rms Low-Random-Noise, 116.2 mW Low-Power 2-Mp Global Shutter CMOS Image Sensor with Pixel-Level ADC and In-Pixel Memory
Seo, Min-Woong, Chu, Myunglae, Jung, Hyun-Yong, Kim, Suksan, Song, Jiyoun, Lee, Junan, Kim, Sung-Yong, Lee, Jongyeon, Byun, Sung-Jae, Bae, Daehee, Kim, Minkyung, Lee, Gwi-Deok, Shim, Heesung, Um, Changyong, Kim, Changhwa, Baek, In-Gyu, Kwon, Doowon, Kim, Hongki, Choi, Hyuksoon, Go, Jonghyun, Ahn, JungChak, Lee, Jaekyu, Moon, Changrok, Lee, Kyupil, Kim, Hyoung-Sub
Published in 2021 Symposium on VLSI Circuits (13.06.2021)
Published in 2021 Symposium on VLSI Circuits (13.06.2021)
Get full text
Conference Proceeding
A Fully Integrated Low Voltage DRAM with Thermally Stable Gate-first High-k Metal Gate Process
Jang, Sung Ho, Yamada, Satoru, Lee, Kyupil, Lim, Junhee, Han, Joon, Jang, Juyeon, Yeo, Jaehyun, Lee, Chanmin, Baek, Sungkweon, Lee, Jaehoon, Lee, Jong-Ho
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)
Get full text
Conference Proceeding
Semiconductor memory devices
Kim, Bong-Soo, Kim, Junsoo, Yamada, Satoru, Lee, Kiseok, Lee, Kyupil, Hong, HyeongSun, Han, Sunghee, Kim, Hui-Jung, Hwang, Yoosang
Year of Publication 12.12.2023
Get full text
Year of Publication 12.12.2023
Patent
Heterogeneous Integration of O-band LDs on bulk-Si Platform
Cha, Jungho, Shin, Dongjae, Shin, Yongwhak, Cho, Kwansik, Ha, Kyoungho, Lee, Kyupil, Kang, Ho-Kyu
Published in 2019 24th OptoElectronics and Communications Conference (OECC) and 2019 International Conference on Photonics in Switching and Computing (PSC) (01.07.2019)
Published in 2019 24th OptoElectronics and Communications Conference (OECC) and 2019 International Conference on Photonics in Switching and Computing (PSC) (01.07.2019)
Get full text
Conference Proceeding
Heterogeneously integrated ligtht sources on bulk-silicon platform
Shin, Dongjae, Cha, Jungho, Shin, Yonghwack, Ha, Kyoungho, Lee, Chang Bum, Shin, Changgyun, Shim, Dongshik, Choi, Byoung Lyong, Hong, Hyeongsun, Lee, Kyupil, Kang, Ho-Kyu
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
Get full text
Conference Proceeding
Semiconductor memory devices
Kim, Bong-Soo, Kim, Junsoo, Lee, Kiseok, Lee, Kyupil, Hong, HyeongSun, Kim, Jiyoung, Woo, Dongsoo, Hwang, Yoosang
Year of Publication 28.03.2023
Get full text
Year of Publication 28.03.2023
Patent