by Becker, P., Bettin, H., De Bievre, P., Holm, C., Kutgens, U., Spieweck, F., Stumpel, J., Valkiers, S., Zulehner, W.
Published in IEEE transactions on instrumentation and measurement (01.04.1995)

by Basile, G, Becker, P, Bergamin, A, Bettin, H, Cavagnero, G, De Bievre, P, Kutgens, U, Mana, G, Mosca, M, Pajot, B, Panciera, R, Pasin, W, Pettorruso, S, Peuto, A, Sacconi, A, Stumpel, J, Valkiers, S, Vittone, E, Zosi, G
Published in IEEE transactions on instrumentation and measurement (01.04.1995)

by Basile, G., Becker, P., Bergamin, A., Bettin, H., Cavagnero, G., De Bievre, P., Kutgens, U., Mana, G., Mosca, M., Pajot, B., Panciera, R., Pasin, W., Pettorruso, S., Peuto, A., Sacconi, A., Stumpel, J., Valkiers, S., Vittone, E., Zosi, G.
Published in IEEE transactions on instrumentation and measurement (01.04.1995)

by BASILE, G, BECKER, P, PANCIERA, R, PASIN, W, PETTORUSSO, S, PEUTO, A, SACCONI, A, STÜMPEL, J, VALKIERS, S, VITTONE, E, ZOSI, G, BERGAMIN, A, BETTIN, H, CAVAGNERO, G, DE BIEVRE, P, KÜTGENS, U, MANA, G, MOSCA, M, PAJOT, B
Published in IEEE transactions on instrumentation and measurement (1995)

by Herrmann, K., Koenders, Ludger, Danzebrink, H.-U., Hasche, Klaus, Wilkening, Günter, Pohlenz, F., Kuetgens, U., Mirandé, W., Yacoot, A.
Published in Technisches Messen (01.12.2002)