Investigation of Row Hammer and Passing Gate Effects Based on the Work Functions of Dual Gates in DRAM Cells
Kim, Hansol, Im, Jisung, Kim, Jinsu, Woo, Seungmin, Kwon, Taeseong, Yoon, Young Jun, Bae, Jong-Ho, Woo, Sung Yun
Published in 2024 IEEE Silicon Nanoelectronics Workshop (SNW) (15.06.2024)
Published in 2024 IEEE Silicon Nanoelectronics Workshop (SNW) (15.06.2024)
Get full text
Conference Proceeding
Analysis of Row Hammer and Passing Gate Effect in DRAM Cells by BCAT Structural Design
Im, Jisung, Kim, Hansol, Kim, Jinsu, Woo, Seungmin, Kwon, Taeseong, Yoon, Young Jun, Bae, Jong-Ho, Woo, Sung Yun
Published in 2024 IEEE Silicon Nanoelectronics Workshop (SNW) (15.06.2024)
Published in 2024 IEEE Silicon Nanoelectronics Workshop (SNW) (15.06.2024)
Get full text
Conference Proceeding