Compact Generator of an Optical Frequency Comb Based on Distributed-Feedback Laser Diode and High-Q Optical Microcavity
Ruzhitskaya, D. D., Vorob’ev, K. A., Bulygin, F. V., Kuzin, A. Yu, Min’kov, K. N.
Published in Journal of experimental and theoretical physics (01.06.2023)
Published in Journal of experimental and theoretical physics (01.06.2023)
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Journal Article
Practical aspects of applying artificial intelligence in metrology
Kuzin, A. Yu, Kroshkin, A. N., Isaev, L. K., Bulygin, F. V., Voytko, V. D.
Published in Measurement techniques (01.12.2023)
Published in Measurement techniques (01.12.2023)
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Journal Article
Waveguide Integrated Superconducting Single-Photon Detector For Photonic And Ion Quantum Processors And Neuromorphic Computing
Kovalyuk, V. V., Venediktov, I. O., Sedykh, K. O., Svyatodukh, S. S., Hydyrova, S., Moiseev, K. M., Florya, I. N., Prokhodtsov, A. I., Galanova, V. S., Kobtsev, D. M., Kuzin, A. Yu, Golikov, A. D., Goltsman, G. N.
Published in Radiophysics and quantum electronics (01.04.2024)
Published in Radiophysics and quantum electronics (01.04.2024)
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Journal Article
Measurement of the Thickness Nonuniformity of Nanofilms Using an Electron Probe Method
Darznek, S. A., Kuzin, A. Yu, Mityukhlyaev, V. B., Stepovich, M. A., Todua, P. A., Filippov, M. N.
Published in Measurement techniques (01.11.2016)
Published in Measurement techniques (01.11.2016)
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Journal Article
Calibration of Scanning Electron Microscopes over a Wide Range of Magnifications
Kirtaev, R. V., Kuzin, A. Yu, Maslov, V. G., Mityukhlyaev, V. B., Todua, P. A., Filippov, M. N.
Published in Measurement techniques (01.03.2017)
Published in Measurement techniques (01.03.2017)
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Journal Article
Analysis of Factors Affecting the Accuracy of Three-Dimensional Reconstruction of the Surface of Objects with Submicrometer Relief Obtained by Scanning Electron Microscope Stereo Images
Kuzin, A. Yu, Vasil’ev, A. L., Mityukhlyaev, V. B., Mikhutkin, A. A., Todua, P. A., Filippov, M. N.
Published in Measurement techniques (01.06.2016)
Published in Measurement techniques (01.06.2016)
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Journal Article
Experimental Study of Three-Dimensional Reconstruction of Relief Structures from Stereo Images Obtained in a Scanning Electron Microscope
Kuzin, A. Yu, Vasil’ev, A. L., Karabanov, D. A., Mityukhlyaev, V. B., Mikhutkin, A. A., Presnyakov, M. Yu, Todua, P. A., Filippov, M. N.
Published in Measurement techniques (01.11.2016)
Published in Measurement techniques (01.11.2016)
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Journal Article
Electron Probe Measurements of Oxide Film Thickness on Silicon Surfaces
Gavrilenko, V. P., Kuzin, A. Yu, Mityukhlyaev, V. B., Stepovich, M. A., Todua, P. A., Filippov, M. N.
Published in Measurement techniques (01.12.2015)
Published in Measurement techniques (01.12.2015)
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Journal Article
Measurement of Structural Parameters Based on X-Ray Emission Spectra with Energy-Dispersive Detection
Gavrilenko, V. P., Zablotskii, A. V., Korneichuk, S. A., Kuzin, A. Yu, Kupriyanova, T. A., Lyamina, O. I., Todua, P. A., Filippov, M. N., Shklover, V. Ya
Published in Measurement techniques (01.05.2016)
Published in Measurement techniques (01.05.2016)
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Journal Article
Three-Dimensional Reconstruction of the Surfaces of Relief Structures from Stereoscopic Images Obtained in a Scanning Electron Microscope
Gavrilenko, V. P., Karabanov, D. A., Kuzin, A. Yu, Mityukhlyaev, V. B., Mikhutkin, A. A., Todua, P. A., Filippov, M. N., Baimukhametov, T. N., Vasil’ev, A. L.
Published in Measurement techniques (01.06.2015)
Published in Measurement techniques (01.06.2015)
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Journal Article
Metrological assurance of measurements of the dimensional parameters of nanoparticles and thin films by small-angle X-ray diffractometry methods
Avilov, A. S., Volkov, V. V., Gubin, S. P., Dyakova, Yu. A., Ermakova, M. A., Zaporozhets, M. A., Kuzin, Yu. A., Marchenkova, M. A., Mityukhlyaev, V. A., Rustamova, E. G., Sulyanov, S. N., Todua, P. A., Chekrygina, D. I.
Published in Nanotechnologies in Russia (01.05.2013)
Published in Nanotechnologies in Russia (01.05.2013)
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Journal Article
A Method of Estimating the Stability of the Scale Factor of a Transmission Electron Microscope
Zablotskii, A. V., Avilov, A. S., Bodunov, D. S., Kuzin, A. A., Kuzin, A. Yu, Kuz’min, A. A., Todua, P. A.
Published in Measurement techniques (01.08.2013)
Published in Measurement techniques (01.08.2013)
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Journal Article