A new robust capacitance mis-match measurement for analog/mixed-signal applications
Won-Young Jung, Jong-Min Kim, Jin-Su Kim, Jung-Hyun Choi, Sang-Hoon Kwak, Taek-Soo Kim, Jae-Kyung Wee
Published in 2009 IEEE 8th International Conference on ASIC (01.10.2009)
Published in 2009 IEEE 8th International Conference on ASIC (01.10.2009)
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