A 1.1e- temporal noise 1/3.2-inch 8Mpixel CMOS image sensor using pseudo-multiple sampling
Yong Lim, Kyoungmin Koh, Kyungmin Kim, Han Yang, Juha Kim, Youngkyun Jeong, Seungjin Lee, Hansoo Lee, Sin-Hwan Lim, Yunseok Han, Jinwoo Kim, Jaecheol Yun, Seogheon Ham, Yun-Tae Lee
Published in 2010 IEEE International Solid-State Circuits Conference - (ISSCC) (01.02.2010)
Published in 2010 IEEE International Solid-State Circuits Conference - (ISSCC) (01.02.2010)
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Conference Proceeding
A spline large-signal FET model based on bias-dependent pulsed I-V measurement
Koh, Kyoungmin, Park, Hyun-Min, Hong, Songcheol
Published in IEEE transactions on microwave theory and techniques (01.11.2002)
Published in IEEE transactions on microwave theory and techniques (01.11.2002)
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Journal Article
A Low Power Digitizer with Piecewise- Linear Counting Technique for High Dynamic Range Nonacell-Based 3-D-Stacked CMOS Image Sensor
Jun, Jaehoon, Yang, Han, Yoon, Beomsoo, Kim, Yongbin, Koh, Kyoungmin
Published in 2023 IEEE International Symposium on Circuits and Systems (ISCAS) (21.05.2023)
Published in 2023 IEEE International Symposium on Circuits and Systems (ISCAS) (21.05.2023)
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Conference Proceeding
A 1/1.33-inch 108Mpixel CMOS Image Sensor with 0.8um unit NONACELL pixels
Jung, Jaejin, Lim, Sinhwan, Kim, Jiyong, Yoo, Kwisung, Choi, Wontak, Oh, Youngsun, Ko, Juhyun, Koh, Kyoungmin
Published in 2022 IEEE International Symposium on Circuits and Systems (ISCAS) (28.05.2022)
Published in 2022 IEEE International Symposium on Circuits and Systems (ISCAS) (28.05.2022)
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Conference Proceeding
A 0.7 μm-Pitch 108 Mpixel Nonacell-Based CMOS Image Sensor with Decision-Feedback Technique
Jun, Jaehoon, Seo, Haneol, Kwon, Hyukbin, Lee, Jongyeon, Yoon, Beomsoo, Lee, Youngwoo, Kim, Yongbin, Joo, Woong, Lee, Jesuk, Koh, Kyoungmin
Published in 2022 IEEE International Symposium on Circuits and Systems (ISCAS) (28.05.2022)
Published in 2022 IEEE International Symposium on Circuits and Systems (ISCAS) (28.05.2022)
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Conference Proceeding
Properties of RFLDMOS with low resistive substrate for handset power applications
Juhyun Ko, Sunhak Lee, Han-Soo Oh, Joo-Hyun Jeong, Donghyun Baek, Kyoungmin Koh, Jeonghu Han, Changkun Park, Songcheol Hong, Ilhun Shon
Published in 2005 IEEE Radio Frequency integrated Circuits (RFIC) Symposium - Digest of Papers (2005)
Published in 2005 IEEE Radio Frequency integrated Circuits (RFIC) Symposium - Digest of Papers (2005)
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Conference Proceeding
A large-signal model of RF LDMOS with skin effects of power combining structures
Jeonghu Han, Changkun Park, Donghyun Baek, Kyoungmin Koh, Juhyun Ko, Ilhun Shon, Songcheol Hong
Published in 2005 IEEE Radio Frequency integrated Circuits (RFIC) Symposium - Digest of Papers (2005)
Published in 2005 IEEE Radio Frequency integrated Circuits (RFIC) Symposium - Digest of Papers (2005)
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Conference Proceeding
A 1/3-Inch 1.12μm-Pitch 13Mpixel CMOS Image Sensor with a Low-Power Readout Architecture
Kim, Yunhong, Chae, Heesung, Kim, Kyung-Min, Kim, Kyungtae, Yoon, Sukki, Koh, Kyoungmin, Lee, Jesuk, Park, Yongin
Published in 2020 IEEE International Symposium on Circuits and Systems (ISCAS) (01.10.2020)
Published in 2020 IEEE International Symposium on Circuits and Systems (ISCAS) (01.10.2020)
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Conference Proceeding
7.1 A 4-tap 3.5 μm 1.2 Mpixel Indirect Time-of-Flight CMOS Image Sensor with Peak Current Mitigation and Multi-User Interference Cancellation
Keel, Min-Sun, Kim, Daeyun, Kim, Yeomyung, Bae, Myunghan, Ki, Myoungoh, Chung, Bumsik, Son, Sooho, Lee, Hoyong, Jo, Heeyoung, Shin, Seung-Chul, Hong, Sunjoo, An, Jaeil, Kwon, Yonghun, Seo, Sungyoung, Cho, Sunghyuck, Kim, Youngchan, Jin, Young-Gu, Oh, Youngsun, Kim, Yitae, Ahn, JungChak, Koh, Kyoungmin, Park, Yongin
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
Published in 2021 IEEE International Solid- State Circuits Conference (ISSCC) (13.02.2021)
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Conference Proceeding
5.5 A 2.1e− Temporal Noise and −105dB Parasitic Light Sensitivity Backside-Illuminated 2.3µm-Pixel Voltage-Domain Global Shutter CMOS Image Sensor Using High-Capacity DRAM Capacitor Technology
Lee, Jae-Kyu, Kim, Seung Sik, Baek, In-Gyu, Shim, Heesung, Kim, Taehoon, Kim, Taehyoung, Kyoung, Jungchan, Im, Dongmo, Choi, Jinyong, Cho, KeunYeong, Kim, Daehoon, Lim, Haemin, Seo, Min-Woong, Kim, JuYoung, Kwon, Doowon, Song, Jiyoun, Kim, Jiyoon, Jang, Minho, Moon, Joosung, Kim, HyunChul, Chang, Chong Kwang, Kim, JinGyun, Koh, Kyoungmin, Lim, HanJin, Ahn, JungChak, Hong, Hyeongsun, Lee, Kyupil, Kang, Ho-Kyu
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
Published in 2020 IEEE International Solid- State Circuits Conference - (ISSCC) (01.02.2020)
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Conference Proceeding
A 2.8 μm Pixel for Time of Flight CMOS Image Sensor with 20 ke-Full-Well Capacity in a Tap and 36 % Quantum Efficiency at 940 nm Wavelength
Kwon, Yonghun, Seo, Sungyoung, Cho, Sunghyuck, Choi, Sung-Ho, Hwang, Taeun, Kim, Youngchan, Jin, Young-Gu, Oh, Youngsun, Keel, Min-Sun, Kim, Daeyun, Bae, Myunghan, Km, Yeomyung, Shin, Seung-Chul, Hong, Sunju, Lee, Seok-Ha, Park, Ho Woo, Kim, Yitae, Koh, Kyoungmin, Ahn, JungChak
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
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Conference Proceeding
Image sensor and electronic circuit included therein
Kim, Kyung-Min, Joo, Woong, Koh, KyoungMin, Lee, Mira, Kim, Moo Young
Year of Publication 16.08.2022
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Year of Publication 16.08.2022
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