Electromechanical Diode Cell Scaling for High-Density Nonvolatile Memory
Hutin, Louis, Wookhyun Kwon, Chuang Qian, Tsu-Jae King Liu
Published in IEEE transactions on electron devices (01.05.2014)
Published in IEEE transactions on electron devices (01.05.2014)
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Journal Article
Electromechanical Diode Cell for Cross-Point Nonvolatile Memory Arrays
Wookhyun Kwon, Jaeseok Jeon, Hutin, L., Tsu-Jae King Liu
Published in IEEE electron device letters (01.02.2012)
Published in IEEE electron device letters (01.02.2012)
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Journal Article
Highly Scalable NAND Flash Memory Cell Design Embracing Backside Charge Storage
Kwon, Wookhyun, Park, In Jun, Shin, Changhwan
Published in Journal of semiconductor technology and science (01.04.2015)
Published in Journal of semiconductor technology and science (01.04.2015)
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Journal Article
Three-Dimensional Simulation of Dopant-Fluctuation-Induced Threshold Voltage Dispersion in Nonplanar MOS Structures Targeting Flash EEPROM Transistors
KIM, Bomsoo, KWON, Wookhyun, BAEK, Chang-Ki, JIN, Seonghoon, SONG, Yunheub, KIM, Dae M
Published in IEEE transactions on electron devices (01.06.2008)
Published in IEEE transactions on electron devices (01.06.2008)
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Journal Article
Embedded Memory Capability of Four-Terminal Relay Technology
JEON, Jaeseok, KWON, Wookhyun, LIU, Tsu-Jae King
Published in IEEE transactions on electron devices (01.03.2011)
Published in IEEE transactions on electron devices (01.03.2011)
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Journal Article
Multiple-Input Relay Design for More Compact Implementation of Digital Logic Circuits
Jaeseok Jeon, Hutin, L., Jevtic, R., Liu, N., Yenhao Chen, Nathanael, R., Wookhyun Kwon, Spencer, M., Alon, E., Nikolic, B., Liu, Tsu-Jae King
Published in IEEE electron device letters (01.02.2012)
Published in IEEE electron device letters (01.02.2012)
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Journal Article
Reliable extraction of cycling induced interface states implementing realistic P/E stresses in reference cell: comparison with flash memory cell
Chang-Ki Baek, Bomsoo Kim, Son, Y., Wookhyun Kwon, Chan-Kwang Park, Park, Y.J., Hong Shick Min, Kim, D.M.
Published in IEEE electron device letters (01.03.2006)
Published in IEEE electron device letters (01.03.2006)
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Journal Article
Simple Experimental Determination of the Spread of Trapped Hot Holes Injected in Silicon-Oxide-Nitride-Oxide-Silicon (SONOS) Cells: Optimized Erase and Cell Shrinkage
Kim, Bomsoo, Baek, Chang-Ki, Kwon, Wookhyun, Jeong, Yoon-Ha, Kim, Dae M.
Published in Japanese Journal of Applied Physics (15.12.2004)
Published in Japanese Journal of Applied Physics (15.12.2004)
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Journal Article
Development and Optimization of Re-Oxidized Tunnel Oxide with Nitrogen Incorporation for the Flash Memory Applications
Jung-Geun Jee, WookHyun Kwon, Woong Lee, Jung-Hyun Park, Hyeong-Ki Kim, Ho-Min Son, Won-Jun Chang, Jae-Jong Han, Yong-Woo Hyung, Hyeon-Deok Lee
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)
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Conference Proceeding
A Critical Failure Source in 65nm-MLC NOR Flash Memory Incorporating Co-Salicidation Process
Jeehoon Han, Bongyong Lee, Jungin Han, Wookhyun Kwon, Chaemyung Chang, Sangpil Sim, Chankwang Park, Kinam Kim
Published in 2006 IEEE International Integrated Reliability Workshop Final Report (01.10.2006)
Published in 2006 IEEE International Integrated Reliability Workshop Final Report (01.10.2006)
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Conference Proceeding
Semiconductor device
JUN JONGMIN, SHIN JONGMIN, SHIN HEONJONG, PARK JUNMO, PARK YEONHO, CHOI KYUBONG, KWON WOOKHYUN
Year of Publication 03.05.2024
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Year of Publication 03.05.2024
Patent
integrated circuit devices including metallic source/drain regions
HONG BYOUNGHAK, LEE JAEHONG, PARK SOOYOUNG, KWON WOOKHYUN, SEO KANG ILL
Year of Publication 03.01.2024
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Year of Publication 03.01.2024
Patent