Highly scalable Z-RAM with remarkably long data retention for DRAM application
Tae-Su Jang, Joong-Sik Kim, Sang-Min Hwang, Young-Hoon Oh, Kwang-Myung Rho, Seoung-Ju Chung, Su-Ock Chung, Jae-Geun Oh, Bhardwaj, S., Jungtae Kwon, Kim, D., Nagoga, M., Yong-Taik Kim, Seon-Yong Cha, Seung-Chan Moon, Sung-Woong Chung, Sung-Joo Hong, Sung-Wook Park
Published in 2009 Symposium on VLSI Technology (01.06.2009)
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Published in 2009 Symposium on VLSI Technology (01.06.2009)
Conference Proceeding
1 Giga bit SOI DRAM with fully bulk compatible process and body-contacted SOI MOSFET structure
Yo-Hwan Koh, Min-Rok Oh, Jong-Wook Lee, Ji-Woon Yang, Won-Chang Lee, Chan-Kwang Park, Jae-Beom Park, Yeon-Cheol Heo, Kwang-Myung Rho, Byung-Cheol Lee, Myung-Jun Chung, Min Huh, Hyung-Suk Kim, Kyung-Suk Choi, Won-Chul Lee, Jeong-Kug Lee, Kwang-Ho Ahn, Kyoung-Wook Park, Jeong-Yun Yang, Hyung-Ki Kim, Dai-Hoon Lee, In-Seok Hwang
Published in International Electron Devices Meeting. IEDM Technical Digest (1997)
Published in International Electron Devices Meeting. IEDM Technical Digest (1997)
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